MX7533TE/883B - Maxim Integrated Products, Inc.

SCOPE: CMOS, 10 -B IT MONOLITH IC, MULTIPLYING D/A CONVERTER

Device Type Generic Number

01 MX7533S(x)/883B

02 MX7533T(x)/883B

03 MX7533U(x)/883B

Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:

Outline Letter Mil-Std-1835 Case Outline Package Code

Q GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP J16

E CQCC1-N20 20 LCC L20

A bsolute Maximum Ratings:

VDD to GND ................................................................................................... -0.3V, + 17V

VRFB to GND ................................................................................................................ ±25V

VREF to GND ................................................................................................................ ±25V

Digital Input Voltage Range ............................................................................ -0.3V to VDD

VOUT1, VOUT2, to GND ...................................................................................... -0.3V to VDD

Lead Temperature (soldering, 10 seconds) .................................................................... +300°C

Storage Temperature ....................................................................................... -65°C to +150°C

Continuous Power Dissipation ..........................................................................….. TA=+70°C

16 pin CERDIP(derate 10mW/°C above +70°C) .....................................................… 800mW

20 pin LCC(derate 9.1mW/°C above +70°C) ........................................................….. 727mW

Junct ion Temperature TJ .....................................................................................….. +150°C

Thermal Resista nce, J unction to Case, ΘJC

16 pin CERDIP................................................................................................….. 50°C/W

20 pin LCC .....................................................................................................…... 20°C/W

Thermal Resistance, Junction to Ambient, ΘJA:

16 pin CERDIP..............................................................................................….. 100°C/W

20 pin LCC ...................................................................................................…... 110°C/W

Recommended Operating Co ndit ions

Ambient Operating Range (TA) .........................................................….... -55°C to +125°C

Supply Voltage Range ..........................................................................................……. +15V

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to absolute maximum

rating conditions for extended periods may affect device reliability.

---------------------------- Electrical Characteristics of MX7533/883B 19-1026 Rev. B

Page 2 of 6

TABLE 1. ELECTRICAL TESTS:

TEST Symbol

CONDITIONS

-55 °C <=TA<= +125°C 1/

Unless otherwise specified Group A

Subgroup Device

type Limits

Min Limits

Max Units

ACCURACY

Resolution NOTE 2 RES All 10 Bits

Relative Accuracy RA 1,2,3 01

02

03

±2.0

±1.0

±0.5

LSB

Gain Error NOTE 3 AE 1

2,3 All ±14

±15 LSB

Gain Tempco NOTE 2 TCAE All -10 10 ppm/°C

Power Supply Rejection

(∆Gain/∆VDD)PSRR Digital inputs at VIH, VDD=14V to

17V 1

2,3 All ±0.005

±0.008 %/%

Output Leakage Current IOUT1 Digital inputs at VIL, VREF=+10V 1

2,3 All ±50

±200 nA

Output Leakage Current IOUT2 Digital inputs at VIH, VREF=+10V 1

2,3 All ±50

±200 nA

Output Current Settling

Time NOTE 2 To ±0.5LSB. OUT 1 load is 100Ω

| | 13pF, digital inputs =VIH to VIL

or VIL to VIH

4All 0.8 µs

Feedthrough Error

NOTE 2, NOTE 4 FTE VREF=20Vp-p at 100kHz sine

wave. Digital inputs at VIL.4All 15 mVp-p

Input Resistance RIN 1,2,3 All 520

kΩ

Digital Input High

Voltage VIH 1,2,3 All 2.4 V

Digital Input Low

Voltage VIL 1,2,3 All 0.8 V

Digital Input Leakage

Current IIN VIN=0V or VDD 1,2,3 All ±1.0 µA

Supply Current IDD All digital inputs VIL or VIH 1,2,3 All 2.0 mA

Digital Input Capacitance

NOTE 2 CIN 4All 5pF

Output Capacitance COUT1

COUT2

Digital inputs at VIH

Digital inputs at VIL

Digital inputs at VIH

Digital inputs at VIL

4All

100

35

100

pF

NOTE 1: VDD=+15V, VOUT1=VOUT2=0V; VREF=+10V, unless otherwise specified.

