Mil NPECS 44k D M@@ OO00Le2S 0034529 259 MEMILS revision shall be completed by 15 June 1994 e - TTT | The documentation and process conversion ! INCH-POUND [| measures necessary to comply with this U_______ t i MIL-S-19500/117K 15 March 1994 SUPERSED ING MIL-S-19500/117J 8 September 1992 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, DIODE, SILICON TYPES 1N9628-1 THROUGH 1N992B~-1, 1N962BUR-1 THROUGH 1N992BUR-1, IN962C-1 THROUGH 1N992C-1, IN962CUR~1 THROUGH 1N992CUR~1, IN962D-1 THROUGH 1N992D-1, IN962DUR-1 THROUGH 1N992DUR-1, JAN, JANTX, JANTXV, AND JANHC | JANS level (see 6.3) I This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for 500 milliwatt, silicon, voltage regulator diodes having voltage tolerances of 5 percent, 2 percent, and 1 percent. Three Levels of product assurance are provided for each device type as specified in HIL~S-19500. One level of product assurance is provided for die. 1.2 Physical dimensions. See 3.3. 1.3 Maximum ratings. Maximum ratings are as shown in table IV herein and as follows: Py = 500 mW (D0-35) at T, = +50C, L = .375 (9.53 mm); both ends of case or diode body to heat sink at L = .375 (9.53 mm). (Derate I7 to 0.0 mA de at +175C). Pr = 500 mW (DO-213AA) at Tec = +125C (derate to 0 at +175C). -65C = Top = #175C; 65C = Torq = +175C. 1.4 Primary electrical characteristics. Primary electrical characteristic are shown in columns 2, 9, 12, and 14 of table IV herein and as follows: 11 V de = Vz <= 200 V de 1N962B-1 through 1N9928-1 are 5 percent voltage tolerance. IN962C~1 through 1N992C-1 are 2 percent voltage tolerance. 1N962D-1 through 1N9920-1 are 1 percent voltage tolerance. Roy_ = 250C/W (maximum) at L = .375 inch (9.53 mm) (00-35). Rojec = 100C/W (maximum) junction to endcaps (00-213AA). Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Defense Electronics Supply Center, ATTN: DESC-ELDT, 1507 Wilmington Pike, Dayton, OH 45444-5765, by using the Standardization Document Improvement Proposal (00 Form 1426) appearing at the end of this document or by letter. fees rae menns were mane mene AMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution 1s unlimited.MIL SPECS HUE D MM 0000325 0034530 T?70 MMILS NIL-S-19500/117K pT . i tay weak Oe | | | | | | Dimensions | | Ltr I | | Notes | | | Inches | Millimeters [ | | | | | | | | | | Min | Max | Min | Max | l | | | | | | | 1 @d [.055 | .090 {1.40 | 2.29 | 3 L | | i | | | | |B {.018 | Q22 [0.46 | 0.56 | | | | | | | | | I G | 120 | 200 | 3.05 | 5.08 i 3. {| | | | | | | | | L L.1.000 | 1.500 |. 25.40 | 38.10 | | | | | | | | | | 4 | j .050 | {| 1.27 | 4 | i | | | | | L 1. Dimensions are in inches. 2, Metric equivalents are given for general information only. 3. Package contour optional within @D and length G. Heat slugs, if any, shall be included within this cylinder but shall not be subject to minimum Limit of @D. 4. Within this zone lead, diameter may vary to allow for lead finishes and irregularities other than heat slugs. FIGURE 1. Semiconductor device, diode, types 1N9628-1 through 1N992B-1, 4N962C-1 through 1N992C-1, and 1N9620-1 through 1N9920-1 (00-35).MIL SPECS HUE D MM 0000125 0034531 907 MEMILS MIL-S-19500/117K PO G | | | | | Dimensions | | Ute | { | | | Inches | Millimeters | | | | | | l LMin | Max | Min | Max I | [ i | | [ |. go E063 i .067 [1.60 [1.70 IL [ | { | | | | fF [| .016 {| .022 | [0.56 | | | | { | | Lg | .130 | .146 | 3.30 | 3.70 | | I | | | Gy l . 100 ref | 2.54 ref | | i | I | | | | ios { .001 min | 0.03 min | NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 2. Semiconductor device, diode, types 1IN962BUR-1 through 1N992BUR-1, IN962CUR-1 through 1N992CUR-1, and 1N9620UR-1 through 1N992DUR-1 (DO-213AA).MIL SPECS UE D MM UOUUbeS OOS454e B43 MENILS NOTES: MIL-S-19500/11 7K A bt $<$ $$ B _ a Of LIL SS Y Ym VY ZY Li N mo P 7 BACKSIDE IS CATHODE | | | | | Dimensions L | | | | | ttre | JANHCA | JANHCB _ | | | | | | | | | Inches I Millimeters | Inches | Millimeters | | | | | | | | | | | | | Min |__ Max | Min | Max {| Min | Max | Min | _ Max | | | | | | | | | |_A | 021 | 025 {| .53 L.63 L...024 | .028 | 0.61 {| 0.71 | | | | | | | | | { {8 L._.013 | .017 | _.33 | 43 { .017 | _.021 | 0.43 [| 0.53 | Dimensions are in inches. Metric