LA6583MC
No.A2034-2/5
Specifications
Maximum Ratings at Ta = 25°C
Parameter Symbol Conditions Ratings Unit
Supply volt ag e V
max 15 V
Output cur re nt I
max 0.8 A
Output withstand voltage V
max 15 V
RD/FG output wit hs t an d VRD/FG max 15 V
RD/FG output current IRD/FG max 5 mA
HB output current IB max 10 mA
Allowable dissipation Pd max Mounted on a specified board *1 800 mW
Operating temperature Topr *2 -30 to +100 °C
°
*1: Mounted on a specified board: 114.3mm × 76.1mm × 1.6mm glass epoxy
*2: Tj = 150°C Use this IC within a range where the chip temperature does not exceed Tj = 150C during operation.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high
current, high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Recommended Operating Conditions at Ta = 25°C
Parameter Symbol Conditions Ratings Unit
Supply voltage V
2.8 to 14.0 V
Common-phase input voltage range of Hall input
Electrical Characteristics at T a = 25°C, VCC = 12.0V, unless especially specified.
Parameter Symbol Conditions Ratings Unit
min typ max
Circuit Current I
1 During drive (CT=L) 4 6 9 mA
I
2 At lock protection (CT=H) 2 4 6 mA
Lock detection capacitor charge current ICT1 2.0 2.8 3.5 µA
Capacitor discharge current
µ
Capacitor charge/discharge current ratio RCT RCT=ICT1/ICT2 9 12 15 -
CT charge voltage VCT1 1.6 1.7 1.8 V
CT discharge voltage VCT2 0.6 0.7 0.8 V
OUT output L saturation voltage V
I
=200mA 0.2 0.3 V
OUT output H saturation voltage V
I
=200mA 0.9 1.2 V
Hall input sensitivity VHN Zero peak value
(Including offset and hysteresis)
7 15 mV
RD/FG output pin L voltage
RD/FG output pin leak current IRD/FGL VRD/FG=15V 1 30 µA
HB output voltage VHB IHB=5mA 1.3 1.5 1.7 V
Thermal protection circuit TSD Design target value *3 150 180 210 °C
*3: Thi s is a des ign gua rantee value and no mea surement with an independent unit is made.
Thermal prote c tion circuit is b uilt in this IC for the pr e ven tion of burnout of IC a nd thermal destr uctio n.
But, since the operation is outside the guarantee temperature range, thermal design must be made so that the thermal
protection circuit is not activat e d during normal fan op e ration.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating C onditions may affect device reliability.