NOTE 2: Characteristics supplied for u se as a typical design limit, but not p r oduction tested.

NOTE 3: Measured using internal feedback resistor and includes effect of leakage current and gain TC.

NOTE 4: Feedt hrough error ca n be r educed b y connecting the meta l lid on the package to ground.

---------------------------- Electrical Characteristics of MX7533/883B 19-1026 Rev. B

Page 3 of 6

ORDERING INFORMATION:

Package Pkg. Code

01 16 pin CERDIP J16 MX7533SQ/883B

01 20 pin LCC L20 MX7533SE/883B

02 16 pin CERDIP J16 MX7533TQ/883B

02 20 pin LCC L20 MX7533TE/883B

03 16 pin CERDIP J16 MX7533UQ/883B

03 20 pin LCC L20 MX7533UE/883B

TERMINAL CONNECTIONS:

J16 L20

1 OUT1 NC

2 OUT2 OUT2

3 GND OUT1

4 D1(MSB) GND

5D2D1(MSB)

6D3 NC

7D4 D2

8D5 D3

9D6 D4

10 D7 D5

11 D8 NC

12 D9 D6

13 D10(LSB) D7

14 VDD D8

15 VREF D9

16 RFB NC

17 D10(LSB)

18 VDD

19 VREF

20 RFB

---------------------------- Electrical Characteristics of MX7533/883B 19-1026 Rev. B

Page 4 of 6

QUALITY ASSURAN CE

Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-

Std-883.

Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:

1. Test Condition, A, B, C, or D.

2. TA = +125°C minimum.

3. Interim and final electrical test requirements shall be specified in Table 2.

Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,

C, and D inspection.

Group A inspection:

1. Tests as specified in Table 2.

2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.

Group C and D inspections:

a. End-point electrical parameters shall be specified in Table 1.

b. Steady-state life test, Method 1005 of Mil-Std-883:

1. Test condition A, B, C, D.

2. TA = +125°C, minimum.

3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.

TABLE 2. ELECTRICAL TEST REQUIREMENTS

Mil-Std-883 Test Requirements Subgroups

per Method 5005, Table 1

Interim Electric Parameters

Method 5004 1

Final Electrical Parameters

Method 5005 1*, 2, 3

Group A Test Requirements

Method 5005 1, 2, 3, 4**

Group C and D End-Point Electrical Parameters

Method 5005 1

* PDA applies to Subgroup 1 only.

** Subgroup 4 shall be tested at initial qualification and upon redesign. Sample size will

be 116 units.

---------------------------- Electrical Characteristics of MX7533/883B 19-1026 Rev. B

Page 5 of 6

MX7533

Part Number Table

ENGLISH • 简体中文 • 日本語 • 한국어

WHAT'S NEW PRODUCTS SOLUTIONS DESIGN APPNOTES SUPPORT BUY COMPANY MEMBERS

Notes:

1. See the MX7533 QuickView Data Sheet for further information on this product family or download the MX7533

full data sheet (PDF, 440kB).

2. Other options and links for purchasing parts are listed at: http://www.maxim-ic.com/sales.

3. Didn't Find What You Need? Ask our applications engineers. Expert assistance in finding parts, usually within

one business day.

4. Part number suffixes: T or T&R = tape and reel; + = RoHS/lead-free; # = RoHS/lead-exempt. More: See full

data sheet or Part Naming Conventions.

5. * Some packages have variations, listed on the drawing. "PkgCode/Variation" tells which variation the product

uses.

Part Number Free

Sample

Buy

Direct Package: TYPE PINS SIZE

DRAWING CODE/VAR *

Temp RoHS/Lead-Free?

Materials Analysis

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Dwg: 21-0049D (PDF)

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