equivalents are given for general information only. The physical characteristics of the die thickness are .010 +.002 inch (0.25 .05 mm). Metallization is: Top (anode) - Al, back (cathode) - Au. AL thickness = 12, 000A minimum for JANHCA and 40, 000A minimum for JANHCB, Au thickness = 3, 000A minimum for JANHCA and 5 000A for JANHCB. Circuit layout data: For zener operation, cathode must be operated positive with respect to anode. Requirements in accordance with appendix H, are performed in a TO-5 package (see 6.5). FIGURE 3. Physical dimensions for JANHCA and JANHC8 die.MIL SPECS W4E D MM 0000125 0034533 787 MMNILS MIL-S-19500/117K 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those ltsted in the issue of the Bepartment of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. STANDARD MILITARY MIL-STD-750 - Test Methods for Semiconductor Devices. (Uniess otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Defense Printing Service Detachment Office, Building 4D (Customer Service), 700 Robbins Avenue, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Associated detail specification. The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein. 3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified 1n MIL-S-19500. EC -~----- 5 -- 5-5 --- - - ee Endcap. 3.3 Design, construction, and physical dimensions. Design, construction, and physical dimensions shall be as specified tn MIL-S-19500, and figures 1 (00-35), 2 (D0-213AA), and 3 and 4 for JANHC. 3.3.1 Lead finish. Lead finish shall be solderable as defined in MIL-S-19500, MIL-STD-750, and herein. Where a choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2). 3.3.2 Dash one construction. Dash one (-1) devices shall be metallurgically bonded double plug construction im accordance with the requirements of category I, 11, or III (see MIL-S-19500, paragraph 30.14 and subparagraphs). 3.4 Marking. Marking shalt be in accordance with MIL-S-19500, except at the option of the manufacturer, the following marking may be omitted from the body of the device: The 00-35 versions may leave off "-" portion of type designation (e.g., JANTX1N962B1). 3.4.1 Marking of UR version devices. For UR version devices only, all marking (except polarity) may be omitted from the body, but shall be retained on the initial container. 3.5 Selection of tight tolerance devices. The C and D suffix devices shall be selected from JAN, JANTX, or JANTXV devices, which have successfully completed all applicable screening, and groups A, B, and C testing as 5 percent tolerance devices. All sublots of C and D suffix devices shall pass group A, subgroup 2, at tightened tolerances. Tighter tolerances for mounting clip temperature shall be maintained for reference purpose to establish correlation. For and D tolerance levels, TL = #25C 2C at 0.375 inch (9.53 mm) from body or equivalent.MIL SPECS 4W4E D MM QOOOL25 0034534 bib MEMILS MIL-S-19500/117K 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S-19500, and as specified herein. 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-S-19500, and as specified herein. : 4.2.1 JANHC devices. JANHC devices shall be qualified in accordance with appendix H of MIL-S-19500. 4.2.2 Construction verification. Cross sectional photos from three devices shall be submitted in the qualification report. 4.3 Screening (JAN, JANTXV and JANTX levels only). Screening shall be in accordance with table II of MIL-S-19500, and as specified herein, The following measurements shall be made in accordance with table I herein. Devices that exceed the Limits of table I herein shall not be acceptable. a minimum, die shall be 100-percent probed in accordance with group A, subgroup 2. 4.3.2 Power burn-in conditions. Power burn-in conditions are as follows: I7 = column 8 of table IV minimum; mounting and test conditions in accordance with MIL-~STD-750, method 1038, test condition B, Tec = +75C to +125C for surface mount devices. To better utilize burn-in equipment, higher values of I7 shall be permitted provided: a. The junction temperature does not exceed +175C. b. The power dissipation does not exceed 500 mW (see figure 6). 