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Si534

QUAD FREQUENCY CRYSTAL OSCILLATOR (XO)

(10 MHZ TO 1.4 GHZ)

Features

Applications

Description

The Si534 quad frequency XO utilizes Silicon Laboratories’ advanced

DSPLL

circuitry to provide a low jitter clock at high frequencies. The Si534

is available with any-rate output frequency from 10 to 945 MHz and select

frequencies to 14 00 MHz. Unlike a traditional XO wh ere a different crystal is

required for each output frequency, the Si534 uses one fixed crystal to

provide a wide range of output frequencies. This IC-based approach allows

the crystal resonato r to provide exceptio nal freq uency stability an d reliabili ty.

In addition, DSPLL clock synthesis provides superior supply noise rejection,

simplifying the task of generating low jitter clocks in noisy environments

typically found in communication systems. The Si534 IC-based XO is factory

configurable for a wide variety of user specifications including frequency,

supply voltage, output format, and temperature stability. Specific

configurations are factory programmed at time of shipment, thereby

eliminating long lead times associated with custom oscillators.

Functional Block Diagram

Available with any-rate output

frequencies from 10 MHz to 94 5 MHz

and select frequencies to 1.4 GHz

Four selectable output frequencies

3rd generation DSPLL® with superior

jitter performance

3x better frequency stability than

SAW-based oscillators

Internal fixed crystal frequency

ensures high reliability and low

aging

Available CMOS, LVPECL,

LVDS, and CML outputs

3.3, 2.5, and 1.8 V supply options

Industry-standard 5 x 7 mm

package and pinout

Pb-free/RoHS-compliant

SONET/SDH

Networking

SD/HD video

Test and measurement

Clock and data recovery

FPGA/ASIC clock generation

Fixed

Frequency

Any-rate

10–1400 MHz

DSPLL®

Clock

Synthesis

VDD CLK+CLK–

OE GND

FS[1] FS[0]

Ordering Information:

See page 7 .

Pin Assignments:

See page 6.

(Top View)

Si5602

(LVDS/LVPECL/CML)

(CMOS)

4GND

VDD

CLK+

CLK–

FS[1]

FS[0]

4GND

VDD

CLK

FS[1]

FS[0]

REVISION D

Si534

2 Rev. 1.3

1. Electrical Specifications

Table 1. Recommended Operating Conditions

Parameter Symbol Test Condition Min Typ Max Units

Supply Voltage1VDD 3.3 V option 2.97 3.3 3.63 V

2.5 V op tio n 2.25 2.5 2.75 V

1.8 V op tio n 1.71 1.8 1.89 V

Supply Current IDD Output enabled

LVPECL

CML

LVDS

CMOS

—

111

121

108

Tristate mode — 60 75 mA

Output Enable (OE)

and Frequency Select FS[1:0]2VIH 0.75 x VDD ——V

VIL ——0.5V

Operating Temperature Range TA–40 — 85 ºC

Notes:

1. Selectable parameter specified by part number. See Section 3. "Ordering Information" on page 7 for further details.

2. OE and FS[1:0] pins include a 17 k pullup resistor to VDD.

Table 2. CLK± Output Frequency Characteristics

Parameter Symbol Test Condition Min Typ Max Units

Nominal Frequency1,2 fOLVPECL/LVDS/CML 10 — 945 MHz

CMOS 10 — 160 MHz

Initial Accuracy fiMeasured at +25 °C at time of

shipping — ±1.5 — ppm

Temperature Stability1,3 –7

–20

–50

—

+20

+50 ppm

Aging faFrequency drift over first year — — ±3 ppm

Frequency drif t over 20-year life — — ±10 ppm

Total Stability Temp stability = ±7 ppm — — ±20 ppm

Temp stability = ±20 ppm — — ±31.5 ppm

Temp stability = ±50 ppm — — ±61.5 ppm

Notes:

1. See Section 3. "Ordering Information" on page 7 for further details.

2. Specified at time of order by part number. Also availabl e in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.

3. Selectable parameter specified by part number.

4. Time from powerup or trist ate mode to fO.

Si534

Rev. 1.3 3

Powerup Time4tOSC ——10ms

Settling Time After FS[1:0]

Change tFRQ Both FS[1] and FS[0] changing

simultaneously ——20ms

Table 3. CLK± Output Levels and Symmetry

Parameter Symbol Test Condition Min Typ Max Units

LVPECL Output Option1VOmid-level VDD – 1.42 — VDD – 1.25 V

VOD swing (diff) 1.1 —1.9 VPP

VSE swing (single-ended) 0.55 —0.95 VPP

LVDS Output Option2VOmid-level 1.125 1.20 1.275 V

VOD swing (diff) 0.5 0.7 0.9 VPP

CML Output Option2VO2.5/3.3 V option mid-level — VDD – 1.30 — V

1.8 V option mid-level — VDD – 0.36 — V

VOD 2.5/3.3 V option swing (diff) 1.10 1.50 1.90 VPP

1.8 V option swing (diff) 0.35 0.425 0.50 VPP

CMOS Output Option3VOH IOH =32mA 0.8 x VDD —VDD V

VOL IOL =32mA — — 0.4 V

Rise/Fall time (20/80%) tR, tFLVPECL/LVDS/CML — — 350 ps

CMOS with CL=15pF — 1 — ns

Symmetry (duty cycle) SYM LVPECL: VDD – 1.3 V

(diff)

