FXOS8700CQR1 - NXP SEMICONDUCTORS

1. General description

FXOS8700CQ is a small, low-power, 3-axis, linear accelerometer and 3-axis,

magnetometer combined into a single package. The device features a selectable I2C or

point-to-point SPI serial interface with 14-bit accelerometer and 16-bit magnetometer ADC

resolution along with smart-embedded functions. FXOS8700CQ has dynamically

selectable acceleration full-scale ranges of ±2 g/±4 g/±8 g and a fixed magnetic

measurement range of ±1200 μT. Output data rates (ODR) from 1.563 Hz to 800 Hz are

selectable by the user for each sensor. Interleaved magnetic and acceleration data is

available at ODR rates of up to 400 Hz. FXOS8700CQ is available in a plastic QFN

package and it is guaranteed to operate over the extended temperature range of –40 °C

to +85 °C.

2. Features and benefits

Complete 6-axis, e-compass hardware solution

1.95 V to 3.6 V VDD supply voltage, 1.62 V to 3.6 V VDDIO voltage

±2 g/±4 g/±8 g dynamically selectable acceleration full-scale range

±1200 µT magnetic sensor full-scale range

Output data rates (ODR) from 1.563 Hz to 800 Hz for each sensor, and up to 400 Hz

when operated in hybrid mode with both sensors active

Low noise: < 126 μg/√Hz acceleration noise density at 200-Hz bandwidth,

< 100 nT/√Hz magnetic noise density at 100-Hz bandwidth

14-bit ADC resolution for acceleration measurements

16-bit ADC resolution for magnetic measurements

Low power: 240 μA current consumption at 100 Hz, and 80 μA at 25 Hz with both

sensors active

Embedded programmable acceleration event functions

Freefall and motion detection

Transient detection

Vector-magnitude change detection

Pulse and tap detection (single and double)

Orientation detection (portrait/landscape)

Embedded programmable magnetic event functions

Threshold detection

Vector-magnitude change detection

Autonomous magnetic min/max detection

Autonomous hard-iron calibration

FXOS8700CQ

6-axis sensor with integrated linear accelerometer and

magnetometer

Rev. 8 — 25 April 2017 Data sheet: Technical data

Data sheet: Technical data Rev. 8.0 — 25 April 2017 2 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Programmable automatic ODR change using auto-wake and return-to-sleep functions

to save power. This function works with both magnetic and acceleration event interrupt

sources.

32-sample FIFO for acceleration data only

Integrated accelerometer self-test function

3. Applications

Security: motion detection, door opening, smart home applications, robotics, and

unmanned aerial vehicles (UAVs) with electronic compass (e-compass) function.

Medical applications: patient monitoring, fall detection, and rehabilitation

E-compass in mobile devices, tablets, and personal navigation devices

User interface (menu scrolling by orientation change, tap detection for button

replacement)

Orientation detection (portrait/landscape: up/down, left/right, back/front orientation

identification)

Augmented reality (AR), gaming, and real-time activity analysis (pedometry, freefall,

and drop detection for hard disk drives and other devices)

Power management for mobile devices using inertial and magnetic event detection

Wearable devices: motion detection, activity monitoring, sports monitoring, context

awareness, and shock and vibration monitoring (mechatronic compensation, shipping,

and warranty usage logging)

4. Ordering information

Table 1. Ordering information

Part number Temperature range Package description Shipping

FXOS8700CQR1 –40 °C to +85 °C QFN Tape and reel

Data sheet: Technical data Rev. 8.0 — 25 April 2017 3 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

5. Block diagram

Fig 1. Block diagram

Data sheet: Technical data Rev. 8.0 — 25 April 2017 4 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

6. Pinning information

6.1 Pinning

Fig 2. Pin configuration

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  5 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
6.2 Pin description
[1] Refer to Section 10.2.1 regarding point-to-point SPI operation.
[2] Refer to Section 10.2.3 regarding SPI bus requirements during 1 ms period following a reset
[3] Refer to Table 11 for I2C address options selectable using the SA0 and SA1 pins.
7. Electrical connections
Device power is supplied through the VDD pin. Power supply decoupling capacitors 
(100 nF ceramic plus 4.7 μF bulk) should be placed as close as possible to pin 14 of the 
device. The digital interface supply voltage (VDDIO) should be decoupled with a 100 nF 
ceramic capacitor placed as close as possible to pin 1 of the device. 
The digital control signals SCL, SDA, SA0, SA1, and RST are not tolerant of voltages 
exceeding VDDIO + 0.3 V. If VDDIO is removed, these pins will clamp any logic signals 
through their internal ESD protection diodes. The function and timing of the two interrupt 
pins (INT1 and INT2) are user programmable through the I2C/SPI interface. The SDA and 
SCL I2C connections are open drain and therefore require a pullup resistor as shown in 
the application diagram in Figure 3. The INT1 and INT2 pins may also be configured for 
open-drain operation. If they are configured for open drain, external pullup resistors are 
required.
Table 2. Pin description
Symbol Pin Description
VDDIO 1 Interface supply voltage
BYP 2 Internal regulator output bypass capacitor connection
Reserved 3 Test reserved, connect to GND
SCL/SCLK 4 I2C serial clock/SPI clock[1]
GND 5 Ground
SDA/MOSI 6 I2C serial data/SPI master out, slave in[1][2]
SA0/MISO 7 I2C address selection bit 0/SPI master in, slave out[1][2][3]
Crst 8 Magnetic reset capacitor
INT2 9 Interrupt 2
SA1/CS_B 10 I2C address selection bit 1/SPI chip select (active low)[2][3]
INT1 11 Interrupt 1
GND 12 Ground
Reserved 13 Test reserved, connect to GND
VDD 14 Sensor supply voltage
N/C 15 Not connected internally
RST[2] 16 Reset input, active high. Connect to GND if unused

Data sheet: Technical data Rev. 8.0 — 25 April 2017 6 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

(1) Pullup resistors on SCL/SCLK and SDA/MOSI are not required if the device is operated in SPI Interface mode.

(2) Pullup resistors on INT1 and INT2 are not required if these pins are configured for push-pull (default) operation.

Fig 3. Electrical connection

Data sheet: Technical data Rev. 8.0 — 25 April 2017 7 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

7.1 Orientation

8. Terminology

8.1 Sensitivity

Sensitivity is represented in mg/LSB for the accelerometer and μT/LSB for the

magnetometer. The magnetometer sensitivity is fixed at 0.1 μT/LSB. The accelerometer

sensitivity changes with the full-scale range selected by the user. Accelerometer

sensitivity is 0.244 mg/LSB in 2 g mode, 0.488 mg/LSB in 4 g mode, and 0.976 mg/LSB in

8g mode.

8.2 Zero-g and zero-flux offset

For the accelerometer, zero-g offset describes the deviation of the output values from the

ideal values when the sensor is stationary. With an accelerometer stationary on a level

horizontal surface, the ideal output is 0 g for the X and Y axes, and 1 g for the Z-axis. The

Fig 4. Product orientation and axis orientation

Top view

Pin 1

Side view

TOP

BOTTOM

+Ax, +Mx

+Ay, +My

+Az, +Mz

Top view

Xout @ 0 g

Magnetic Field

Earth Gravity

Maximum My

Minimum MxMaximum Mx

Minimum My

Maximum Mz

Minimum Mz

Yout @ –1 g

Zout @ 0 g

Xout @ 1 g

Yout @ 0 g

Zout @ 0 g

Xout @ –1 g

Yout @ 0 g

Zout @ 0 g

Xout @ 0 g

Yout @ 1 g

Zout @ 0 g

Xout @ 0 g

Yout @ 0 g

Zout @ 1 g

Xout @ 0 g

Yout @ 0 g

Zout @ –1 g

Data sheet: Technical data Rev. 8.0 — 25 April 2017 8 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

deviation of each output from the ideal value is called zero-g offset. Offset is to some

extent a result of stress on the sensor, and therefore, can slightly change after mounting

the sensor onto a printed circuit board or exposing it to extensive mechanical stress. For

the magnetometer, zero-flux offset describes the deviation of the output signals from zero

when the device is shielded from external magnetic field sources (that is, inside a

zero-Gauss chamber).

8.3 Self-test

Self-test can be used to verify the transducer and signal chain functionality without the

need to apply an acceleration stimulus. When the accelerometer self-test is activated, an

electrostatic actuation force is applied to the sensor, simulating a small acceleration. In

this case the sensor X, Y, and Z outputs will exhibit a change in DC levels related to the

selected full-scale range (sensitivity). When self-test is activated, the device output level is

given by the algebraic sum of the signals produced by the acceleration acting on the

sensor and by the electrostatic self-test force.

9. Device characteristics

9.1 Accelerometer mechanical characteristics

Table 3. Accelerometer mechanical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise

noted.

Symbol Parameter Conditions Min Typ Max Unit

FSACC Measurement range ±2 g mode [1] -±2-g

±4 g mode - ±4 -

±8 g mode - ±8 -

SENACC Sensitivity ±2 g mode - 4096 - LSB/g

-0.244-mg/LSB

±4 g mode - 2048 - LSB/g

-0.488-mg/LSB

±8 g mode - 1024 - LSB/g

-0.976-mg/LSB

TCSACC Sensitivity change with

temperature

±2 g, ±4 g, ±8 g modes [1] - ±0.01 - %/°C

SEN-TOLACC Sensitivity accuracy - ±2.5 - %SENACC

OFFACC Zero-g level offset accuracy ±2 g, ±4 g, ±8 g modes [2] -±20-mg

OFFACC-PBM Zero-g level offset accuracy

post-board mount

±2 g, ±4 g, ±8 g modes [4] -±30-mg

TCOACC Zero-g level change versus

temperature

–40 °C to 85 °C [1] -±0.2-mg/°C

NLACC Nonlinearity (deviation from

straight line)

Over ±1 g range normal

mode

[5][6] -±0.5-%FS

ACC

STOCACC Self-test output change

±2 g mode, X-axis

±2 g mode, Y-axis

±2 g mode, Z-axis

[7]

+192

+270

+1275

LSB

Data sheet: Technical data Rev. 8.0 — 25 April 2017 9 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] Dynamic range is limited to ±4 g when in the low-noise mode.

[2] Before board mount.

[3] Post-board mount offset specifications are based on a 2-layer PCB design.

[4] Evaluation only.

[5] After post-board mount corrections for sensitivity, cross axis and offset. Refer to NXP application note

AN4399 for more information.

[6] Self-test is only exercised along one direction for each sensitive axis.

[7] Measured using earth's gravitational field (1 g) with the device oriented horizontally (+Z axis up) and

stationary.

9.2 Magnetometer magnetic characteristics

[1] After m-cell has been factory trimmed.

[2] Hysteresis is measured by sweeping the applied magnetic field from –1000 μT to 1000 μT and then back to

–1000 μT. The difference in the two readings at –1000 μT divided by the swept field range is the hysteresis

figure, expressed in % of the full-scale range (FSMAG).

[3] Tested over a ±1000 μT measurement range.

NDACC Output noise density, normal

mode

ODR = 400 Hz, normal

mode

[4][7] - 126 - µg/√Hz

ODR = 400 Hz, low-noise

mode

[1] - 99 - µg/√Hz

TOP Operating temperature range –40 - +85 °C

Table 3. Accelerometer mechanical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise

noted. - ¶continued

Symbol Parameter Conditions Min Typ Max Unit

Table 4. Magnetometer magnetic characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise noted.