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-$-19500, and as specified herein. , | | | | Screen (see table II of | Measurement | | MIL-S-19500) | | | j | JANTX and JANTXV levels | JAN Level L | | | | | 3a- {Temperature cycling |Temperature cycling Cin | | | Jaccordance with MIL-S-19500 | | | | JTX level) | | | | | | 3c 1/ {Thermal impedance (see 4.5.5) |Thermal impedance (see 4.5.5) | | | | 1 | | | | | 9 [Not applicable [Not applicable | | | | | | 11 Jip and Vz | | . | | | | | | | | i 12 [See 4.3.2, t = 48 hours | | | | | | | 13 2/ |AIlp, = 100 percent of initial reading | { | jor Roo nA dc, whichever is greater; | | { |AVz = #2 percent of initial reading, | | | |subgroup 2 of table I herein. | [ 1/. Thermal impedance may be performed any time after sealing provided temperature cycling is performed in accordance with MIL-S-19500, screen 3 prior to this thermal test. 2/ PDA = 5 percent for screen 13, applies to AIpy, AVz and subgroup 2 of table I herein. Thermal impedance (Z,)y) is not required in screen 13. 4.3.1 Screening (JANHC). Screening of JANHC die shall be in accordance with MIL-S-19500, appendix H. AsMIL SPECS 4Y4E D MM 0000125 0034535 552 MEMILS MIL-S-19500/117K 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-$-19500, and table I heretn. 4.4.2 Group @ inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IVb (JAN, JANTX, and JANTXV) of MIL-S-19500, and as follows. Electrical measurements (end-points) and delta requirements shall be in accordance with the applicable steps and footnotes of table III herein. Subgroup Method Condition Be 4066 See 4.5.1 B3 1027 17 = column 8 of table IV; (see 4.3.2). B4& 2075 See 4.5.7 BS Not applicable 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table V of MIL-S-19500, and as follows. Electrical measurements (end-points) and delta requirements shall be in accordance with the applicable footnotes and steps of table III herein. Subgroup Method Condition c2 2036 Tension: Test condition A; weight = 4 pounds; t = 15 seconds. Lead fatigue: Test condition E (tension and lead fatigue are not required for UR-1 suffix devices). c2 1071 Test condition E. C3 Not applicable. C6 1026 I7 = column 8 of table IV; see 4.3.2. c7 4071 Iz = column 5 of table IV; Ty = +25C 5C; To = Ty +125C =5C (maximum Limit in accordance with column 14 of table Iv). 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows. 4.5.1 Surge current (lzoq4). The peak currents shown 1n column 10 of table IV shall be applied in the reverse direction and these shall be superimposed on the current (I, = I,4) (column 5 of table IV) a total of 5 surges at 1 minute intervals. ach individual surge shall be one-half square-wave-pulse of 1/120 of a second duration or an equivalent one-half sinewave with the same effective rms current. 4.5.2 Regulator voltage measurements. The test current shall be applied until thermal equilibrium is attained (90 seconds minimum) prior to reading the breakdown voltage. for this test, the diode shall be suspended by its Leads with mounting clips whose inside edge is located at 0.375 tnch (9.53 mm) from the body and the mounting clips shall be maintained at a temperature of +25C 48C, -2C. This measurement may be performed after a shorter time following application of the test current than that which provides thermal equilibrium 1f correlation to stabilized readings can be established to the satisfaction of the Government. 4.5.3 Voltage regulation V, (reg). Voltage regulation shalt be determined by the difference of the regulator voltage measured at different currents as specified in table I, group A, subgroup 7. Both tests shall be performed at thermal equilibrium. This AV, shall not exceed column 9 of table IV. 4.5.4 Temperature coefficient of regulator voltage (.V,). The device shall be temperature stabilized with current applied prior to reading regulator voltage at the specified ambient temperature as specified in paragraph 4.4.3, group C, subgroup 7.MIL SPECS 44E D MM 0000325 OO3453b 499 MMILS MIL-S-19500/117K 4.5.5 Thermal impedance (Z@)y measurements). The Zgjyy measurements shall be performed in accordance with MIL-STD-750, method 3101. The maximum Limit for Z@jxy 1n screening (table I1 of MIL-S-19500) shalt be derived by each vendor by means of process control. When three lot date codes have exhibited control, the data from these three lots will be used to establish a fixed screening Limit, (not to exceed the group A, subgroup 2 Limit). Once a fixed Limit has been established, monitor all future sealing lots using a five piece sample from each lot to be plotted on the applicable X, R chart. a. iy measurement current - - - ------ 7-7-5 7 7- 1 mA - 10 mA. b. Iy forward heating current - - - --------- - 5 A- 1.0 4A, c. ty heating time - -------- >> 7-77 77 = 10 ms. d. typ measurement delay time - ----------- 70 Us maximum. 