LVDS: 1.25 V (diff)

CMOS: VDD/2

45 — 55 %

Notes:

1. 50  to VDD – 2.0 V.

2. Rterm = 100  (differential).

3. CL = 15 pF

Table 2. CLK± Output Frequency Characteristics (Continued)

Parameter Symbol Test Condition Min Typ Max Units

Notes:

1. See Section 3. "Ordering Information" on page 7 for further details.

2. Specified at time of order by part number. Also availabl e in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.

3. Selectable parameter specified by part number.

4. Time from powerup or trist ate mode to fO.

Si534

4 Rev. 1.3

Table 4. CLK± Output Phase Jitter

Parameter Symbol Test Condition Min Typ Max Units

Phase Jitter (RMS)1

for FOUT > 500 MHz J12 kHz to 20 MHz (OC-48) — 0.25 0.40 ps

50 kHz to 80 MHz (OC-192) — 0.26 0.37 ps

Phase Jitter (RMS)1

for FOUT of 125 to 500 MHz J12 kHz to 20 MHz (OC-48) — 0.36 0.50 ps

50 kHz to 80 MHz (OC-192)2— 0.34 0.42 ps

Phase Jitter (RMS)

for FOUT of 10 to 160 MHz

CMOS Output Only

J12 kHz to 20 MHz (OC-48)2—0.62—ps

50 kHz to 20 MHz2—0.61—ps

Notes:

1. Refer to AN256 for further information.

2. Max offset frequencies: 80 MHz for FOUT > 250 MHz, 20 MHz for 50 MHz < FOUT <250 MHz,

2 MHz for 10 MHz < FOUT <50 MHz.

Table 5. CLK± Output Period Jitter

Parameter Symbol Test Condition Min Typ Max Units

Period Jitter* JPER RMS — 2 — ps

Peak-to-Peak — 14 — ps

*Note: Any output mode, including CMOS, LVPECL, LVDS, CML. N = 1000 cycles. Refer to AN279 for further information.

Table 6. CLK± Output Phase Noise (Typical)

Offset Frequency (f) 120.00 MHz

LVDS 156.25 MHz

LVPECL 622.08 MHz

LVPECL Units

100 Hz

1kHz

10 kHz

100 kHz

1MHz

10 MHz

100 MHz

–112

–122

–132

–137

–144

–150

n/a

–105

–122

–128

–135

–144

–147

n/a

–97

–107

–116

–121

–134

–146

–148

dBc/Hz

Si534

Rev. 1.3 5

Table 7. Environmental Compliance

The Si534 meets the following qualification test requirements.

Parameter Conditions/Test Method

Mechanical Shock MIL-STD-883, Method 2002

Mechanical Vibration MIL-STD-883, Method 2007

Solderability MIL-STD-883, Method 2003

Gross & Fine Leak MIL-STD-883, Method 1014

Resistanc e to Solder Heat MIL-STD-883, Method 2036

Moisture Sensitivity Level J-STD_020, MSL1

Contact Pads Gold over Nickel

Table 8. Thermal Characteristics

(Typical values TA = 25 ºC, VDD =3.3V)

Parameter Symbol Test Condition Min Typ Max Unit

Thermal Resistance Junction to Ambient JA Still Air — 84.6 — °C/W

Thermal Resistance Junction to Case JC Still Air — 38.8 — °C/W

Ambient Temperature TA–40 — 85 °C

Junction Tem p er a tur e TJ——125°C

Table 9. Absolute Maximum Ratings1

Parameter Symbol Rating Units

Maximum Op er at ing Temperatur e TAMAX 85 ºC

Supply Voltage, 1.8 V Option VDD –0.5 to +1.9 V

Supply Voltage, 2.5/3.3 V Option VDD –0.5 to +3.8 V

Input Voltage (any input pin) VI–0.5 to VDD + 0.3 V

Storage Temperature TS–55 to +125 ºC

ESD Sensitivity (HBM, per JESD22-A114) ESD 2000 V

Soldering Temperatur e (Pb -f re e pr of ile)2TPEAK 260 ºC

Soldering Temperature Time @ TPEAK (Pb-free profile)2tP20–40 seconds

Notes:

1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional

operation or specification compliance is not implied at th ese conditions. Exposure to maximum rating conditio ns for

extended periods may affect device reliability.

