Symbol Parameter Conditions Min Typ Max Units
Digital Interface (DATA, CLK, LE, CE, Ftest/LD, FLout)
VIH High-Level Input Voltage 1.6 2.75 V
VIL Low-Level Input Voltage 0.4 V
IIH High-Level Input Current VIH = 1.75 -3.0 3.0 µA
IIL Low-Level Input Current VIL = 0 V -3.0 3.0 µA
VOH High-Level Output Voltage IOH = 500 µA 2.0 2.65 V
VOL Low-Level Output Voltage IOL = -500 µA 0.0 0.4 V
MICROWIRE Timing
tCS Data to Clock Set Up Time See Data Input Timing 25 ns
tCH Data to Clock Hold Time See Data Input Timing 20 ns
tCWH Clock Pulse Width High See Data Input Timing 25 ns
tCWL Clock Pulse Width Low See Data Input Timing 25 ns
tES Clock to Enable Set Up Time See Data Input Timing 25 ns
tCES Enable to Clock Set Up Time See Data Input Timing 25 ns
tEWH Enable Pulse Width High See Data Input Timing 25 ns
Note 2: There are program bits that need to be set based on the OSCin frequency. Refer to the following sections: 2.7.8 XTLSEL[2:0] -- Crystal Select, 2.8.1
XTLDIV[1:0] -- Division Ratio for the Crystal Frequency, 2.8.2 XTLMAN[11:0] -- Manual Crystal Mode, 2.9.1 XTLMAN2 -- MANUAL CRYSTAL MODE SECOND
ADJUSTMENT, and2.9.2 LOCKMODE -- FREQUENCY CALIBRATION MODE. Not all bit settings can be used for all frequency choices of OSCin. For instance,
automatic modes described in 2.7.8 XTLSEL[2:0] -- Crystal Select do not work below 8 MHz.
Note 3: One of the specifications for modeling PLL in-band phase noise is the PLL 1/f noise normalized to 1 GHz carrier frequency and 10 kHz offset, LPLL_flicker
(10 kHz). From this normalized index of PLL 1/f noise, the PLL 1/f noise can be calculated for any carrier and offset frequency as:
LNPLL_flicker(f) = LPLL_flicker(10 kHz) - 10·log(10 kHz / f) + 20·log( Fout / 1 GHz ). Flicker noise can dominate at low offsets from the carrier and has a 10 dB/decade
slope and improves with higher charge pump currents and at higher offset frequencies . To accurately measure LPLL_flicker(10 kHz) it is important to use a high
phase detector frequency and a clean reference to make it such that this measurement is on the 10 dB/decade slope close to the carrier. LPLL_flicker(f) can be
masked by the reference oscillator performance if a low power or noisy source is used. The total PLL in-band phase noise performance is the sum of LPLL_flicker
(f) and LPLL_flat. In other words,LPLL(f) = 10·log(10(LNPLL_flat / 10 ) + 10(LNPLL_flicker (f) / 10 )
Note 4: A specification used for modeling PLL in-band phase noise floor is the Normalized PLL noise floor, LNPLL_flat, and is defined as:
LNPLL_flat = L(f) – 20·log(N) – 10·log(fPD). LPLL_flat is the single side band phase noise in a 1 Hz Bandwidth and fPD is the phase detector frequency of the synthesizer.
LPLL_flat contributes to the total noise, L(f). To measure LPLL_flat the offset frequency must be chosen sufficiently smaller then the loop bandwidth of the PLL, and
yet large enough to avoid a substantial noise contribution from the reference and PLL flicker noise. LPLL_flat can be masked by the reference oscillator performance
if a low power or noisy source is used. The total PLL in-band phase noise performance is the sum of LPLL_flicker(f) and LPLL_flat. In other
words,LPLL(f) = 10·log(10(LNPLL_flat / 10 ) + 10(LNPLL_flicker (f) / 10 )
Note 5: Maximum Allowable Temperature Drift for Continuous Lock is how far the temperature can drift in either direction from the value it was at the time that
the R0 register was last programmed, and still have the part stay in lock. The action of programming the R0 register, even to the same value, activates a frequency
calibration routine. This implies that the part will work over the entire frequency range, but if the temperature drifts more than the maximum allowable drift for
continuous lock, then it will be necessary to reload the R0 register to ensure that it stays in lock. Regardless of what temperature the part was initially programmed
at, the temperature can never drift outside the frequency range of -40°C ≤TA≤ 85°C without violating specifications.
Note 6: The VCO phase noise is measured assuming that the loop bandwidth is sufficiently narrow that the VCO noise dominates. The maximum limits apply
only at center frequency and over temperature, assuming that the part is reloaded at each test frequency. Over frequency, the phase noise can vary 1 to 2 dB,
with the worst case performance typically occurring at the highest frequency. Over temperature, the phase noise typically varies 1 to 2 dB, assuming the part is
reloaded.
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LMX2531