4.5.5.1 For initial qualification or requalification. Read and record data (Zojx) shall be supplied to the qualifying activity on one lot (random sample of 500 devices minimum). Twenty-two serialized devices shall be sent to the qualifying activity for test correlation. 4.5.6 Thermal resistance. Thermal resistance measurement shall be in accordance with MIL-STD-750, method 3101 or 4081. Forced moving air or draft shall not be permitted across the device during test. The maximum Limit for Roy, under these test conditions shall be Roy, (maximum) = 250C/W, Rojec (maximum) = 100C/W. The fotlowing conditions shall apply when using method 3101: a Iwo rrr err tr tt rrr rt 1 mA to 10 mA. b. Iy---- eee er rr er tr tr rr tre 200 mA to 400 mA. C. ty--- eee ee tr rr rrr rr rrr tre 25 seconds minimum. d. typ -- 7 - tt tt rr tte 70 Us maximum. LS = Lead spacing = .375 inch (9.53 mm) as defined on figure 4 below. Ls O for UR suffix versions COPPER LEAD CLAMP COPPER LEAD CLAMP INFINITE HEAT-DISSIPATOR Z INFINITE HEAT-DISSIPATOR LSom{| beeen} fae LS FIGURE 4, Mounting conditions. 4.5.6.1 For initial qualifications and requalifications. Read and record data in accordance with group E . herein and shall be included in the qualification report. 4.5.7 Decap internal visual scribe and break. Scratch glass at cavity area with diamond scribe. Carefully snap open. Using 30X magnification, examine the area where die (or bonding material) are in contact with the plugs, verify metallurgical bonding area. If the verification of the metallurgical bonding area is in question, the test method 3101 and test condition limits herein (Z@jy) shall be used to determine suitability for use.MIL SPECS W4E D Ml 0000225 0034537 325 MmMILS MIL-S-19500/117K TABLE I. Group A inspection. [iz = 50 percent of column 18 of table IV (current 2) ay l | Inspection 1/ to MIL-STD-750 i Symbol | Limits [Unit i i | [ | | ! ' ' Method | Conditions ! [Min | Max : i i i ' | | | i { Subgroup 1 i i | [ { i : | | | | | | | Visual and mechanical ! 2071 i | | I ' \ ' examination | | | | | j | | i i t | | , ' Subgroup 2 | | | t | { i i i i | | I i . Forward voltage 4011 tIp = 200 mA de [Ve | | | ' i i f I ' 4N962~1N985 3/ I 1.1 tVde I - IN986-1N992 3/ | i i 61.30 ' Vide | tReverse current | 4016 (DC method; Vp = column 11 lipq | Icolumn | pA de | of table IV [ | 1 12 ; [ i | | { { | Regulator voltage | 4022 "Iz = column iz {Column {Column j V de i ' (see 4.5.2) | 'S of table IV) | j 3 f 4 ! ' i | { | | i i i {Thermal impedance {| 3101 [See 4.5.5 iZo5X | { 35 " *e/W t | | i | | i i Subgroup 3 | | | | t | i i { | : | High-temperature I [Tq = +150C | | | } I } operation | j | | | i j | | | { i | i i |Reverse current | 4016 {OC method: Vp = column 11 |Ipo | [Column | pA de | : { lof table IV | | } 13 i | | | | I | | | | Subgroup 4 | i | [ i i ' : ; | | | i Small-signal reverse {| 4051 {17 = column 5 of table IV. |Z7 | fColumn ; ohms [ - breakdown impedance | lIgqg = 10 percent of Iz rms|{ | j} 6 : i | | | | l i I | | | [ i i }Small-signal reverse | 4051 [17% = 250 pA de 122K | IColumn | ohms) j } breakdown impedance | lIeqg = 25 pA rms | I } 7 i i i | | | | | | | | | | | | { { | | Subgroups 5 and 6 | | | | | { ! | | | | | i i jNot applicable | I | I | 1 j \ i { | | | | ; 1 Subgroup 7 I | i i . : I | | i i i \ IVoltage regulation j {1, = 10 percent of column /AV, | tColumn i V de I (see 4.5.3) ! [8 of table IV (current 1) [| (reg) | Pb 9 | ! | i | { | i | ' ! a 1/ For sampling plan, see MIL-S-19500. 2/ Column references are to table IV herein. 