Symbol Parameter Conditions Min Typ Max Unit

FSMAG Measurement range - ±1200 - - μT

SENMAG Sensitivity - - 0.1 - μT/LSB

TCSMAG Sensitivity change versus temperature - - ±0.1 - %/°C

OFFMAG Zero-flux offset accuracy - [1] -±10-μT

TCOMAG Zero-flux offset change with temperature - - ±0.8 - μT/°C

HYSTMAG Hysteresis - [2][3] -±0.5-%FS

MAG

NLMAG Nonlinearity

Deviation from best-fit straight line -

[3]

-±1-%FS

MAG

- Temperature sensor sensitivity - - 0.96 - °C/LSB

NoiseMAG Magnetometer output noise ODR = 800 Hz, OSR = 2 - 1.5 - μT-rms

ODR = 400 Hz, OSR = 4 - 1.2 -

ODR = 200 Hz, OSR = 8 - 0.85 -

ODR = 100 Hz, OSR = 16 - 0.6 -

ODR = 50 Hz, OSR = 32 - 0.5 -

ODR = 12.5 Hz, OSR = 128 - 0.35 -

ODR = 6.25 Hz, OSR = 256 - 0.3 -

ODR = 1.56 Hz, OSR = 1024 - 0.3 -

TOP Operating temperature range - –40 - +85 °C

Data sheet: Technical data Rev. 8.0 — 25 April 2017 10 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

9.3 Hybrid characteristics

9.4 Electrical characteristics

Table 5. Hybrid characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise noted.

Symbol Rating Value Unit Symbol Rating

ODRmax Maximum output data rate in hybrid mode - 400 - Hz

TOP Operating temperature range –40 - +85 °C

BW Output data bandwidth - ODR/2 - Hz

Table 6. Electrical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise noted.

Symbol Parameter Conditions Min Typ Max Unit

VDD Supply voltage - 1.95 2.5 3.6 V

VDDIO Interface supply

voltage

- 1.62 1.8 3.6 V

IDDACC-LPM Supply current Low-power acceleration mode µA

ODR = 12.5 Hz - 8 -

ODR = 100 Hz - 35 -

ODR = 400 Hz - 130 -

IDDACC-NM Supply current Normal acceleration mode µA

ODR = 50 Hz - 35 -

ODR = 200 Hz - 130 -

ODR = 800 Hz - 240 -

IDDACC+MAG Supply current Hybrid mode μA

ODR = 200 Hz

Accelerometer OSR = 4

Magnetometer OSR = 2

-440-

ODR = 100 Hz

Accelerometer OSR = 4

Magnetometer OSR = 2

-240-

ODR = 25 Hz

Accelerometer OSR = 4

Magnetometer OSR = 2

-80-

IDDMAG Supply current Magnetic mode μA

ODR = 400 Hz, OSR = 2 - 575 -

ODR = 12.5 Hz, OSR = 2 - 40 -

IDDBOOT Supply current during

boot sequence

0.9 ms max duration using

recommended regulator

bypass capacitor, VDD = 2.5 V

---3

CBYP

, CRST Value of capacitors on

BYP and magnetic

reset pins

–40 °C to 85 °C 75 100 470 nF

IDDSTBY Supply current Standby mode @ 25 °C - 2 - µA

IDDSTBY Supply current Over-temperature range,

standby mode

--10µA

Data sheet: Technical data Rev. 8.0 — 25 April 2017 11 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] Time from VDDIO on and VDD > VDD min until I2C/SPI interface ready for operation.

[2] Time to obtain valid data from power-down mode to active mode.

[3] Time to obtain valid data from standby mode to active mode.

VIHRST Digital high-level input

voltage, RST pin

- 1.04--V

VILRST Digital low-level input

voltage, RST pin

- --0.68V

VIH Digital high-level input

voltage, SCL, SDA,

SA0, and SA1 pins

- 0.75*VDDIO - - V

VIL Digital low-level input

voltage, SCL, SDA,

SA0, and SA1 pins

- --0.3*VDDIOV

VOH High-level output

voltage, INT and INT2

pins

IO = 500 µA 0.9*VDDIO - - V

VOL Low-level output

voltage, INT1 and

INT2 pins

IO = 500 µA - - 0.1*VDDIO V

VOLSDA Low-level output

voltage, SDA pin

IO = 500 µA - - 0.1*VDDIO V

SCL and SDA pin

leakage

25°C -1.0-nA

–40 °C to 85 °C - 4.0 -

SCL and SDA pin

capacitance

--3-pf

VDD rise time - 0.001 - 1000 ms

TBOOT Boot time - [1] --1000µs

TPOR→ACT Turn-on time 1 - [2] - 2/ODR + 2 - ms

TSTBY→ACT Turn-on time 2 - [3] - 2/ODR + 1 - ms

TOP Operating temperature

range

- –40 - +85 °C

Table 6. Electrical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise noted. - ¶continued -

Symbol Parameter Conditions Min Typ Max Unit

Table 7. IDD (µA) table versus operating modes (VDD + VDDIO), VDD = VDDIO = 2.4 V[1]

Legend: NM = Accelerometer OSR Normal Mode (CTRL_REG2[mods] = 0b00);

LP = Accelerometer OSR Low Power (CTRL_REG2[mods] = 0b11);

OS0 = Magnetometer OSR set to 0 (M_CTRL_REG1[m_os] = 0b000);

OS7 = Magnetometer OSR set to 7 (M_CTRL_REG1[m_os] = 0b111).

Mode Acc only Mag only Hybrid

ODR NM LP OS0 OS7 NM/OS0 LP/OS0 NM/OS7

800 239 239 1072 1072

400 239 121 552 1002 648 647 648

200 121 62 289 966 412 339 607

100 68 33 156 947 220 183 512

50 33 18 90 939 123 105 465

25 74 66 442

12.5 33 7 37 932

Data sheet: Technical data Rev. 8.0 — 25 April 2017 12 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] Values are based on limited number of samples and are for reference only. Output data rates do not exist

for the shaded cells.

9.5 Absolute maximum ratings

Stresses above those listed as “absolute maximum ratings” may cause permanent

damage to the device. This is a stress rating only and functional operation of the device

under these conditions is not implied. Exposure to maximum rating conditions for

extended periods may affect device reliability.

NXP recommends that customers using magnetic sensor components adopt industry

standard safe handling practices and procedures for magnetic products. To avoid potential

damage to the magnetic transducer contained within this product, it is recommended to

only handle the device with non-magnetic tools and fixtures.

[1] Sensor characteristics can be restored on a “permed” device by means of briefly applying an external

uniform magnetic field on the order of 100 Gauss or greater, along the X-axis.

6.25 33 7 37 931 51 35 437

3.125 51 35 437

1.5625 33 7 36 931

0.78125 51 35 436

stby 2

Table 7. IDD (µA) table versus operating modes (VDD + VDDIO), VDD = VDDIO = 2.4 V[1] - ¶continued

Legend: NM = Accelerometer OSR Normal Mode (CTRL_REG2[mods] = 0b00);

LP = Accelerometer OSR Low Power (CTRL_REG2[mods] = 0b11);

OS0 = Magnetometer OSR set to 0 (M_CTRL_REG1[m_os] = 0b000);

OS7 = Magnetometer OSR set to 7 (M_CTRL_REG1[m_os] = 0b111).

Mode Acc only Mag only Hybrid

ODR NM LP OS0 OS7 NM/OS0 LP/OS0 NM/OS7

Table 8. Maximum ratings

Symbol Rating Value Unit

gmax Maximum acceleration (all axes, 100 μs) 5000 g

VDDmax Supply voltage, interface supply voltage –0.3 to +3.6 V

VDDIOmax Supply voltage, IO voltage –0.3 to +3.6 V

VINmax Input voltage on any control pin (SA0/MISO, SA1/CS_B, SCL/SCLK,

SDA/MOSI, RST)

–0.3 to VDDIO + 0.3 V

Ddrop Drop-test height 1.8 m

- Maximum exposed magnetic field without perming [1] 3000 μT

- Maximum exposed field without permanent damage 0.1 T

TSTG Storage temperature range –40 to +125 °C

Table 9. ESD and latchup protection characteristics

Symbol Rating Value Unit

HBM Human body model ±2000 V

MM Machine model ±200 V

Data sheet: Technical data Rev. 8.0 — 25 April 2017 13 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

10. Digital interfaces

10.1 I2C interface characteristics

[1] All values referred to VIH (min) and VIL (max) levels

[2] This device does not stretch the low period (tLOW) of the SCL signal.

[3] tVD;DAT = time for data signal from SCL low to SDA output.

[4] tVD;ACK = time for acknowledgement signal from SCL low to SDA output (high or low, depending on which

one is worse)

[5] Cb = total capacitance of one bus line in pF.

CDM Charge device model ±500 V

ILU Latchup current at T = 85 °C ±100 mA

Table 9. ESD and latchup protection characteristics - ¶continued

Symbol Rating Value Unit

This device is sensitive to mechanical shock. Improper handling can cause permanent damage to the part or

cause the part to otherwise fail.

This device is sensitive to ESD, improper handling can cause permanent damage to the part.

Table 10. I2C slave timing values[1]

Symbol Parameter I2C fast mode Unit

Min Max

fSCL SCL clock frequency 0 400 kHz

tBUF Bus free time between stop and start condition 1.3 - μs

tHD;STA (Repeated) start hold time 0.6 - μs

tSU;STA (Repeated) start setup time 0.6 - μs

tSU;STO STOP condition setup time 0.6 - μs

tHD;DAT SDA data hold time [2] 0.05 0.9 μs

tVD;DAT SDA valid time [2][3] -0.9μs

tVD;ACK SDA valid acknowledge time [2][4] -0.9μs

tSU;DAT SDA setup time 100 - ns

tLOW SCL clock low time 1.3 - μs

tHIGH SCL clock high time 0.6 - μs

trSDA and SCL rise time [5] 20 + 0.1 Cb300 ns

tfSDA and SCL fall time [5] 20 + 0.1 Cb300 ns

tSP Pulse width of spikes on SDA and SCL that must be

suppressed by internal input filter

050ns

Data sheet: Technical data Rev. 8.0 — 25 April 2017 14 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

10.1.1 General I2C operation

There are two signals associated with the I2C bus: the serial clock line (SCL) and the

serial data line (SDA). The latter is a bidirectional line used for sending and receiving the

data to/from the interface. External pullup resistors connected to VDDIO are required for

SDA and SCL. When the bus is free both the lines are high. The I2C interface is compliant

with fast mode (400 kHz), and normal mode (100 kHz) I2C standards. Operation at

frequencies higher than 400 kHz is possible, but depends on several factors including the

pullup resistor values, and total bus capacitance (trace + device capacitance).

See Table 11 for more information.

A transaction on the bus is started through a start condition (ST) signal, which is defined

as a high-to-low transition on the data line while the SCL line is held high. After the ST

signal has been transmitted by the master, the bus is considered busy. The next byte of

data transmitted contains the slave address in the first seven bits, and the eighth bit, the

read/write bit, indicates whether the master is receiving data from the slave or transmitting

data to the slave. When an address is sent, each device in the system compares the first

seven bits after the ST condition with its own address. If they match, the device considers

itself addressed by the master. The ninth clock pulse, following the slave address byte

(and each subsequent byte) is the acknowledge (ACK). The transmitter must release the

SDA line during the ACK period. The receiver must then pull the data line low so that it

remains stable low during the high period of the acknowledge clock period.

The number of bytes per transfer is unlimited. If a receiver can't receive another complete

byte of data until it has performed some other function, it can hold the clock line, SCL low

to force the transmitter into a wait state. Data transfer only continues when the receiver is

ready for another byte and releases the data line. This delay action is called clock

stretching. Not all receiver devices support clock stretching. Not all master devices

recognize clock stretching. This part does not use clock stretching.

A low to high transition on the SDA line while the SCL line is high is defined as a stop

condition (SP) signal. A write or burst write is always terminated by the master issuing the

SP signal. A master should properly terminate a read by not acknowledging a byte at the

appropriate time in the protocol. A master may also issue a repeated start signal (SR)

during a transfer

The slave addresses that may be assigned to the FXOS8700CQ part are 0x1C, 0x1D,

0x1E, or 0x1F. The selection is made through the logic level of the SA1 and SA0 inputs.