2. The device is compliant with JEDEC J-STD-020C. Refer to Si5xx Packaging FAQ available for download at

www.silabs.com/VCXO for further information, including soldering profiles.

Si534

6 Rev. 1.3

2. Pin Descriptions

Table 10. Pin Descriptions

Pin Symbol LVDS/LVPECL/CML Function CMOS Function

1 NC No connection No connection

2OE* Output enable

0 = clock output disabled (output s trist ated)

1 = clock output enabled

Output enable

0 = clock output disabled (outputs tristated)

1 = clock output enabled

3 GND Electrical and Case Ground Electrical and Case Ground

4 CLK+ Oscillator Output Oscillator Output

5 CLK– Complementary Output No connection

DD Power Supply Voltage Power Supply Voltage

7 FS[1]* Frequency Select MSB Frequency Select MSB

8 FS[0]* Frequency Select LSB Frequency Select LSB

*Note: FS[1:0] and OE include a 17 k pullup resistor to VDD. See Section 3. "Ordering Information" on page 7 for details on

frequency value ordering.

(Top View)

LVDS/LVPECL/CML CMOS

4GND

VDD

CLK+

CLK–

FS[1]

FS[0]

4GND

VDD

CLK

FS[1]

FS[0]

Si534

Rev. 1.3 7

3. Ordering Information

The Si534 XO supports a variety of options including frequency, temperature stability, output format, and VDD.

Specific device configurations are programmed into the Si534 at time of shipment. Configurations can be specified

using the Part Number Configuration chart below. Silicon Laboratories provides a web browser-based part number

configuration utility to simplify this process. Refer to www.silabs.com/VCXOPartNumber to access this tool and for

further ordering instructions. The Si534 is supplied in an industry-standard, RoHS compliant, 6-pad, 5 x 7 mm

package.

Figure 1. Part Number Convention

Example Part Number: 534AB000108DGR is a 5 x 7 mm quad XO in a 8 pad package. Since the six digit code (000108) is > 000100,

f0 is 644.53125 MHz (lower frequency) and f1 is 693.48299 (higher frequency), with a 3.3 V supply, LVPECL output, and Output

Enable active high polarity. Temperature stability is specified as ±20 ppm. The part is specified for a –40 to +85 C° ambient

temperature range operation and is shipped in tape and reel format.

R = Tape & Reel

Blank = Trays

Operating Temp Range (°C)

G –40 to +85 °C

Device Revision Letter

534 Quad XO

Product Family

6-digit Frequency Designator Code

Four unique frequencies can be specified within the following

bands of frequencies: 10 to 945 MHz, 970 to 1134 MHz, and 1213

to 1417 MHz. A six digit code will be assigned for the specified

combination of frequencies. Codes > 000100 refer to quad XOs

programmed with the lowest frequency value selected when

FS[1:0] = 00, and the highest value when FS[1:0] = 11. Six digit

codes < 000100 refer to quad XOs programmed with the highest

frequency value selected when FS[1:0] = 00, and the lowest value

when FS[1:0] = 11.

534 X X XXXXXX D G R

1st Option Code

VDD Output Format Output Enable Polarity

A 3.3 LVPECL High

B 3 .3 LVDS High

C 3.3 CMOS High

D3.3CML High

E 2.5 LVPECL High

F 2.5 LVDS High

G 2.5 CMOS High

H2.5CML High

J 1.8 CMOS High

K1.8CML High

M 3.3 LVPECL Low

N 3.3 LVDS Low

P3.3CMOS Low

Q3.3CML Low

R 2.5 LVPECL Low

S 2.5 LVDS Low

T2.5CMOS Low

U2.5CML Low

V1.8CMOS Low

W1.8CML Low

Note:

CMOS available to 160 MHz.

2nd Option Code

Code Temperature Stability (pp m, max, ±) Total Stab lility (ppm, max, ±)

A 50 61.5

B 20 31.5

C 7 20

Si534

8 Rev. 1.3

4. Outline Diagram and Suggested Pad Layout

Figure 2 illustrates the package details for the Si534. Table 11 lists the values for the dimensions shown in the

illustration.

Figure 2. Si534 Outline Diagram

Table 11. Package Diagram Dimensions (mm)

Dimension Min Nom Max

A 1.50 1.65 1.80

b 1.30 1.40 1.50

b1 0.90 1.00 1.10

c 0.50 0.60 0.70

c1 0.30 — 0.60

D 5.00 BSC

D1 4.30 4.40 4.50

e 2.54 BSC

E 7 .00 BSC

E1 6.10 6.20 6.30

H 0.55 0.65 0.75

L 1.17 1.27 1.37

L1 1.07 1.17 1.27

p 1.80 — 2.60

R0.70 REF

aaa — — 0.15

bbb — — 0.15

ccc — — 0.10

ddd — — 0.10

eee — — 0.05

Note:

1. All dimensions shown are in millimeters (mm) unl ess oth erwise noted.

2. Dimensioning and Tolerancing per ANSI Y14.5M-1994.



Si534

Rev. 1.3 9

5. Si534 Mark Specification

Figure 3 illustrates the mark specification for the Si534. Table 12 lists the line information.