3/ Applies to all suffix versions.MIL SPECS WOE D MM 0000125 0034534 2b] MMMILS MIL-S-19500/11 7K TABLE Il. Group E inspection (all product assurance levels). MIL-STO0-750 Qualification Inspection 1/ conformance Method Conditions inspection Subgroup 1 Electrical measurements | L ' | | | | | 1 t {Temperature cycling | | | | | Subgroup 2 | | Steady-state dc intermittent Life Electrical measurements Subgroup 3 Not applicable Thermal resistance surface mount Thermal resistance | | | | | | { | | Subgroup 4 [ | | | | | {| leaded | 1051 1037 3101 or 4081 3101 or | | | ! | | | | | | | | | | | | | | | | | | | | | | | | | 1 4081 i 500 cycles ee table III, steps 1, 2, 3, 4, nd 5. S a 6,000 cycles I7 = column 8 of table IV See table III, steps 2, 3, 4, | | | | | | | | | | | | | | | Jand 5. | | | { | [Rayec = 100C/W (maximum) at zero [lead length. +25C Tec = +35C | (see 4.5.6). | Roy, = 250C/W (maximum) at .375 [inch (9,53 mm) lead length j#25C = TL = +35C (see 4.5.6). t J 1/ A separate sample may be pulled for each test. 10 { | | | (sampling plan) | i | 22 devices, c = | | | | 22 devices, 22 devices, = | \ | | | | | | | | | | | | | | 22 devices, = | {WHE D MM 0000325 00345395 174 MENMILS MIL SPECS MIL~S-79500/117K TABLE III. Group A, B, C, and E electrical end-point measurements. 1/ 2/ | | | { { | Step { Inspection | MIL-ST0-750 [Symbol |__ Limits Unit | i | | { | { i : i i | Method | Conditions I L.Min |! Max L i i { | | i | | i | } 1. | Reverse current } 4016 =| DC method; Vp = column 11 [ip4 f jcolumrn pA dc ! i | | | of table IV | | [12 of i | | ! | | | ! Itable Iv | t f 2. | Reverse current | 4016 | DC method; Vp = column 11 Ip3 | | 2 iA dc | i | | of table IV | | | : { | | [ | | | i { {| 3. | Regulator voltage | 4022 [| 174 = column 5 | Vz JColumn 'Column 4 4 V dc | | (see 4.5.2) { | l {| 3 jof table : | I | | { [ | {Iv { I | f | i | i { i | | [ | | { 4. | Small-signal | 4051 | Iz4 = column 5 | Zzr | Icolumn 6 ohms: | j breakdown | | Isrg = 10 percent of Iz rms] | jof table ! | | impedance | | | | JIV : : | I | | | { | I { | | | | | | | i {| 5. | Thermal impedance | 3101 | See 4.5.5 lZeyx | t C/W | | | { | | : ' | { | | | | | | 35 | 1/ The electrical measurements for table [Vb of MIL-S-19500 are as follows: a. Subgroup 2, see table III herein, steps 1, 3, 4, and 5. b. Subgroups 3 and 6, see table III herein, steps 2, 3, and 4. 2/ The electrical measurements for table V of MIL-S-19500 are as follows: a. Subgroup 2, see table III herein, steps 1, 3, 4, and 5. b. Subgroup 6, see table III herein, steps 2, 3, and 4. 11MIL SPECS WHE D MM 0000125 0034540 51T MMNILS MIL-S-19500/117K TABLE IV. Test ratings. 5 percent diodes, types 1N9628-1_through 1N992B-1 and 1N962BUR-1_ through 1N992BUR-1 | | | | | | | | | i | Col 1 iCot 2icol 3 {col 4 | Col 5 'col 6 [col 7 | Col 8 {Col 9| col 10]col 11{Col 12 | Col 13 | Col 14 | i | { i | i ! | | { | {Ipy at [TRe at | avy {Voltage | Vv i Vz | Vz | 174 | Z7 | 22K | I7m |AVz { Iysn ! Vp | T } Tp {Temper- | group | Nom | Min | Max | Test [Imped-|(Knee |Max dc | | i j= +25C {= +150Cjature | | ! tcurrent| ance | imped-jcurrent| (Reg) | (Surge) | | Vp Vp jcoeffi- { I ! f | | tance) | | | I L=_col its col a2icrent | | | | { { | | | i | IVolts{Volts {Volts | mA | ohms | ohms | mA [Volts] mA !Volts | pA pA {| %/C | | | | | | | | | | \ | \ {1N962B-1{ 11 | 10.45] 11.55] 11.5 | 9.5} 700 | 35 } O.50] 590 [| 8.4 | 1.0 | 10 | 40.073 | | IN963B-1} 12 } 11.40] 12.60| 10.5 | 11.5] 700 | 32 | 0.55] 540 | 9.1 | 1.0 | 10 | +0.076 | {1N964B-1] 13 | 12.35! 13.65] 9.5 | 13.0{ 700 | 30 | o.60f 500 {| 9.9 | 0.5 ! 10 | +0.079 ! }1IN965B-1[ 15 | 14.25} 15.75) 8.5 | 16.0, 700 | 26 | O.70{ 433 {11 ny 10 + +0,082 , }1N966B-1| 16 | 45.20| 16.80] 7.8 | 17.0j 700 | 25 | 0.75] 406 | 12 I nd 10 ' +0.083 , |1N967B-1| 18 | 17.10} 18.90| 7.0} 21 | 750 | 21 } 0.85; 361 | 14 | not 10 | +0.085 ; }1N9688-1| 20 { 19.0 | 21.0 | 6.2 | 25 | 750 ] 19 j 0.95] 325 | 15 { wy 10 | +0.086 . }1n9698-1| 22 | 20.9 | 23.1 | 5.6] 29 | 750 | 17 | 1.05] 295 | 17 | HF 49 | 40.087 jing70B-1| 24 | 22.8} 25.2 | 5.2| 33 | 750} 16 | 1.15{ 271 | 18 | " } 40 | 40.088 | |ang71B-1| 27 | 25.7 | 28.3; 46] 41 | 750 | 14 | 14.30f 240 | 2t | " 40 | +0.090 | l4no72B-1] 30 | 28.51 31.5 | 42 4 49 | 1000[ 13 | 1.45] 216 | 23 | " i 40 | +0.091 | |1N9738-1| 33 | 31.4 | 34.6 | 3.8] 58 | 1000] 12 | 1.60] 197 [25 | "F409 | 