Fig 5. I2C slave timing diagram

handbook, full pagewidth

MSC610

SSr

tSU;STO

tSU;STA

tHD;STA tHIGH

tLOW tSU;DAT

tHD;DAT

SDA

SCL

tBUF

trtSP

tHD;STA

Data sheet: Technical data Rev. 8.0 — 25 April 2017 15 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

10.1.2 I2C read/write operations

Single-byte read

The master (or MCU) transmits a start condition (ST) to the FXOS8700CQ, followed by

the slave address, with the R/W bit set to “0” for a write, and the FXOS8700CQ sends an

acknowledgement. Then the master (or MCU) transmits the address of the register to

read and the FXOS8700CQ sends an acknowledgement. The master (or MCU) transmits

a repeated start condition (SR), followed by the slave address with the R/W bit set to “1”

for a read from the previously selected register. The FXOS8700CQ then acknowledges

and transmits the data from the requested register. The master does not acknowledge

(NAK) the transmitted data, but transmits a stop condition to end the data transfer.

Multiple- byte read

When performing a multi-byte or “burst” read, the FXOS8700CQ automatically increments

the register address read pointer after a read command is received. Therefore, after

following the steps of a single-byte read, multiple bytes of data can be read from

sequential registers after each FXOS8700CQ acknowledgment (AK) is received until a no

acknowledge (NAK) occurs from the master followed by a stop condition (SP) signaling an

end of transmission.

Single-byte write

To start a write command, the master transmits a start condition (ST) to the

FXOS8700CQ, followed by the slave address with the R/W bit set to “0” for a write, and

the FXOS8700CQ sends an acknowledgement. Then the master (or MCU) transmits the

address of the register to write to, and the FXOS8700CQ sends an acknowledgement.

Then the master (or MCU) transmits the 8-bit data to write to the designated register and

the FXOS8700CQ sends an acknowledgement that it has received the data. Since this

transmission is complete, the master transmits a stop condition (SP) to end the data

transfer. The data sent to the FXOS8700CQ is now stored in the appropriate register.

Multiple-byte write

The FXOS8700CQ automatically increments the register address write pointer after a

write command is received. Therefore, after following the steps of a single-byte write,

multiple bytes of data can be written to sequential registers after each FXOS8700CQ

acknowledgment (ACK) is received.

Table 11. I2C slave address

SA1 SA0 Slave address

0 0 0x1E

0 1 0x1D

1 0 0x1C

1 1 0x1F

Data sheet: Technical data Rev. 8.0 — 25 April 2017 16 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Fig 6. I2C timing diagram

10.2 SPI interface characteristics

SPI interface is a classical master/slave serial port. The FXOS8700CQ is always

considered as the slave and thus is never initiating the communication.

Table 12 and Figure 7 describe the timing requirements for the SPI system.

< Single-byte read >

Master ST Device address[6:0] WRegister address[7:0] SR Device address[6:0] R NAK SP

Slave AK AK AK Data[7:0]

< Multiple-byte read >

Master ST Device address[6:0] WRegister address[7:0] SR Device address[6:0] R AK

Slave AK AK AK Data[7:0]

Master AK AK NAK SP

Slave Data[7:0] Data[7:0] Data[7:0]

< Multiple-byte write >

Master ST Device address[6:0] WRegister address[7:0] Data[7:0] Data[7:0] SP

Slave AK AK AK AK

< Single-byte write >

Master ST Device address[6:0] WRegister address[7:0] Data[7:0] SP

Slave AK AK AK

Legend

ST: Start condition SP: Stop condition NAK: No acknowledge W: Write = 0

SR: Repeated start condition AK: Acknowledge R: Read = 1

Table 12. SPI timing

Function Symbol Min Max Unit

Operating frequency Of-1 MHz

SCLK period tSCLK 1000 - ns

SCLK high time tCLKH 500 - ns

SCLK low time tCLKL 500 - ns

CS_B lead time tSCS 65 - ns

CS_B lag time tHCS 65 - ns

Data sheet: Technical data Rev. 8.0 — 25 April 2017 17 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

10.2.1 General SPI operation

NOTE

FXOS8700CQ only supports a point-to-point SPI protocol, with only

one master (MCU) and one slave device (FXOS8700CQ) present on

the bus. FXOS8700CQ does not tri-state the MISO pin when the

CS_B pin is deasserted (logic high), which can lead to a bus conflict if

multiple slave devices are present on the bus.

Do not connect more than one master and one slave device on the SPI

bus.

The CS_B pin is driven low at the start of a SPI transaction, held low for the duration of the

transaction, and driven high after the transaction is complete. During a transaction the

master toggles the SPI clock (SCLK) and transmits data on the MOSI pin.

A write operation is initiated by transmitting a 1 for the R/W bit. Then the 8-bit register

address, ADDR[7:0] is encoded in the first and second serialized bytes. Data to be written

starts in the third serialized byte. The order of the bits is as follows:

Byte 0: R/W,ADDR[6],ADDR[5],ADDR[4],ADDR[3],ADDR[2],ADDR[1],ADDR[0],

Byte 1: ADDR[7],X,X,X,X,X,X,X,

Byte 2: DATA[7],DATA[6],DATA[5],DATA[4],DATA[3],DATA[2],DATA[1],DATA[0].

Multiple bytes of DATA may be transmitted. The X indicates a bit that is ignored by the

part. The register address is auto-incremented so that the next clock edges will latch the

data for the next register. When desired, the rising edge on CS_B stops the SPI

communication.

The FXOS8700CQ SPI configuration is as follows:

MOSI data setup time tSET 25 - ns

MOSI data hold time tHOLD 75 - ns

MISO data valid (after SCLK low edge) tDDLY - 500 ns

Width CS high tWCS 100 - ns

Fig 7. SPI timing diagram

Table 12. SPI timing

Function Symbol Min Max Unit

CS_B

SCLK

MOSI

MISO

Data sheet: Technical data Rev. 8.0 — 25 April 2017 18 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

•Polarity: rising/falling

•Phase: sample/setup

•Order: MSB first

Data is sampled during the rising edge of SCLK and set up during the falling edge of

SCLK.

10.2.2 SPI read/write operations

A read operation is initiated by transmitting a 0 for the R/W bit. Then the 8-bit register

address, ADDR[7:0] is encoded in the first and second serialized bytes. Subsequent bits

are ignored by the part. The read data is deserialized from the MISO pin.

Similarly a write operation is initiated by transmitting a 1 for the R/W bit. After the first and

second serialized bytes multiple-data bytes can be transmitted into consecutive registers,

starting from the indicated register address in ADDR[7:0].

An SPI transaction is started by asserting the CS_B pin (high-to-low transition), and

ended by deasserting the CS_B pin (low-to-high transition).

The registers embedded inside FXOS8700CQ are accessed through either an I2C, or a

SPI serial interface. To enable either interface the VDDIO line must be connected to the

interface supply voltage. If VDD is not present and VDDIO is present FXOS8700CQ is in

shutdown mode and communications on the interface are ignored. If VDDIO is held high,

VDD can be powered off and the communications pins will be in a high impedance state.

This will allow communications to continue on the bus with other devices.

10.2.3 I2C/SPI auto detection

(1) Data bytes must be transmitted to the slave (FXOS8700CQ) using the MOSI pin by the master when R/W = 1. Data bytes will

be transmitted by the slave (FXOS8700CQ) to the master using the MISO pin when R/W = 0. The first two bytes are always

transmitted by the master using the MOSI pin. That is, a transaction is always initiated by master.

Fig 8. SPI single-burst read/write transaction diagram

Table 13. Serial interface pin descriptions

Pin name Pin description

VDDIO Digital interface power

SA1/CS_B I2C second least significant bit of device address/SPI chip select

SCL/SCLK I2C/SPI serial clock

SDA/MOSI I2C serial data/SPI master serial data out slave serial data in

SA0/MISO I2C least significant bit of the device address/SPI master serial data in slave out

Table 14. I2C/SPI auto detection

SA0 Slave address

GND I2C

VDDIO I2C

Floating SPI

Data sheet: Technical data Rev. 8.0 — 25 April 2017 19 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

FXOS8700CQ employs an interface mode, auto-detection circuit that will select either I2C

or SPI interface mode based on the state of the SA0 pin during power up or when exiting

reset. Once set for I2C or SPI operation, the device will remain in I2C or SPI mode until the

device is reset or powered down and the auto-detection process is repeated. Please note

that when SPI interface mode is desired, care must be taken to ensure that no other slave

device drives the common SA0/MISO pin during the 1 ms period after a hard or soft reset

or powerup event.

10.2.4 Power supply sequencing and I2C/SPI mode auto-detection

FXOS8700CQ does not have any specific power supply sequencing requirements

between VDD and VDDIO voltage supplies to ensure normal operation. To ensure correct

operation of the I2C/SPI auto-detection function, VDDIO should be applied before or at the

same time as VDD. If this order cannot be maintained, the user should either toggle the

RST line or power cycle the VDD rail in order to force the auto-detect function to restart

and correctly identify the desired interface. FXOS8700CQ will indicate completion of the

reset sequence by toggling the INT1 pin from logic high to low to high over a 500 ns

period. If the INT1 pin was already low prior to the reset event, it will only go high.

11. Modes of operation

All register contents are preserved when transitioning from active-to-standby mode, but

some registers are reset when transitioning from standby-to-active. These registers are

noted in Table16. The sleep and wake modes are active modes. For more information on

how to use the sleep and wake modes and configuring the device to transition between

them, please refer to Section 12 or NXP application note AN4074.

Fig 9. FXOS8700CQ power mode transition diagram

Table 15. Mode of operation description

Mode I2C/SPI bus state VDD VDDIO Function description

OFF Powered down <1.8 V VDDIO can be > VDD The device is powered off. All analog and digital

blocks are shutdown. I2C bus inhibited.

Standby I2C/SPI communication

with FXOS8700CQ is

possible

ON VDDIO = High

VDD = High

Active bit is cleared

Only digital blocks are enabled.

Analog subsystem is disabled. Internal clocks

disabled.

Active

(wake/sleep)

I2C/SPI communication

with FXOS8700CQ is

possible

ON VDDIO = High

VDD = High

Active bit is set

All blocks are enabled (digital and analog).

Data sheet: Technical data Rev. 8.0 — 25 April 2017 20 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

12. Embedded functionality

FXOS8700CQ is a low-power, digital output, 6-axis sensor with both I2C and SPI

interfaces. Extensive embedded functionality is provided to detect inertial and magnetic

events at low power, with the ability to notify the host processor of an event using either of

the two programmable interrupt pins. The embedded functionality includes:

•8-bit or 14-bit accelerometer data which includes high-pass filtered data, and 8-bit or

16-bit magnetometer data

•Four different oversampling options for the accelerometer output data, and eight for

the magnetometer. The oversampling settings allow the end user to optimize the

resolution versus power trade-off in a given application.

•A low-noise accelerometer mode that functions independently of the oversampling

modes for even higher resolution

•Low-power, auto-wake/sleep function for conserving power in portable battery

powered applications

•Accelerometer pulse-detection circuit which can be used to detect directional single

and double taps

•Accelerometer directional motion- and freefall-event detection with programmable

threshold and debounce time

•Acceleration transient detection with programmable threshold and debounce time.

Transient detection can employ either a high-pass filter or use the difference between

reference and current sample values.

•Orientation detection with programmable hysteresis for smooth transitions between

portrait/landscape orientations

•Accelerometer vector-magnitude change event detection with programmable

reference, threshold, and debounce time values

•Magnetic threshold event detection with programmable reference, threshold, and

debounce time

•Magnetometer vector-magnitude change event detection with programmable

reference, threshold and debounce time values

•Magnetic min/max detection circuit which can also be used for autonomous

calibration of magnetic hard-iron offset

Many different configurations of the above functions are possible to suit the needs of the

end application. Separate application notes are available to further explain the different

configuration settings and potential use cases.