Figure 3. Mark Specification

Table 12. Si53x Top Mark Description

Line Position Description

1 1–10 “SiLabs 534”

2 1–10 Si530, Si531: Option1 + Option2 + Freq(7) + Temp

Si532, Si533, Si534, Si530/Si531 w/ 8-digit resolution:

Option1 + Option2 + ConfigNum(6) + Temp

3 Trace Code

Position 1 Pin 1 orientation mark (dot)

Position 2 Product Revision (D)

Position 3–6 Tiny Trace Code (4 alphanumeric characters per assembly release instructions)

Position 7 Year (least significant year digit), to be assigned by assembly site (ex: 2007 = 7)

Position 8–9 Calendar Work Week number (1–53), to be assigned by assembly site

Position 10 “+” to indicate Pb-Free and RoHS-compliant



Si534

10 Rev. 1.3

6. 8-Pin PCB Land Pattern

Figure 4 illustrates the 8-pin P CB land pattern for the Si554. Table 13 lists the values for the dimensions shown in

the illustration.

Figure 4. Si534 PCB Land Pattern

Table 13. PCB Land Pattern Dimensions (mm)

Dimension Min Max

D2 5.08 REF

D3 5.705 REF

e 2.54 BSC

E2 4.20 REF

GD 0.84 —

GE 2.00 —

VD 8.20 REF

VE 7.30 REF

X1 1.70 TYP

X2 1.545 TYP

Y1 2.15 REF

Y2 1.3 REF

ZD — 6.78

ZE — 6.30

Note:

1. Dimensioning and tolerancing per th e ANSI Y14.5M-1994

specification.

2. Land pattern design follows IPC-7351 guidelines.

3. All dimensions shown are at maximum material conditio n

(MMC).

4. Controlling dimension is in millime ters (mm).

Si534

Rev. 1.3 11

DOCUMENT CHANGE LIST

Revision 1.0 to Revision 1.1

Updated Table 1 , “Recommended Operating

Conditions,” on page 2.

Device maintains stable operation over –40 to +85 ºC

operating temperature range.

Supply current specifications updated for revision D.

Updated Table 2, “CLK± Output Frequency

Characteristics,” on page 2.

Added specification for ±20 ppm lifetime stability

(±7 ppm temperature stability) XO.

Updated Table 3, “CLK± Output Levels and

Symmetry,” on page 3.

Updated LVDS differential peak-peak swing

specifications.

Updated Ta ble 4, “CLK± Output Phase Jitter,” on

page 4.

Updated Table 5, “CLK± Output Period Jitter,” on

page 4.

Revised period jitter specifications.

Updated Table 9, “Absolute Maximum Ratings1,” on

page 5 to reflect the soldering temperature time at

260 ºC is 20–40 sec per JEDEC J-STD-020C.

Updated 3. "Ordering Information" on page 7.

Changed ordering instructions to revision D.

Added 5. "Si534 Mark Specification" on page 9.

Revision 1.1 to Revision 1.2

Updated 2.5 V/3.3 V and 1.8 V CML ou tpu t leve l

specifications for Table 3 on page 3.

Added footno te s clar ifyin g m ax offset freque nc y tes t

conditions for Table 4 on page 4.

Removed the words "Differential Modes:

LVPECL/LVDS/CML" in the footnote referring to

AN256 in Table 4 on page 4.

Added CMOS phase jitter specs to Table 4 on

page 4.

Updated ESD HBM sensitivity rating in Table 9 on

page 5.

Updated Table 7 on page 5 to include the "Moisture

Sensitivity Level" and "Contact Pads" rows.

Revised Figure 2 on page 8 to reflect current

package outline di agram.

Updated Figure 3 and Table 12 on page 9 to reflect

specific marking information. Previously, Figure 3

was generic.

Revision 1.2 to Revision 1.3

Added Table 8, “Thermal Characteristics,” on

page 5.

Disclaimer

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using or intending to use the Silicon Laboratories products. Characterization data, available modules and peripherals, memory sizes and memory addresses refer to each specific

device, and "Typical" parameters provided can and do vary in different applications. Application examples described herein are for illustrative purposes only. Silicon Laboratories

reserves the right to make changes without further notice and limitation to product information, specifications, and descriptions herein, and does not give warranties as to the accuracy

or completeness of the included information. Silicon Laboratories shall have no liability for the consequences of use of the information supplied herein. This document does not imply

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