40,092 | Hing748-1| 36 | 34.2 | 37.8] 3.4] 70 { 1000] 11 | 1.75| 180 | 27 | | 40 | 40,093 | |1n975B-1| 39 | 37.1 | 40.9 | 3.2] 80 | 1000] 9.1 | 1.90] 166 | 30 | "4 40 | +0.094 | }1n9768-1] 43 | 40.9 | 45.1 | 3.0 { 93 | 1000{ 8.8 | 2.10] 151 | 33 | * } 40 | 40.095 | \4n977B-1| 47 | 44.7 | 49.3 | 2.7] 105 | 1500] 7.9 | 2.25] 138 | 36 | " 1 40 | +0.095 | }1n9788-1| 51 | 48.5 | 53.5 | 2.5 | 125 | 1900] 7.4] 2.5 | 127 | 39 | " 1 410 | 40.096 | }1N9798-1| 56 | 53.2 | 58.8] 2.2] 150 | 2000| 6.9 ]2.7| 116 [43 | # 1 410 | 40.096 | |1N980B-1] 62 | 58.9 | 65.1 | 2.0 | 185 | 2000} 6.0 | 2.9 [ 105 | nod 10 ! +0.097 | |4n9818-1| 68 | 64.6 | 71.4 [| 1.8] 230 | 2000; 5.5] 3.2] 95 | 52 | mf 40 | 40,097 | |1N982B-1] 75 | 71.3 | 78.7 | 1.7 | 270 | 2000| 5.1/3.4] 86 | 56 | 0.5 | 10 | +0.098 | |1N9838-1| 82 | 77.9 | 86.1 | 1.5 | 330 | 3000 | 4.6 |3.8| 79 | 62 | | 10 {i +0.098 | j1N984B-1] 91 | 86.51 95.5 | 1.4 | 400 | 3000] 42] 4.2| 71 | 69 | " 1 40 | 40.099 ! |1N9858-1[100 | 95.0 {105.0 | 1.3 | $00 | 3000] 3.7] 4.4] 65 | 7% | H 1 49) | 40.410 | [1N986B-1]110 [104.5 [115.5 | 1.1 | 750 | 4000 | 3.31 4.8| 59 | 84 | mi 40 | 40.110 | |1N987B-1/120 [114.0 [126.0] 1.0 | 900} 4500] 3.1] 5.2] 54 | | $49 | 40.110 ! |1N9888-1|130 |123.5 [136.5 | 0.95] 1100 | S000 | 2.7/5.6] 50 | 99 | "ft 40 | 40.110 | }IN989B-1}150 [142.5 [157.5 | 0.85] 1500 | 6000 | 2.4 | 7-0] 43 (114 | " 40 | 40.110 | |1N990B-1]160 [152.0 [168.0 | 0.80] 1700 | 6500 | 2.2 | 7.5 | 40 [122 | wf 49) | 40.910 I |1N991B-1{180 [171.0 [189.0 | 0.68] 2200 | 7100] 2.0] 9.0 | 36 {137 | "F400 | 40.440 | |1N992B-1|200 |190.0 j210.0 | 0.65] 2500 | 80G0 | 1.8 |12.0 | 32 [152 | " 1 40 | #0.110 | | | i i | | 1 | | | | | i 12MIL SPECS TABLE IV. NEL-S-19500/117K Test ratings ~ Continued. W4E D MM 0000325 0034541 856 MMENILS 2 percent diodes, types AN962E- 1 through 1N992C-1 and ANIG2CUR- 1_ through AN992CURH 1 Cok 2,Cot 3 | I i i Col 8 {Cot 9! Col 10} cot 11, Col 12 ' col 13 ' Col 14 | col 1 jfol 4 , Col col 6 ;Col 7! : : i : I | | { i [Ipq_ at tipo at ' QVz } Voltage t Vz i V2 ' Vz : 174 | 27 i 22K I Izm | Ava Izsm i Ve i Ta 5 Ta : Temper t | group , Nom Min | Max | Test | Imped-' (Knee [Max de | | b= 425C '= 4150C- ature i i ! ycurrent! ance ;imped- current | (Reg) | (Surge) | t Ve ! VR icoeffi~ | } i i i 'ance) | | \ | 1= Col 11'= Col 12:cient : i i i : i i i l | i | : | j { lvoltstVolts [Volts mA | ohms } ohms ! mA frosts mA iVolts + pA pA | */7C ! | | | l | i l 11N962C-11 11 | 10.78: 11.22, 11.5 | 9.5; 7a0 | 35 | 0.50] 590 | 8.4; 1.0 ;, 10 : #0.073 JIN963c-1{ 12 | 11.76] 12.24; 10.5 | 41.5} 700 | 32 0.55; 540 | 9.1 | 1.0 { 10 | +0.076 | f1N964C-1] 13. | 12.74] 13.25! 9.5 ; 13.0: 700 { 30, $0.60: 500 | 9.9 ; O.5 | 10 * +0.079 ! pIN965C-1! 15 {| 14.76, 15.39) 8.5 | 16.C 700 t 26 { 0.70! 433 4 11 " 10 +0.082 11N966C-1] 16 | 15.681 16.32! 7.8 | 17.0) 7004 25 | 0.75; 406 } 12 |} " | 10 , +0.083 =: }1N967C-1] 18 | 17.64! 18.36) 7.0 | 21 750 { 27 | 0.85] 361 | 14 | " ' 10 | +0.085 ; }1N968C-1| 20 | 19.60] 20.40; 6.2 | 25 { 750 | 19 | 0.95, 325 | 15 7 J " { 10 i +0.086 }IN969C-1] 22 | 21.56) 22.444 5.61 29 | 750 | 17 [ 1.05] 295 | 17 | " * 410 > #0.087 ' }IN97OC-1] 24 | 23.52] 24.48] 5.2} 33 | 750 | 16 | 1.15{, 271 [| 18 | " * 10 40.088 : 14n971C-1| 27 | 26.46[ 27.54) 4.6 | 41 | 750 | 14 | 4.30{ 240 | 21 " i 10 j +0.090 | j1N972C-1| 30 , 29.40] 30.60; 4.2 | 49 | 1000 | 13 | 1.45] 216 | 23 t " + 10 : 40.091 | 11N973C-1{ 33 | 32.34 33.66] 3.8 | 58 | 1000 } 12 {| 1.60] 797 | 25 | " ' 10 {| #0.092 | HIN974C-1] 36 | 35.28] 36.72' 3.4] 70 | 1000 | 11 [ 1.75] 180 | 27 | " ; 10 ; +0.093 } }1N975C-1| 39 [| 38.22] 39.78] 3.2 | 80 ! 