12.1 Factory calibration

FXOS8700CQ's integrated accelerometer and magnetometer sensors are factory

calibrated for sensitivity and offset on each axis. The trim values are stored in non-volatile

memory (NVM). On power-up, the trim parameters are read from NVM and applied to the

internal compensation circuitry. After mounting the device to the PCB, the user may

further adjust the accelerometer and magnetometer offsets through the OFF_X/Y/Z and

M_OFF_X/Y/Z registers, respectively. For more information on device calibration, refer to

NXP application note, AN4399.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 21 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

12.2 8-bit or 14-bit accelerometer data

The measured acceleration data is stored in the OUT_X_MSB, OUT_X_LSB,

OUT_Y_MSB, OUT_Y_LSB, OUT_Z_MSB, and OUT_Z_LSB registers as 2’s

complement 14-bit numbers. The most significant 8-bits of each axis are stored in the

OUT_X/Y/Z_MSB registers, so applications needing only 8-bit results simply read these

three registers and ignore the OUT_X/Y/Z_LSB registers. To do this, the f_read mode bit

in CTRL_REG1 must be set.

When the full-scale range is set to 2 g, the measurement range is –2 g to +1.999 g, and

each count corresponds to 0.244 mg at ±14-bits resolution. When the full-scale is set to

8g, the measurement range is –8 g to +7.996 g, and each count corresponds to

0.976 mg. The resolution is reduced by a factor of 64 if only the 8-bit results are used

(CTRL_REG1[f_read] = 1). For further information on the different data formats and

modes, please refer to NXP application note AN4076.

12.3 Accelerometer low-power modes versus high-resolution modes

FXOS8700CQ can be optimized for lower power or higher resolution of the accelerometer

output data. High resolution is achieved by setting the lnoise bit in register 0x2A. This

improves the resolution (by lowering the noise), but be aware that the full-scale range

setting is restricted to ±2 g or ±4 g when this bit is set. This will affect all internal

embedded functions (scaling of thresholds, etc.) and reduce noise. Another method for

improving the resolution of the data is through oversampling. One of the oversampling

schemes of the output data can be activated when CTRL_REG2[mods] = 0b10 which will

improve the resolution of the output data without affecting the internal embedded

functions or fixing the dynamic range.

There is a trade-off between low power and high resolution. Low power can be achieved

when the oversampling rate is reduced. When CTRL_REG2[mods] = 0b10, the lowest

power is achieved, at the expense of higher noise. In general, the lower the selected ODR

and OSR, the lower the power consumption. For more information on how to configure the

device in low-power or high-resolution modes and understand the benefits and trade-offs,

please refer to NXP application note AN4075.

12.4 Auto-wake/sleep mode

FXOS8700CQ can be configured to transition between sample rates (with their respective

current consumptions) based on the status of the embedded interrupt event generators in

the device. The advantage of using the auto-wake/sleep is that the system can

automatically transition to a higher sample rate (higher current consumption) when

needed but spends the majority of the time in the sleep mode (lower current) when the

device does not require higher sampling rates. Auto-wake refers to the device being

triggered by one of the interrupt event functions to transition to a higher sample rate. This

may also interrupt the processor to transition from a sleep mode to a higher power mode.

Sleep mode occurs when none of the enabled interrupt event functions has detected an

interrupt within the user-defined, time-out period. The device will then transition to the

specified lower sample rate. It may also alert the processor to go into a lower power mode

to save power during this period of inactivity. Refer to AN4074 for more detailed

information on configuring the auto-wake/sleep function.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 22 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

12.5 Hybrid mode

FXOS8700CQ uses a single common analog-to-digital converter (ADC) for both the

accelerometer and magnetometer. When operating in hybrid mode

(M_CTRL_REG1[m_hms] = 0b11), both the accelerometer and magnetometer sensors

are actively measured by the ADC at an ODR equal to one half of the setting made in

CTRL_REG1[dr] when operating in accelerometer-only mode (M_CTRL_REG1[m_hms] =

0b00 (default)) or magnetometer-only mode (M_CTRL_REG1[m_hms] = 0b01). While the

ODR is common to both sensors when operating in hybrid mode, the OSR settings for

each sensor are independent and may be set using the CTRL_REG2[mods] for the

accelerometer and M_CTRL_REG1[m_os] for the magnetometer, respectively.

12.6 Accelerometer freefall and motion event detection

FXOS8700CQ integrates a programmable threshold based acceleration detection

function capable of detecting either motion or freefall events depending upon the

configuration. For further details and examples on using the embedded freefall and motion

detection functions, refer to NXP application note AN4070.

12.6.1 Freefall detection

The detection of “Freefall” involves the monitoring of the X, Y, and Z axes for the condition

where the acceleration magnitude is below a user-specified threshold for a user-definable

amount of time. Typically, the usable threshold ranges are between ±100 mg and

±500 mg.

12.6.2 Motion detection

Motion detection is often used to alert the main processor that the device is currently in

use. When the acceleration exceeds a set threshold for a set amount of time, the motion

interrupt is asserted. A motion can be a fast moving shake or a slow moving tilt. This will

depend on the threshold and timing values configured for the event. The motion detection

function can analyze static acceleration changes or faster jolts. The timing value is set by

a configurable debounce counter. The debounce counter acts like a filter to indicate

whether the condition exists for longer than a set amount of time (that is, 100 ms or

longer). There is also directional data available in the source register to detect the

direction of the motion that generated the interrupt. This is useful for applications such as

directional shake or flick detection, and can also assist gesture detection algorithms by

indicating that a motion gesture has started.

12.7 Transient detection

FXOS8700CQ integrates an acceleration transient detection function that incorporates a

high-pass filter. Acceleration data goes through the high-pass filter, eliminating the DC tilt

offset and low frequency acceleration changes. The high-pass filter cutoff can be set by

the user to four different frequencies which are dependent on the selected output data

rate (ODR). A higher cutoff frequency ensures that DC and slowly changing acceleration

data will be filtered out, allowing only the higher frequencies to pass. The transient

detection feature can be used in the same manner as the motion detection by bypassing

the high-pass filter. There is an option in the configuration register to do this. This adds

more flexibility to cover the various customer use cases.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 23 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Many applications use the accelerometer’s static acceleration readings (that is, tilt) which

measure the change in acceleration due to gravity only. These functions benefit from

acceleration data being filtered with a low-pass filter where high-frequency data is

considered noise. However, there are many functions where the accelerometer must

analyze dynamic acceleration. Functions such as tap, flick, shake and step counting are

based on the analysis of the change in the dynamic acceleration. The transient detection

function can be routed to either interrupt pin through bit 5 in CTRL_REG5 register (0x2E).

Registers 0x1D – 0x20 are used for configuring the transient detection function. The

source register contains directional data to determine the direction of the transient

acceleration, either positive or negative. For further information of the embedded transient

detection function along with specific application examples and recommended

configuration settings, refer to NXP application note AN4461.

12.8 Pulse detection

FXOS8700CQ has embedded single/double and directional pulse detection. This function

employs several timers for programming the pulse width time and the latency between

pulses. The detection thresholds are independently programmable for each axis. The

acceleration data input to the pulse detection circuit can be put through both high and

low-pass filters, allowing for greater flexibility in discriminating between pulse and tap

events. The PULSE_SRC register provides information on the axis, direction (polarity),

and single/double event status for the detected pulse or tap. For more information on how

to configure the device for pulse detection, please refer to NXP application note AN4072.

12.9 Orientation detection

FXOS8700CQ has an embedded orientation detection algorithm with the ability to detect

all six orientations. The transition angles and hysteresis are programmable, allowing for a

smooth transition between portrait and landscape orientations.

The angle at which the device no longer detects the orientation change is referred to as

the “Z-lockout angle”. The device operates down to 29° from the flat position. All angles

are accurate to ±2°.

For further information on the orientation detection function refer to NXP application note,

AN4068.

12.10 Acceleration vector-magnitude detection

FXOS8700CQ incorporates an acceleration vector-magnitude change detection block that

can be configured to generate an interrupt when the acceleration magnitude exceeds a

preset threshold for a programmed debounce time. The function can be configured to

operate in absolute or relative modes, and can also act as a wake-to-sleep/sleep-to-wake

source. This function is useful for detecting acceleration transients when operated in

absolute mode, or for detecting changes in orientation when operated in relative mode,

refer to NXP application note AN4692.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 24 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

12.11 Magnetic vector-magnitude detection

FXOS8700CQ incorporates a magnetic vector-magnitude change detection block that can

be configured to generate an interrupt when the magnetic field magnitude exceeds a

preset threshold for a programmed debounce time. The function can be configured to

operate in absolute or relative modes, and can also act as a wake-to-sleep/sleep-to-wake

source. For more information, refer to NXP application note AN4458.

12.12 Magnetic threshold detection

FXOS8700CQ incorporates a magnetic threshold event detection block that can be

configured to generate an interrupt when the magnetic field on the enabled axes is above

or below a programmed threshold.

Two logic combinations are possible for the detection: all of the enabled axes below their

respective thresholds (AND condition), or any of the enabled axes above their respective

thresholds (OR condition). Even detection may be filtered using a dedicated debounce

counter to avoid spurious event detection. The thresholds for each axis are individually

programmable and the function can also act as a wake-to-sleep/sleep-to-wake source.

12.13 Magnetic min/max detection (autonomous calibration)

FXOS8700CQ incorporates a magnetic min/max detection circuit that can be used to

automatically track the minimum and maximum field values measured on each of the X, Y,

and Z axes. The stored minimum and maximum values may optionally be used to

determine the magnetic hard-iron compensation and load the offset registers with the

appropriate correction values. For more information, refer to NXP application note

AN4459.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 25 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

13. Example FXOS8700CQ driver code

13.1 Introduction

It is very straightforward to configure the FXOS8700CQ and start receiving data from the

three accelerometer and three magnetometer channels. Unfortunately, since every

hardware platform will be different, it is not possible to provide completely portable

software drivers. This section therefore provides real FXOS8700CQ driver code for a

Kinetis uC board running under the MQX operating system. The I2C functions

s_i2c_read_regs and s_i2c_write_regs are not provided here and should be replaced with

the corresponding low level I2C driver code on the development platform.

13.2 FXOS8700CQ addresses

This section lists the I2C address of the FXOS8700CQ. The I2C address depends on the

logic level of FXOS8700CQ’s SA0 and SA1 address selection pins, so the actual I2C

address may be 0x1C, 0x1D, 0x1E or 0x1F.

Please see Table 11, “I2C slave address,” on page 15 for the available I2C addresses and

SA1/SA0 settings.

Example 1.

// FXOS8700CQ I2C address

#define FXOS8700CQ_SLAVE_ADDR 0x1E // with pins SA0=0, SA1=0

Some of the key FXOS8700CQ internal register addresses are listed below.

Example 2.

// FXOS8700CQ internal register addresses

#define FXOS8700CQ_STATUS 0x00

#define FXOS8700CQ_WHOAMI 0x0D

#define FXOS8700CQ_XYZ_DATA_CFG 0x0E

#define FXOS8700CQ_CTRL_REG1 0x2A

#define FXOS8700CQ_M_CTRL_REG1 0x5B

#define FXOS8700CQ_M_CTRL_REG2 0x5C

#define FXOS8700CQ_WHOAMI_VAL 0xC7

The reference driver code shown in this example does a block read of the FXOS8700CQ

status byte and three 16-bit accelerometer channels plus three 16-bit magnetometer

channels for a total of 13 bytes in a single I2C read operation.

Example 3.

// number of bytes to be read from the FXOS8700CQ

#define FXOS8700CQ_READ_LEN 13 // status plus 6 channels =

13 bytes

13.3 Sensor data structure

The high and low bytes of the three accelerometer and three magnetometer channels are

placed into a structure of type SRAWDATA containing three signed short integers.

Example 4.

typedef struct

{

Data sheet: Technical data Rev. 8.0 — 25 April 2017 26 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

int16_t x;

int16_t y;

int16_t z;

} SRAWDATA;

13.4 FXOS8700CQ configuration function

This function configures the FXOS8700CQ for 200-Hz hybrid mode meaning that both

accelerometer and magnetometer data are provided at the 200-Hz rate. The code is

self-explanatory and can be easily customized for different settings.

Example 5.

// function configures FXOS8700CQ combination accelerometer and

magnetometer sensor static _mqx_ints_FXOS8700CQ_start(MQX_FILE_PTR

aFP)

{

uint8_t databyte;

// read and check the FXOS8700CQ WHOAMI register

if (s_i2c_read_regs(aFP, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_WHOAMI, &databyte,

(uint8_t) 1) != 1)

{

return (I2C_ERROR);

}

if (databyte != FXOS8700CQ_WHOAMI_VAL)

{

return (I2C_ERROR);

}

// write 0000 0000 = 0x00 to accelerometer control register 1 to

place FXOS8700CQ into

// standby

// [7-1] = 0000 000

// [0]: active=0

databyte = 0x00;

if (s_i2c_write_regs(aFP, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_CTRL_REG1, &databyte,

(uint8_t) 1) != 1)

{

return (I2C_ERROR);

}

// write 0001 1111 = 0x1F to magnetometer control register 1

// [7]: m_acal=0: auto calibration disabled

// [6]: m_rst=0: no one-shot magnetic reset

// [5]: m_ost=0: no one-shot magnetic measurement

// [4-2]: m_os=111=7: 8x oversampling (for 200Hz) to reduce

magnetometer noise

// [1-0]: m_hms=11=3: select hybrid mode with accel and

magnetometer active

databyte = 0x1F;

Data sheet: Technical data Rev. 8.0 — 25 April 2017 27 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

if (s_i2c_write_regs(aFP, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_M_CTRL_REG1,

&databyte, (uint8_t) 1) != 1)

{

return (I2C_ERROR);

}

// write 0010 0000 = 0x20 to magnetometer control register 2

// [7]: reserved

// [6]: reserved

// [5]: hyb_autoinc_mode=1 to map the magnetometer registers to

follow the

// accelerometer registers

// [4]: m_maxmin_dis=0 to retain default min/max latching even

though not used

// [3]: m_maxmin_dis_ths=0

// [2]: m_maxmin_rst=0

// [1-0]: m_rst_cnt=00 to enable magnetic reset each cycle

databyte = 0x20;

if (s_i2c_write_regs(aFP, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_M_CTRL_REG2,

&databyte, (uint8_t) 1) != 1)

{

return (I2C_ERROR);

}

// write 0000 0001= 0x01 to XYZ_DATA_CFG register

// [7]: reserved

// [6]: reserved

// [5]: reserved

// [4]: hpf_out=0

// [3]: reserved

// [2]: reserved

// [1-0]: fs=01 for accelerometer range of +/-4g range with

0.488mg/LSB

databyte = 0x01;

if (s_i2c_write_regs(aFP, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_XYZ_DATA_CFG,

&databyte, (uint8_t) 1) != 1)

{

return (I2C_ERROR);

}

// write 0000 1101 = 0x0D to accelerometer control register 1

// [7-6]: aslp_rate=00

// [5-3]: dr=001 for 200Hz data rate (when in hybrid mode)

// [2]: lnoise=1 for low noise mode

// [1]: f_read=0 for normal 16 bit reads

// [0]: active=1 to take the part out of standby and enable

sampling

databyte = 0x0D;

Data sheet: Technical data Rev. 8.0 — 25 April 2017 28 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

if (s_i2c_write_regs(aFP, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_CTRL_REG1, &databyte,

(uint8_t) 1) != 1)

{

return (I2C_ERROR);

}

// normal return

return (I2C_OK);

}

13.5 Data read function

This function performs a block read of the status, accelerometer and magnetometer

measurement registers and places the bytes read into the structures of type SRAWDATA

as signed short integers.

Note that this function assumes that the hyb_autoinc_mode bit has been set to enable the

reading of all accelerometer and magnetometer data in a single-burst, read operation.

Example 6.

// read status and the three channels of accelerometer and

magnetometer data from

// FXOS8700CQ (13 bytes)

int16_t ReadAccelMagnData(SRAWDATA *pAccelData, SRAWDATA

*pMagnData)

{

MQX_FILE_PTR fp; // I2C file pointer

uint8_t Buffer[FXOS8700CQ_READ_LEN]; // read buffer

// read FXOS8700CQ_READ_LEN=13 bytes (status byte and the six

channels of data)

if (s_i2c_read_regs(fp, FXOS8700CQ_SLAVE_ADDR,

FXOS8700CQ_STATUS, Buffer,

FXOS8700CQ_READ_LEN) == FXOS8700CQ_READ_LEN)

{

// copy the 14 bit accelerometer byte data into 16 bit words

pAccelData->x = (int16_t)(((Buffer[1] << 8) | Buffer[2]))>> 2;

pAccelData->y = (int16_t)(((Buffer[3] << 8) | Buffer[4]))>> 2;

pAccelData->z = (int16_t)(((Buffer[5] << 8) | Buffer[6]))>> 2;

// copy the magnetometer byte data into 16 bit words

pMagnData->x = (Buffer[7] << 8) | Buffer[8];

pMagnData->y = (Buffer[9] << 8) | Buffer[10];

pMagnData->z = (Buffer[11] << 8) | Buffer[12];

}

else

{

// return with error

return (I2C_ERROR);

}

// normal return

return (I2C_OK);

}

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  29 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
14. Register descriptions
Table 16. Register address map
Address Name Access Default
Hex
Value
Comment
0x00 STATUS [1][2][3] R 0x00 Real-time data-ready status or FIFO status 
(DR_STATUS or F_STATUS) 
0x01 OUT_X_MSB [1][2][3] R Data [7:0] are 8 MSBs of 
14-bit sample.
Root pointer to XYZ FIFO 
data.
0x02 OUT_X_LSB [1][2][3] R Data [7:2] are 6 LSBs of 14-bit real-time sample
0x03 OUT_Y_MSB [1][2][3] R Data [7:0] are 8 MSBs of 14-bit real-time sample
0x04 OUT_Y_LSB [1][2][3] R Data [7:2] are 6 LSBs of 14-bit real-time sample
0x05 OUT_Z_MSB [1][2][3] R Data [7:0] are 8 MSBs of 14-bit real-time sample
0x06 OUT_Z_LSB [1][2][3] R Data [7:2] are 6 LSBs of 14-bit real-time sample
0x07 to 0x08 Reserved R 0x00 Reserved, do not modify contents
0x09 F_SETUP [1][4] R/W 0x00 FIFO setup
0x0A TRIG_CFG R/W 0x00 FIFO event trigger configuration register
0x0B SYSMOD [1][2] R 0x00 Current system mode
0x0C INT_SOURCE [1][2] R 0x00 Interrupt status
0x0D WHO_AM_I [1] R0xC7Device ID
0x0E XYZ_DATA_CFG [1][5] R/W 0x00 Acceleration dynamic range and filter enable settings
0x0F HP_FILTER_CUTOFF [1][5] R/W 0x00 Pulse detection high-pass and low-pass filter enable 
bits. High-pass filter cutoff frequency selection
0x10 PL_STATUS [1][2] R 0x00 Landscape/portrait orientation status
0x11 PL_CFG [1][5] R/W 0x80 Landscape/portrait configuration
0x12 PL_COUNT [1][3][4] R/W 0x00 Landscape/portrait debounce counter
0x13 PL_BF_ZCOMP [1][4] R/W 0x84 Back/front trip angle threshold
0x14 PL_THS_REG [1][4] R/W 0x44 Portrait to landscape trip threshold angle and 
hysteresis settings
0x15 A_FFMT_CFG [1][5] R/W 0x00 Freefall/motion function configuration
0x16 A_FFMT_SRC [1][2] R 0x00 Freefall/motion event source register
0x17 A_FFMT_THS [1][3][4] R/W 0x00 Freefall/motion threshold register
0x18 A_FFMT_COUNT [1][3][4] R/W 0x00 Freefall/motion debounce counter
0x19 to 0x1C Reserved R/W - Reserved, do not modify contents
0x1D TRANSIENT_CFG [1][5] R/W 0x00 FIFO setup
0x1E TRANSIENT_SRC [1][2] R 0x00 Transient event status register
0x1F TRANSIENT_THS [1][3][4] R/W 0x00 Transient event threshold
0x20 TRANSIENT_COUNT [1][3][4] R/W 0x00 Transient debounce counter
0x21 PULSE_CFG [1][5] R/W 0x00 Pulse function configuration 
0x22 PULSE_SRC [1][2] R 0x00 Pulse function source register
0x23 PULSE_THSX [1][3][4] R/W 0x00 X-axis pulse threshold
0x24 PULSE_THSY [1][3][4] R/W 0x00 Y-axis pulse threshold
0x25 PULSE_THSZ [1][3][4] R/W 0x00 Z-axis pulse threshold

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  30 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
0x26 PULSE_TMLT [1][5] R/W 0x00 Time limit for pulse detection
0x27 PULSE_LTCY [1][5] R/W 0x00 Latency time for second pulse detection
0x28 PULSE_WIND [1][5] R/W 0x00 Window time for second pulse detection
0x29 ASLP_COUNT [1][5] R/W 0x00 In activity counter setting for auto-sleep
0x2A CTRL_REG1 [1][5] R/W 0x00 System ODR, accelerometer OSR, operating mode
0x2B CTRL_REG2 [1][5] R/W 0x00 Self-test, reset, accelerometer OSR and sleep mode 
settings
0x2C CTRL_REG3 [1][5] R/W 0x00 Sleep mode interrupt wake enable, interrupt polarity, 
push-pull/open-drain configuration
0x2D CTRL_REG4 [1][5] R/W 0x00 Interrupt enable register
0x2E CTRL_REG5 [1][5] R/W 0x00 Interrupt pin (INT1/INT2) map 
0x2F OFF_X [1][5] R/W 0x00 X-axis accelerometer offset adjust
0x30 OFF_Y [1][5] R/W 0x00 Y-axis accelerometer offset adjust
0x31 OFF_Z [1][5] R/W 0x00 Z-axis accelerometer offset adjust
0x32 M_DR_STATUS R 0x00 Magnetic data ready
0x33 M_OUT_X_MSB [1][3][6] R Data MSB of 16-bit magnetic data for X-axis
0x34 M_OUT_X_LSB [1][3][6] R Data LSB of 16-bit magnetic data for X-axis
0x35 M_OUT_Y_MSB [1][3][6] R Data MSB of 16-bit magnetic data for Y-axis
0x36 M_OUT_Y_LSB [1][3][6] R Data LSB of 16-bit magnetic data for Y-axis
0x37 M_OUT_Z_MSB [1][3][6] R Data MSB of 16-bit magnetic data for Z-axis
0x38 M_OUT_Z_LSB [1][3][6] R Data LSB of 16-bit magnetic data for Z-axis
0x39 CMP_X_MSB [1][5] R Data Bits [13:8] of integrated X-axis accerleration data
0x3A CMP_X_LSB [1][5] R Data Bits [7:0] of integrated X-axis accerleration data
0x3B CMP_Y_MSB [1][5] R Data Bits [13:8] of integrated Y-axis accerleration data
0x3C CMP_Y_LSB [1][5] R Data Bits [7:0] of integrated Y-axis accerleration data
0x3D CMP_Z_MSB [1][5] R Data Bits [13:8] of integrated Z-axis accerleration data
0x3E CMP_Z_LSB [1][5] R Data Bits [7:0] of integrated Z-axis accerleration data
0x3F M_OFF_X_MSB [4][7] R/W 0x00 MSB of magnetometer of X-axis offset
0x40 M_OFF_X_LSB [4][7] R/W 0x00 LSB of magnetometer of X-axis offset
0x41 M_OFF_Y_MSB [4][7] R/W 0x00 MSB of magnetometer of Y-axis offset
0x42 M_OFF_Y_LSB [4][7] R/W 0x00 LSB of magnetometer of Y-axis offset
0x43 M_OFF_Z_MSB [4][7] R/W 0x00 MSB of magnetometer of Z-axis offset
0x44 M_OFF_Z_LSB [4][7] R/W 0x00 LSB of magnetometer of Z-axis offset
0x45 MAX_X_MSB [1][7] R Data Magnetometer X-axis maximum value MSB
0x46 MAX_X_LSB [1][7] R Data Magnetometer X-axis maximum value LSB
0x47 MAX_Y_MSB [1][7] R Data Magnetometer Y-axis maximum value MSB
0x48 MAX_Y_LSB [1][7] R Data Magnetometer Y-axis maximum value LSB
0x49 MAX_Z_MSB [1][7] R Data Magnetometer Z-axis maximum value MSB
0x4A MAX_Z_LSB [1][7] R Data Magnetometer Z-axis maximum value LSB
0x4B MIN_X_MSB [1][7] R Data Magnetometer X-axis minimum value MSB
Table 16. Register address map - ¶continued
Address Name Access Default
Hex
Value
Comment