1000 | 9.1] 1.90] 166 | 30 | " | 10 1 40.094 | {1N976C-1} 43 | 42.14[ 43.86] 3.0 | 93 | 1000 | 8.8] 2.10] 151 | 33 I " { 10 1 40.095 | }1N977C-1| 47 | 46.06) 47.94] 2.7 | 105 } 1500 | 7.9| 2.25[ 138 | 36 | " } 10 j +0.095 { {1N978C-1| 57 |} 49.98] 52.02} 2.5 | 125 | 1500 | 7.4[ 2.5 | 127 $39 | w { 10 | +0.096 | JIN979C-1] 56 | 54.88] 57.12] 2.2 | 150 { 2000 | 6.9| 2.7 | 116 | 43 | " t 10 1 40.096 | JIN980C-1| 62 | 60.76] 63.24] 2.0 | 185 | 2000 | 6.0} 2.9 | 105 | 47 | " } 10 } +0.097 ! |1N981C-1| 68 | 66.64] 69.36, 1.8 } 230 | 2000 | 5.5, 3.2 | 95 | 52 | " { 10 ' 40.097 ! [ang82c~-1| 75 | 73.50] 76.50] 1.7 | 270 { 2000 | 5.1] 3.4 | 86 [| 56 | O.5 i 10 1 +0.098 : |1N983c-1] 82 | 80.36}; 83.64) 1.5 | 330 {| 3000 | 4.6] 3.8 | 79 [| 62 | " ; 10 , 40.098 | H1N984C-1| 91 | 89.18} 92.82] 1.4 ; 400 } 3000 | 4.2| 4.2 | 717 | 69 | " {| 10 | +0.099 : }1N985C-11100 | 98.0 [102.0 | 1.3 | 500 ; 3000 | 3.71 4.4 | 65 | 76 | " { 10 f +0.110 } {1N986C-1|110 107.8 7172.2 | 1.1 | 750 | 4000 f 3.3] 4.8 | 59 {| 84 | " f 10 i 40.110 { {1N987C-1]120 [117.6 4122.4 | 1.0 | 900 { 4500 | 3.1] 5.2 | 54 [ 91 | " i 10 | 40.110 | {1N988C-1,|130 [127.4 |132.6 | 0.95/1100 , 5000 | 2.7| 5.6 | 50 | 99 f | 10 t +0.110 { 11N989C-1{150 [147.0 1153.0 | 0.85|1500 | 6000 l 2.47.0 [ 43 {114 |[ " {| 10 ! +0.110 ! [1n990C-11160 {156.8 [163.2 | 0.80[1700 | 6500 | 2.21 7.5 | 40 {122 | " { 10 { +0.110 | {1N991C-1]180 [176.4 ]183.6 | 0.68]2200 | 7100 | 2.0 9.0 | 36 [137 | " { 10 | +0.110 [| }1N992C-1|200 [196.0 [204.0 | 0.65{2500 | 8000 | 4.8]12.0 | 32 [152 | " | 10 | +0.110 | | | | | | { | | L 13MIL SPECS TABLE IV. 44E D @@ 0000325 0034542 752 MMNILS MIL-S-19500/117K Test ratings ~ Continued. 1 percent diodes, types 1N962D-1 through 1N992D-1 and 1N962DUR-1 through IN9920UR- 1 ! ! | | | cot 1 Cot 2!col 3 [col 4 | Col 5 {Col 6 [Col 7 | Col 8 [Col 9] Col 10|Col 11|Col 12 | col 13 | col 14 | | i | ts i ot i | | digy at algo at | avy | | Voltage | Vv | Vz | Vz | 174 | Zz } 27K | 17m |AVz | Izs54 | Vp | Ta | Ta | Temper- I | group [| N om | Min | Max | Test [Imped-|(Knee |Max de | | | {= #25C ,;= +150Clature = | | | | | lcurrent| ance | imped-|current| (Reg) | (Surge) | | Vr | Vp jeoeffi- | | | | | { Jance) | | [= Col 111= Col 12|cient i | | | | | | | | | { | | | | [Volts|Volts [Volts | mA | ohms | ohms | mA Volts} mA [Volts | pA | vA | 4/c_ [ [ | | | | | | | | | | | | | |4n962D-1] 11 | 10.89 11.11] 11.5 | 9.5] 700 | 35 | 0.50] 590 | 8.4] 1.0 | 10 { +0.073 | |1N9630-1] 12 | 11.88] 12.12] 10.5 | 11.5] 700 | 32 | 0.55{ 540 | 9.1] 1.0 | 10 | 40.076 | |1N964D-1| 13 | 12.87] 13.13} 9.5 | 13.0 700] 30 [ 0.60f 500 | 9.9] 0.5 | 10 | +0.079 | HIN965D-1{ 15 | 14.85} 15.15] 8.5 | 16.0] 700] 26 | 0.70] 433 | 11 | " i 10 | +0,082 ! H4n966D-1] 16 | 15.84] 16.16 7.8] 17.0| 700| 25 | 0.75] 406 J} 12 | { 10 | +0.083 | |1N9670-1| 18 | 17.82] 18.18] 7.0 | 21 | 750 | 21 | 0.85{ 361 | 14 | " | 10 | +0.085 | |1N968D-1] 20 | 19.80} 20.20] 6.2] 25 | 750] 19 | 0.95| 325 | 15 | 4 10 | +0,086 | |1N969D-1| 22 | 21.78] 22.22] 5.6] 29 | 750} 17 | 1.05] 295 | 17 [| | 10 { 40,087 | |4N970D-1] 24 | 23.76] 24.24] 5.2] 33 | 750] 16 | 1.15| 271 | 18 | {| 10 | +0.088 | |1N9710-1] 27 | 26.73] 27.27] 4.6] 47 | 750] 14 | 1.30] 240 | 21 | " | 10 { 40.090 | |1N972D-1| 30 | 29.70] 30.30} 4.2] 49 | 1000] 13 | 1.45] 216 | 23 | | 10 | 0,091 | |1N973D-1| 33 | 32.67] 33.33} 3.8] 58 | 1000; 12 | 1.60] 197 [25 {| | 10 | 40.092 | |1N974D-1| 36 | 35.64] 36.36] 3.4] 70 | 1000] 11 | 1.75} 180 | 27 | " | 10 | 40.093 | |1N97SD~1| 39 | 38.61] 39.39] 3.2 | 80 | 1000] 9.1] 1.90] 166 | 30 | " | 10 | 40.09% | |1N976D-1| 43 | 42.57] 43.43] 3.0] 93 | 1000 8.8] 2.10] 151 | 33 | | 10 | 40,095 | |1N977D-1| 47 | 46.53] 47.47] 2.7 | 105 | 1500 7.9| 2.25[ 138 | 36 | | 10 | 40.095 | |1N978D-1| 51 | 50.49] 51.51] 2.5 | 125 | 1500 7.42.5] 127 |39 | | 10. | 40,096 | |1N9790-1] 56 | 55.44] 56,56] 2.2 | 150 | 2000 6.91 2.7] 16 | 43 | | 10 | 40.096 | [1N9800-1] 62 | 61.38] 62.62] 2.0 | 185 | 2000 6.0/2.9] 105 | 47 | | 10 [| +0.097 | 11N981D-1| 68 | 67.32] 68.68 1.8 | 230 | 2000 5543.2] 95 | 52 f | 10 | 40.097 | |1N982D-1]} 75 | 74.25| 75.75} 1.7 [| 270 | 2000 5.1] 3.4] 86 | 56 |} 0.5 | 10 | 40,098 | |1N983D-1| 82 | 81.18] 82.82/ 1.5} 330 | 3000] 4.6/3.8| 79 | 62 | " Ff 10 | +0.098 | |1N984D-1] 91 | 90.09] 91.91] 1.4 | 400 3000 | 4.2; 4.2 | 717 | 69 | " | 10 | +0.099 | [1N985D-1]100 | 99.0 |101.0 | 1.3] 500 { 3000] 3.7/4.4] 65 | 76 | | 10 | +0.110 | JIN986D-1/110 {108.9 [111.7 | 1.1 | 750 4000 3.31 4.8 | 59 [| 8 | | 10 | +0.110 | 11N987D-1|120 [118.8 ]121.2 | 1.0 | 900 | 4500 3.14, 5.2} 54 791 | " | 10 | 40.140 | [1N988D-1|130 128.7 |131.3 | 0.95{1100 | 5000{ 2.7/5.6] so [99 | * | 10 | 40.110 | |4N989D-1|150 {148.5 |151.5 | 0.85/1500 | 6000] 2.4/7.0] 43 {114 | " | 10 { 40.110 | |1N990D-1]160 [158.4 |161.6 | 0.80/1700 | 6500 2.21 7.5} 40 |122 | | 10 | 40.110 | 11N991D-1]180 [178.2 |181.8 | 0.68|2200 | 7100 2.0} 9.0] 36 {137 | | 40 | 40.110 | J}1N992D-1]200 [198.0 |202.0 | 0.65]2500 8000 1.8[12.0 | 32 {152 | " | 10 | +0.110 | | | | | | | i | | | | 14Mil SPECS 13 44UE D MM Ooo01e25 OO34543 629 MEMILS MIL-S-19500/7117K an L=.125 = 400 | = ce tw J Sa 375 ax 300 - Ls. L=0 (SURFACE = i MOUNT) Dao ae L=.250 x= 200 . =e WY WY o 100 - | | 25 73 L2s 175 LEAD TEMPERATURE-DEGREES CELSIUS AT DESCRIBED LEAD LENGTH Inches mm -000 0.00 .125 3.18 .250 6.35 375 9.53 FIGURE 5S. Maximum power versus lead temperature and lead Length (see 6.4). 