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  31 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
0x4C MIN_X_LSB [1][7] R Data Magnetometer X-axis minimum value LSB
0x4D MIN_Y_MSB [1][7] R Data Magnetometer Y-axis minimum value MSB
0x4E MIN_Y_LSB [1][7] R Data Magnetometer Y-axis minimum value LSB
0x4F MIN_Z_MSB [1][7] R Data Magnetometer Z-axis minimum value MSB
0x50 MIN_Z_LSB [1][7] R Data Magnetometer Z-axis minimum value LSB
0x51 TEMP [1] R Data Device temperature, valid range of –128 to 127 °C 
when M_CTRL1[m_hms] > 0b00
0x52 M_THS_CFG [1][5] R/W 0x00 Magnetic threshold detection function configuration
0x53 M_THS_SRC [1][2] R Data Magnetic threshold event source register
0x54 M_THS_X_MSB [1][5] R/W 0x00 X-axis magnetic threshold MSB
0x55 M_THS_X_LSB [1][5] R/W 0x00 X-axis magnetic threshold LSB
0x56 M_THS_Y_MSB [1][5] R/W 0x00 Y-axis magnetic threshold MSB
0x57 M_THS_Y_LSB [1][5] R/W 0x00 Y-axis magnetic threshold LSB
0x58 M_THS_Z_MSB [1][5] R/W 0x00 Z-axis magnetic threshold MSB
0x59 M_THS_Z_LSB [1][5] R/W 0x00 Z-axis magnetic threshold LSB
0x5A M_THS_COUNT [1][3][5] R/W 0x00 Magnetic threshold   debounce counter
0x5B M_CTRL_REG1 [4] R/W 0x00 Control for magnetic sensor functions
0x5C M_CTRL_REG2 [5] R/W 0x00 Control for magnetic sensor functions
0x5D M_CTRL_REG3 [4] R/W 0x00 Control for magnetic sensor functions
0x5E M_INT_SRC R 0x00 Magnetic interrupt source
0x5F A_VECM_CFG [4] R/W 0x00 Acceleration vector-magnitude configuration register
0x60 A_VECM_THS_MSB [4] R/W 0x00 Acceleration vector-magnitude threshold MSB
0x61 A_VECM_THS_LSB [4] R/W 0x00 Acceleration vector-magnitude threshold LSB
0x62 A_VECM_CNT [4] R/W 0x00 Acceleration vector-magnitude debounce count
0x63 A_VECM_INITX_MSB [4] R/W 0x00 Acceleration vector-magnitude X-axis reference value 
MSB
0x64 A_VECM_INITX_LSB [4] R/W 0x00 Acceleration vector-magnitude X-axis reference value 
LSB
0x65 A_VECM_INITY_MSB [4] R/W 0x00 Acceleration vector-magnitude Y-axis reference value 
MSB
0x66 A_VECM_INITY_LSB [4] R/W 0x00 Acceleration vector-magnitude Y-axis reference value 
LSB
0x67 A_VECM_INITZ_MSB [4] R/W 0x00 Acceleration vector-magnitude Z-axis reference value 
MSB
0x68 A_VECM_INITZ_LSB [4] R/W 0x00 Acceleration vector-magnitude Z-axis reference value 
LSB
0x69 M_VECM_CFG [4] R/W 0x00 Magnetic vector-magnitude configuration register
0x6A M_VECM_THS_MSB [4] R/W 0x00 Magnetic vector-magnitude threshold MSB
0x6B M_VECM_THS_LSB [4] R/W 0x00 Magnetic vector-magnitude threshold LSB
0x6C M_VECM_CNT [4] R/W 0x00 Magnetic vector-magnitude debounce count
Table 16. Register address map - ¶continued
Address Name Access Default
Hex
Value
Comment

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  32 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
[1] Register contents are preserved when transitioning from active-to-standby mode.
[2] Register contents are reset when transitioning from standby-to-active mode.
[3] Hybrid auto-increment mode may be used to read out acceleration and magnetic data from registers x1-x6 
using a burst-read transaction. When M_CTRL_REG2[hyb_autoinc_mode] = 1, the user may do a burst 
read of 12 bytes starting from OUT_X_MSB (address 0x1) to read out both the current accelerometer and 
magnetometer data in one contiguous operation.
[4] Register contents can be modified anytime in standby or active mode. A write to this register will cause a 
reset of the corresponding internal system debounce counter.
[5] Modification of this register’s contents can only occur when device is in standby mode, except the FS[1:0] 
bit fields in XYZ_DATA_CFG register.
[6] To ensure that valid data is read from these registers, the user must first read the M_OUT_X_MSB register 
in either burst- or single-read mode. Reading of the M_OUT_X_MSB register triggers the update of the 
M_OUT_X/Y/Z registers with the current time-aligned output data.
[7] To ensure that valid data is read from these registers, the user must first read the MSB register of each 
register pair in either burst- or single-read mode. Reading of the LSB register without first reading the MSB 
register will result in invalid data.
0x6D M_VECM_INITX_MSB [4] R/W 0x00 Magnetic vector-magnitude reference value X-axis 
MSB
0x6E M_VECM_INITX_LSB [4] R/W 0x00 Magnetic vector-magnitude reference value X-axis 
LSB
0x6F M_VECM_INITY_MSB [4] R/W 0x00 Magnetic vector-magnitude reference value Y-axis 
MSB
0x70 M_VECM_INITY_LSB [4] R/W 0x00 Magnetic vector-magnitude reference value Y-axis 
LSB
0x71 M_VECM_INITZ_MSB [4] R/W 0x00 Magnetic vector-magnitude reference value Z-axis 
MSB
0x72 M_VECM_INITZ_LSB [4] R/W 0x00 Magnetic vector-magnitude reference value Z-axis 
LSB
0x73 A_FFMT_THS_X_MSB [4] R/W 0x00 X-axis FMT threshold MSB
0x74 A_FFMT_THS_X_LSB [4] R/W 0x00 X-axis FFMT threshold LSB
0x75 A_FFMT_THS_Y_MSB [4] R/W 0x00 Y-axis FFMT threshold MSB
0x76 A_FFMT_THS_Y_LSB [4] R/W 0x00 Y-axis FFMT threshold LSB
0x77 A_FFMT_THS_Z_MSB [4] R/W 0x00 Z-axis FFMT threshold MSB
0x78 A_FFMT_THS_Z_LSB [4] R/W 0x00 Z-axis FFMT threshold LSB
0x79 Reserved - - Reserved, do not modify
Table 16. Register address map - ¶continued
Address Name Access Default
Hex
Value
Comment

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  33 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
Table 17. Auto-increment address
Address Name Auto-increment address
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 1
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 1
0x00 STATUS 0x01
0x01 OUT_X_MSB 0x02 0x01 0x03 0x01
0x02 OUT_X_LSB 0x03 0x00
0x03 OUT_Y_MSB 0x04 0x05 0x00
0x04 OUT_Y_LSB 0x05 0x00
0x05 OUT_Z_MSB 0x06 M_CTRL_REG2[hyb_autoinc_mode] = 0 → 0x00,
M_CTRL_REG2[hyb_autoinc_mode] = 1 → 0x33
0x06 OUT_Z_LSB M_CTRL_REG2[hyb_autoinc_mode] = 0 → 0x00, 
M_CTRL_REG2[hyb_autoinc_mode] = 1 → 0x33
0x07 to 0x08 Reserved -
0x09 F_SETUP 0x0A
0x0A TRIG_CFG 0x0B
0x0B SYSMOD 0x0C
0x0C INT_SOURCE 0x0D
0x0D WHO_AM_I 0x0E
0x0E XYZ_DATA_CFG 0x0F
0x0F HP_FILTER_CUTOFF 0x10
0x10 PL_STATUS 0x11
0x11 PL_CFG 0x12
0x12 PL_COUNT 0x13
0x13 PL_BF_ZCOMP 0x14
0x14 PL_THS_REG 0x15
0x15 A_FFMT_CFG 0x16
0x16 A_FFMT_SRC 0x17
0x17 A_FFMT_THS 0x18
0x18 A_FFMT_COUNT 0x19
0x19 to 0x1C Reserved -
0x1D TRANSIENT_CFG 0x1E
0x1E TRANSIENT_SRC 0x1F
0x1F TRANSIENT_THS 0x20
0x20 TRANSIENT_COUNT 0x21
0x21 PULSE_CFG 0x22
0x22 PULSE_SRC 0x23
0x23 PULSE_THSX 0x24

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  34 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
0x24 PULSE_THSY 0x25
0x25 PULSE_THSZ 0x26
0x26 PULSE_TMLT 0x27
0x27 PULSE_LTCY 0x28
0x28 PULSE_WIND 0x29
0x29 ASLP_COUNT 0x2A
0x2A CTRL_REG1 0x2B
0x2B CTRL_REG2 0x2C
0x2C CTRL_REG3 0x2D
0x2D CTRL_REG4 0x2E
0x2E CTRL_REG5 0x2F
0x2F OFF_X 0x30
0x30 OFF_Y 0x31
0x31 OFF_Z 0x32
0x32 M_DR_STATUS 0x33
0x33 M_OUT_X_MSB 0x34
0x34 M_OUT_X_LSB 0x35
0x35 M_OUT_Y_MSB 0x36
0x36 M_OUT_Y_LSB 0x37
0x37 M_OUT_Z_MSB 0x38
0x38 M_OUT_Z_LSB 0x39
0x39 CMP_X_MSB 0x3A
0x3A CMP_X_LSB 0x3B
0x3B CMP_Y_MSB 0x3C
0x3C CMP_Y_LSB 0x3D
0x3D CMP_Z_MSB 0x3E
0x3E CMP_Z_LSB 0x3F
0x3F M_OFF_X_MSB 0x40
0x40 M_OFF_X_LSB 0x41
0x41 M_OFF_Y_MSB 0x42
0x42 M_OFF_Y_LSB 0x43
0x43 M_OFF_Z_MSB 0x44
0x44 M_OFF_Z_LSB 0x45
0x45 MAX_X_MSB 0x46
Table 17. Auto-increment address - ¶continued
Address Name Auto-increment address
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 1
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 1

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  35 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
0x46 MAX_X_LSB 0x47
0x47 MAX_Y_MSB 0x48
0x48 MAX_Y_LSB 0x49
0x49 MAX_Z_MSB 0x4A
0x4A MAX_Z_LSB 0x4B
0x4B MIN_X_MSB 0x4C
0x4C MIN_X_LSB 0x4D
0x4D MIN_Y_MSB 0x4E
0x4E MIN_Y_LSB 0x4F
0x4F MIN_Z_MSB 0x50
0x50 MIN_Z_LSB 0x51
0x51 TEMP 0x52
0x52 M_THS_CFG 0x53
0x53 M_THS_SRC 0x54
0x54 M_THS_X_MSB 0x55
0x55 M_THS_X_LSB 0x56
0x56 M_THS_Y_MSB 0x57
0x57 M_THS_Y_LSB 0x58
0x58 M_THS_Z_MSB 0x59
0x59 M_THS_Z_LSB 0x5A
0x5A M_THS_COUNT 0x5B
0x5B M_CTRL_REG1 0x5C
0x5C M_CTRL_REG2 0x5D
0x5D M_CTRL_REG3 0x5E
0x5E M_INT_SRC 0x5F
0x5F A_VECM_CFG 0x60
0x60 A_VECM_THS_MSB 0x61
0x61 A_VECM_THS_LSB 0x62
0x62 A_VECM_CNT 0x63
0x63 A_VECM_INITX_MSB 0x64
0x64 A_VECM_INITX_LSB 0x65
0x65 A_VECM_INITY_MSB 0x66
0x66 A_VECM_INITY_LSB 0x67
0x67 A_VECM_INITZ_MSB 0x68
Table 17. Auto-increment address - ¶continued
Address Name Auto-increment address
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 1
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 1

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  36 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
NOTE
The auto-increment addressing is only enabled when registers are 
read using burst-read mode when configured for either I2C or SPI. The 
auto-increment address is automatically reset to 0x00 in I2C mode 
when a stop condition is detected. In SPI mode there is no stop 
condition and the auto-increment address is not automatically reset to 
0x00.
0x68 A_VECM_INITZ_LSB 0x69
0x69 M_VECM_CFG 0x6A
0x6A M_VECM_THS_MSB 0x6B
0x6B M_VECM_THS_LSB 0x6C
0x6C M_VECM_CNT 0x6D
0x6D M_VECM_INITX_MSB 0x6E
0x6E M_VECM_INITX_LSB 0x6F
0x6F M_VECM_INITY_MSB 0x70
0x70 M_VECM_INITY_LSB 0x71
0x71 M_VECM_INITZ_MSB 0x72
0x72 M_VECM_INITZ_LSB 0x73
0x73 A_FFMT_THS_X_MSB 0x74
0x74 A_FFMT_THS_X_LSB 0x75
0x75 A_FFMT_THS_Y_MSB 0x76
0x76 A_FFMT_THS_Y_LSB 0x77
0x77 A_FFMT_THS_Z_MSB 0x78
0x78 A_FFMT_THS_Z_LSB 0X79
0x79 Reserved -
Table 17. Auto-increment address - ¶continued
Address Name Auto-increment address
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 0
STATUS[f_mode] = 00,
CTRL_REG1[f_read] = 1
STATUS[f_mode] > 00,
CTRL_REG1[f_read] = 1

Data sheet: Technical data Rev. 8.0 — 25 April 2017 37 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.1 Device configuration registers

14.1.1 STATUS register (address 0x00)

The STATUS register aliases allow for the contiguous burst read of both status and

current acceleration sample/FIFO data using the auto-increment addressing mechanism

in both 8- and 14-bit modes.

14.1.2 DR_STATUS register (address 0x00)

Data-ready status when F_SETUP[f_mode] = 0x00

This STATUS register provides the acquisition status information on a per-sample basis,

and reflects real-time updates to the OUT_X, OUT_Y, and OUT_Z registers.

When the FIFO subsystem data output register driver is disabled (F_SETUP[f_mode] =

0b00), this register indicates the real-time status information of the accelerometer X, Y,

and Z axes sample data.

Table 18. STATUS register (address 0x00) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol DR_STATUS or F_STATUS

Reset 00000000

Access RRRRRRRR

Table 19. STATUS register (address 0x00) bit description

Field Description

F_SETUP[f_mode] = 0b00 register 0x00 → DR_STATUS

F_SETUP[f_mode] > 0b00 register 0x00 → F_STATUS

Table 20. DR_STATUS register (address 0x00) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol zyxow zow yow xow zyxdr zdr ydr xdr

Reset 00000000

Access RRRRRRRR

Data sheet: Technical data Rev. 8.0 — 25 April 2017 38 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Table 21. DR_STATUS register (address 0x00) bit descriptions

Field Description

zyxow zyxow is set to 1 whenever new data is acquired before completing the retrieval of the previous set. This

event occurs when the content of at least one acceleration data register (that is, OUT_X, OUT_Y, and

OUT_Z) has been overwritten. zyxow is cleared when the high-bytes of the acceleration data (OUT_X_MSB,

OUT_Y_MSB, and OUT_Z_MSB) are read.

X, Y, and Z-axis data overwrite.

0 – No data overwrite has occurred

1 – Previous X, Y, and Z data was overwritten by new X, Y, and Z data before it was completely read

zow zow is set to 1 whenever a new Z-axis acquisition is completed before the retrieval of the previous data.

When this occurs the previous data is overwritten. zow is cleared anytime OUT_Z_MSB register is read.

Z-axis data overwrite.

0 – No data overwrite has occurred

1 – Previous Z-axis data was overwritten by new Z-axis data before it was read

yow yow is set to 1 whenever a new Y-axis acquisition is completed before the retrieval of the previous data.

When this occurs the previous data is overwritten. yow is cleared anytime OUT_Y_MSB register is read.

Y-axis data overwrite.

0 – No data overwrite has occurred

1 – Previous Y-axis data was overwritten by new Y-axis data before it was read

xow xow is set to 1 whenever a new X-axis acquisition is completed before the retrieval of the previous data.

When this occurs the previous data is overwritten. xow is cleared anytime OUT_X_MSB register is read.

X-axis data overwrite.

0 – No data overwrite has occurred

1 – Previous X-axis data was overwritten by new X-axis data before it was read

zyxdr zyxdr signals that a new acquisition for any of the enabled channels is available. zyxdr is cleared when the

high-bytes of the acceleration data (OUT_X_MSB, OUT_Y_MSB, OUT_Z_MSB) are read.

X, Y, and Z-axis new data ready.

0 – No new set of data ready

1 – New set of data is ready

zdr zdr is set to 1 whenever a new Z-axis data acquisition is completed. zdr is cleared anytime the OUT_Z_MSB

Z-axis new data available.

0 – No new Z-axis data is ready

1 – New Z-axis data is ready

ydr ydr is set to 1 whenever a new Y-axis data acquisition is completed. ydr is cleared anytime the OUT_Y_MSB

Y-axis new data available. Default value: 0

0 – No new Y-axis data ready

1 – New Y-axis data is ready

xdr xdr is set to 1 whenever a new X-axis data acquisition is completed. xdr is cleared anytime the OUT_X_MSB

X-axis new data available. Default value: 0

0 – No new X-axis data ready

1 – New X-axis data is ready

Data sheet: Technical data Rev. 8.0 — 25 April 2017 39 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.1.3 F_STATUS register (address 0x00)

FIFO Status when F_SETUP[f_mode] = 0x00 > 0x00.

If the FIFO subsystem data output register driver is enabled, the status register indicates

the current status information of the FIFO subsystem.

The f_ovf and f_wmrk_flag flags remain asserted while the event source is still active, but

the user can clear the FIFO interrupt bit in the interrupt source register (INT_SOURCE) by

reading the F_STATUS register. In this case, the INT_SOURCE[src_fifo] bit will be set

again when the next data sample enters the FIFO.

Therefore, the f_ovf bit will remain asserted while the FIFO has overflowed and the

f_wmrk_flag bit will remain asserted while the f_cnt value is equal to or greater than then

f_wmrk value.

14.1.4 TRIG_CFG register (address 0x0A)

FIFO trigger configuration register. After the interrupt flag of the enabled event in

TRIG_CFG is set, the FIFO (when configured in Trigger mode) is gated at the time of the

interrupt event preventing the further collection of data samples. This allows the host

processor to analyze the data leading up to the event detection (up to 32 samples). For

detailed information on how to utilize the FIFO and the various trigger events, please see

NXP application note AN4073.

Table 22. F_STATUS register (address 0x00) bit allocation

Bit 76543210

Symbol f_ovf f_wmrk_flag f_cnt[5:0]

Reset 00000000

Access RRRRRRRR

Table 23. FIFO flag event descriptions

f_ovf f_wmrk_flag Event description

0 X No FIFO overflow events detected.

1 X FIFO overflow event detected.

X 0 No FIFO watermark event detected.

X 1 A FIFO watermark event was detected indicating that a FIFO sample count greater

than watermark value has been reached.

If F_SETUP[f_mode] = 0b11, a FIFO trigger event was detected

Table 24. FIFO - sample count (address 0x00) bit description

Field Description

f_cnt[5:0] These bits indicate the number of acceleration samples currently stored in the FIFO buffer. Count

0b00_0000 indicates that the FIFO is empty.

FIFO sample counter. Default value 0b00_0000.

(0b00_0001 to 0b10_0000 indicates 1 to 32 samples stored in FIFO

Data sheet: Technical data Rev. 8.0 — 25 April 2017 40 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.1.5 SYSMOD register (address 0x0B)

The system mode register indicates the current device operating mode. Applications

using the auto-sleep/auto-wake mechanism should use this register to synchronize their

application with the device operating mode. The system mode register also indicates the

status of the FIFO gate error flag and the time elapsed since the FIFO gate error flag was

asserted.

14.1.6 INT_SOURCE register (address 0x0C)

Interrupt source register. The bits that are set (logic ‘1’) indicate which function has

asserted its interrupt and conversely bits that are cleared (logic ‘0’) indicate which function

has not asserted its interrupt. Additional interrupt flags for magnetic interrupt events are

located in the M_INT_SRC register (0x5E).

Table 25. TRIG_CFG register (address 0x0A) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - trig_trans trig_lndprt trig_pulse trig_ffmt trig_a_vecm -

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 26. TRIG_CFG register (address 0x0A) bit descriptions

Field Description

trig_trans Transient interrupt FIFO trigger enable.

trig_lndprt Landscape/portrait orientation interrupt FIFO trigger enable.

trig_pulse Pulse interrupt FIFO trigger enable

trig_ffmt Freefall/motion interrupt FIFO trigger enable

trig_a_vecm Acceleration vector-magnitude FIFO trigger enable.

Table 27. SYSMOD register (address 0x0B) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol fgerr fgt[4:0] sysmod[1:0]

Reset 00000000

Access RRRRRRRR

Table 28. SYSMOD register (address 0x0B) bit descriptions

Field Description

fgerr FIFO gate error. Default value: 0.

0 – No FIFO gate error detected.

1 – FIFO gate error was detected.

Emptying the FIFO buffer clears the fgerr bit in the SYSMOD register.

See Section 14.1.10 for more information on configuring the FIFO gate function.

fgt[4:0] Number of ODR time units since fgerr was asserted. Reset when fgerr is cleared

sysmod[1:0] System mode. Default value: 0b00.

0b00 – Standby mode

0b01 – Wake mode

0b10 – Sleep mode

Data sheet: Technical data Rev. 8.0 — 25 April 2017 41 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Reading the INT_SOURCE register does not clear any interrupt status bits (except for

src_a_vecm, see Table 29); the respective interrupt flag bits are reset by reading the

appropriate source register for the function that generated the interrupt.

Table 29. INT_SOURCE register (address 0x0C) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol src_aslp src_fifo src_trans src_lndprt src_pulse src_ffmt src_a_vecm src_drdy

Reset 00000000

Access RRRRRRRR

Table 30. INT_SOURCE register (address 0x0C) bit descriptions

Field Description

src_aslp Auto-sleep/wake interrupt status bit: logic ‘1’ indicates that an interrupt event that can cause a

wake-to-sleep or sleep-to-wake system mode transition has occurred and logic ‘0’ indicates that no

wake-to-sleep or sleep-to-wake system mode transition interrupt event has occurred.