15MIL SPECS UNE D MM OO00125 0034544 5&5 MENILS - MIL-S-19500/117K 5, PACKAGING 5.1 Packaging requirements. The requirements for packaging shalt be in accordance with MIL-S-19500. 6. NOTES - (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. ) 6.1 Notes. The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. . b. c. d. Issue of DODISS to be cited in the solicitation. Lead finish as specified (see 3.3.1). For die acquisition, the JANHC letter version should be specified (see figures 3 and 4). Product assurance level and type designation. 6.3 Cross reference substitution. JANS level will no Longer be built to this specification. Devices in stock are acceptable provided the date code does not exceed the date of implementation of this specification. Devices required for space flight applications shall meet the requirements of MIL~S~19500/533. Existing supplies of the superseded parts may be used until exhausted. A PIN for PIN replacement table follows, and these devices are directly interchangeable. | JANS JANS | | superseding superseded | | PIN PIN | | | | | 1N6327 | AN964B-1 | | 1N6328 | 1N965B-1 | | 1N6329 | 1N966B-1 | | 4N6330 | 1N967B-1 | | 1N6331 | 4N9688-1 | | 1N6332 | 1N969B-1 | | 1N6333 { 1N970B-1 | | 1N6334 1N971B-1 | f 1N6335 | 4N972B-1 | | 1N6336 | 1N973B-1 | | 1N6337 | 1N974B~1 | |. 1N6338 | 4N975B-1 | | 1N6339 | 4N976B-1 | | 1N6340 | 1N977B-1 | | 1N6341 | 4NS78B-1 | | 4N6342 | 4N979B-1 | | 1N6343 | 1N980B-1 | | 1N6344 | 1N9818-1 | | 4N6345 1N9828-1 | | 1N6346 | 4N983B-1 | { 1N6347 | 1N984B-1 | | 1N6348 | 1N985B-1 | | 1N6349 | 1N986B-1 | | 1N6350 | 1N9878-1 | | 1N6351 | 1N988B-1 | | 1N6352 | 1N989B-1 | | 1N6353 | 4N990B-1 | | 1N6354 | 4N991B-1 | | 1N6355 | 1N992B-1 | | | | 6.4 Maximum power versus lead temperature. Typical maximum power rating as a function of lead temperature for various lead lengths is shown on figure 5. 16"MIL SPECS 44E D MM 0000225 OO34545 471 MMNILS MIL-3-19556/7 *7K 6.5 Suppliers of JANHC die. The qualified JANHC suppliers with the applicable letter version (e.g., JANHCAINGE2B) will be identified on the QPL. JANC ordering ~: formation 1/ PIN Manufacturer CAGE 55801 12954 1H9628 JANHCA1N962B JANHCBIN9628 18363B JANHCA1N963B JANHCB1N963B 18.9648 JANHCA1N964B JANHCB1N964B 189658 JANHCA1N965B JANHCB1N9658 189668 JANHCA1N966B JANHCB1N966B8 1H9678 JANHCA1N967B JANHCB1N967B INIER JANHCAIN968B JANHCB1N9688 IN969B JANHCA1H9I69B JANHCBIN969B 7N970B JANHCA1N970B JANHCB1N9708 1N971B JANHCA1N971B JANHCB1N971B 1N972B JANHCAIN972B JANHCB1N972B 109738 JANHCA1N973B JANHCB1N973B 1N9748 JSANHCA1N974B JANHCB1N974B 4N975B JANHCA1N975B JANHCB1N975B 1N976B8 JANHCA1N976B JANHCB1N976B 1N9778 JANHCA1N977B JANHCB1N977B 1N9788 JANHCA1N9788 JANHCB1N978B 1N979B JANHCA1N979B JANHCB1N979B 19808 JANHCA1N980B JANHCB1N980B 1N981B JANHCA1N981B JANHCB1N981B 1N982B JANHCA1N982B JANHCB1N9828 1N9838 JANHCA1N983B JANHCB1N983B 1N984B JANHCA1N984B JANHCB1N984B 1N985B JANHCA1N985B JANHCB1IN985B 1N986B JANHCA1N986B JANHCB1N986B 41N9878 JANHCA1N987B JANHCB1N9878 1N9888 JANHCAIN988B JANHCB1N988B IN9898 JANHCATN989B JANHCB1N9898 1N990B JANHCA1N990B JANHCB1N9908 1N9918 JANHCATNI918 JANHCB1N991B 1N992B JANHCA1N992B JANHCB1N992B 1/ Applres to "C" and "D0" suffix versions also. Simply replace all B" suffixes with "C" or "Dd" as applicable for correct PIN. 6.6 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. 7NIL SPECS GUE D MM 0000325 O03454b 338 MENILS MIL-S-19500/117K CONCLUDING MATERIAL Custodians: Preparing activity: Army - ER DLA - ES Navy - EC Air Force ~- 17 Agent: NASA ~- NA DLA - ES Review activities: (Project 5961-1630) Army ~ AR, AV, MI, SM Navy - AS, CG, MC Airc force - 13, 19, 85, 99 18