The “wake-to-sleep” transition occurs when a period of inactivity that exceeds the user-specified time

limit (ASLP_COUNT) has been detected, thus causing the system to transition to a user-specified low

ODR setting.

A “sleep-to-wake” transition occurs when the user-specified interrupt event has awakened the system,

thus causing the system to transition to the user-specified higher ODR setting.

Reading the SYSMOD register will clear the src_aslp bit.

src_fifo FIFO interrupt status bit: logic ‘1’ indicates that a FIFO interrupt event such as an overflow or watermark

(F_STATUS[f_cnt] = F_STATUS[f_wmrk]) event has occurred and logic ‘0’ indicates that no FIFO

interrupt event has occurred.

This bit is cleared by reading the F_STATUS register.

src_trans Transient interrupt status bit: logic ‘1’ indicates that an acceleration transient value greater than

user-specified threshold has occurred. and logic ‘0’ indicates that no transient event has occurred.

This bit is asserted whenever TRANSIENT_SRC[ea] is asserted and the functional block interrupt has

been enabled.

This bit is cleared by reading the TRANSIENT_SRC register.

src_lndprt Landscape/portrait orientation interrupt status bit: logic ‘1’ indicates that an interrupt was generated due

to a change in the device orientation status and logic ‘0’ indicates that no change in orientation status was

detected.

This bit is asserted whenever PL_STATUS[newlp] is asserted and the functional block interrupt has been

enabled.

This bit is cleared by reading the PL_STATUS register.

src_pulse Pulse interrupt status bit: logic ‘1’ indicates that an interrupt was generated due to single- and/or double-

pulse event and logic ‘0’ indicates that no pulse event was detected.

This bit is asserted whenever PULSE_SRC[ea] is asserted and the functional block interrupt has been

enabled.

This bit is cleared by reading the PULSE_SRC register.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 42 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.1.7 WHO_AM_I register (address 0x0D)

Device identification register. This register contains the device identifier which is set to

0xC4 for preproduction devices and 0xC7 for production devices.

14.1.8 CTRL_REG1 register (address 0x2A)

NOTE

Except for standby mode selection, the device must be in standby

mode to change any of the fields within CTRL_REG1 (0x2A).

src_ffmt Freefall/motion interrupt status bit: logic ‘1’ indicates that the freefall/motion function interrupt is active

and logic ‘0’ indicates that no freefall or motion event was detected.

This bit is asserted whenever A_FFMT_SRC[ea] is asserted and the functional block interrupt has been

enabled.

This bit is cleared by reading the A_FFMT_SRC register.

src_a_vecm Accelerometer vector-magnitude interrupt status bit: logic ‘1’ indicates that an interrupt was generated

due to acceleration vector-magnitude function and logic ‘0’ indicates that no interrupt has been

generated. This bit is cleared by reading this register (INT_SOURCE).

src_drdy Data-ready interrupt status bit. In acceleration only mode this bit indicates that new accelerometer data is

available to read. In magnetometer only mode, src_drdy indicates that new magnetic data is available to

be read. In hybrid mode, this bit signals that new acceleration and/or magnetic data is available.

The src_drdy interrupt flag is cleared by reading out the acceleration data in accelerometer only mode

and by reading out the magnetic data in magnetometer only or hybrid modes. In hybrid mode and with

M_CTRL_REG2[hyb_autoinc_mode] = 1, all of the sensor data can be read out in a 12-byte burst read

starting at register 0x01 (OUT_X_MSB).

Table 30. INT_SOURCE register (address 0x0C) bit descriptions - ¶continued

Field Description

Table 31. WHO_AM_I register (address 0x0D) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol who_am_i[7:0]

Reset 11000111

Access RRRRRRRR

Table 32. CTRL_REG1 register (address 0x2A) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol aslp_rate[1:0] dr[2:0] lnoise f_read active

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 43 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

It is important to note that when the device is in auto-sleep mode, the system ODR and

data rate for all the system functional blocks is overridden by the sleep data rate set by the

aslp_rate field. When hybrid mode is enabled, the frequency is one-half of what is shown

in Table 35. For example, with aslp_rate = 0b00 the frequency is 25 Hz.

Table 35 shows the various system output data rates (ODR) that may be selected using

the dr[2:0] bits.The selected ODR is reduced by a factor of two when the device is

operated in hybrid mode.

Table 33. CTRL_REG1 register (address 0x2A) bit descriptions

Field Description

aslp_rate[1:0] Configures the auto-wake sample frequency when the device is in sleep mode.

See Table 35 for more information.

dr[2:0] Output data rate (ODR) selection.

See Table 35 for more information.

lnoise Reduced noise and full-scale range mode (analog gain times 2).

0 – Normal mode

1 – Reduced noise mode; Note that the FSR setting is restricted to ±2 g or ±4 g mode. This feature

cannot be used in ±8 g mode.

f_read Fast-read mode: Data format is limited to the 8-bit MSB for accelerometer output data. The auto-address

pointer will skip over the LSB addresses for each axes sample data when performing a burst-read

operation.

0 – Normal mode

1 – Fast-read mode

active Standby/active.

0 – Standby mode

1 – Active mode

Table 34. Sleep mode ODR selection

aslp_rate[1] aslp_rate[0] Frequency (Hz)

0050

0112.5

106.25

111.56

Table 35. System Output Data Rate selection

dr[2] dr[1] dr[0] ODR accelerometer or

magnetometer only modes

(Hz)

Period accelerometer or

magnetometer only modes

(ms)

ODR hybrid

mode (Hz)

Period hybrid

mode (ms)

0 0 0 800.0 1.25 400 2.5

0 0 1 400.0 2.5 200 5

0 1 0 200.0 5 100 10

011100.0 10 50 20

10050.0 20 25 40

10112.5 80 6.25 160

1 1 0 6.25 160 3.125 320

1 1 1 1.5625 640 0.7813 1280

Data sheet: Technical data Rev. 8.0 — 25 April 2017 44 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The active bit selects between standby mode and active mode. The default value is 0

(standby mode) on reset.

The lnoise bit selects between normal full dynamic range mode and a high sensitivity,

low-noise mode. In low-noise mode the maximum signal that can be measured is ±4 g.

Note: Any thresholds set above 4 g will not be reached.

The f_read bit selects between normal and fast-read modes where the auto-increment

counter will also skip over the LSB data bytes when f_read = 1. In hybrid mode and with

M_CTRL_REG2[hyb_autoinc_mode] = 1, all of the sensor data MSB's can be read out

with a single 6-byte burst read starting at the OUT_X_MSB register.

NOTE

The f_read bit can only be changed while F_SETUP[f_mode] = 0.

14.1.9 CTRL_REG2 register (address 0x2B)

Table 36. CTRL_REG2 register (address 0x2B) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol st rst - smods[1:0] slpe mods[1:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 45 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] When slpe = 1, a transition between sleep mode and wake mode (or vice-versa) results in a FIFO flush and

resets all of the internal functions debounce counters. All functional block status information is preserved

except where otherwise indicated. For further information, refer to the CTRL_REG3 register description

(fifo_gate bit).

Table 37. CTRL_REG2 register (address 0x2B) bit descriptions

Field Description

st The st bit activates the accelerometer self-test function. When st is set to 1, a change will occur in the device

output levels for each axis, allowing the host application to check the functionality of the transducer and

measurement signal chain.

Self-test enable:

0 – Self-test disabled

1 – Self-test enabled

rst The rst bit is used to initiate a software reset. The reset mechanism can be enabled in both standby and active

modes. When the rst bit is set, the boot mechanism resets all functional block registers and loads the

respective internal registers with their default values. Refer to document FXOS8700CQER for further

information and a suggested work-around. After setting the rst bit, the system will automatically transition to

standby mode. Therefore, if the system was already in standby mode, the reboot process will immediately

begin; else if the system was in active mode the boot mechanism will automatically transition the system from

active mode to standby mode, only then can the reboot process begin. A system reset can also be initiated by

pulsing the external RST pin high.

The host application should allow 1 ms between issuing a software (setting rst bit) or hardware (pulsing RST

pin) reset and attempting communications with the device over the I2C or SPI interfaces. When the SPI

interface mode is desired and multiple devices are present on the bus, make sure that the bus is quiet (all

slave device MISO pins are high-z) during this 1 ms period to ensure the device does not inadvertently enter

I2C mode. See Section 10.2.3 for further information about the interface mode auto-detection circuit.

Note: The I2C and SPI communication systems are also reset to avoid corrupted data transactions. On

issuing a software reset command over an I2C interface, the device immediately resets and does not send

any acknowledgment (ACK) of the written byte to the master. The host application has to implement the I2C

driver in such a way that it does not look for an ACK following a soft reset command.

At the end of the boot process, the rst bit is hardware cleared.

0 – Device reset disabled

1 – Device reset enabled

smods[1:0] Accelerometer sleep mode OSR mode selection. This setting, along with the CTRL_REG1[aslp_rate] ODR

setting determines the sleep mode power and noise for acceleration measurements.

See Table 38 and Table 39 for more information.

slpe[1] Auto-sleep mode enable:

0 – Auto-sleep is not enabled

1 – Auto-sleep is enabled

mods[1:0] Accelerometer wake mode OSR mode selection. This setting, along with the ODR selection

(CTRL_REG1[dr]) determines the wake mode power and noise for acceleration measurements. See Ta bl e 38

and Table 39 for more information.

Table 38. CTRL_REG2[(s)mods] oversampling modes

(s)mods[1] (s)mods[0] Power mode

00Normal

0 1 Low noise, low power

1 0 High resolution

1 1 Low power

Data sheet: Technical data Rev. 8.0 — 25 April 2017 46 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.1.10 CTRL_REG3 - interrupt control register (address 0x2C)

Table 39. Oversampling Ratio versus oversampling mode

Accelerometer OSR

ODR (Hz) Normal Low noise, low power High resolution Low power

1.5625 128 32 1024 16

6.25 32 8 256 4

12.5 16 4 128 2

50 4 4 32 2

100 4 4 16 2

200 4 4 8 2

400 4 4 4 2

800 2 2 2 2

Table 40. CTRL_REG3 - interrupt control register (address 0x2C) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol fifo_gate wake_trans wake_lndprt wake_pulse wake_ffmt wake_a_vecm ipol pp_od

Reset 00000 0 00

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 41. CTRL_REG3 - interrupt control register (address 0x2C) bit descriptions

Field Description

fifo_gate 0 – FIFO gate is bypassed. FIFO is flushed upon the system mode transitioning from wake-to-sleep

mode or from sleep-to-wake mode.

1 – The FIFO input buffer is blocked from accepting new samples when transitioning from

“wake-to-sleep” mode or from “sleep-to-wake” mode until the FIFO is flushed [1]. Although the system

transitions from “wake-to-sleep” or from “sleep-to-wake” the contents of the FIFO buffer are preserved

and new data samples are ignored until the FIFO is emptied by the host application.

If the fifo_gate bit is set to logic ‘1’ and the FIFO buffer is not emptied before the arrival of the next

sample, then the SYSMOD[fgerr] will be asserted. The SYSMOD[fgerr] bit remains asserted as long as

the FIFO buffer remains un-emptied.

Emptying the FIFO buffer clears the SYS_MOD[fgerr] register.

wake_tran 0 – Transient function is disabled in sleep mode

1 – Transient function is enabled in sleep mode and can generate an interrupt to wake the system

wake_lndprt 0 – Orientation function is disabled sleep mode.

1 – Orientation function is enabled in sleep mode and can generate an interrupt to wake the system

wake_pulse 0 – Pulse function is disabled in sleep mode

1 – Pulse function is enabled in sleep mode and can generate an interrupt to wake the system

wake_ffmt 0 – Freefall/motion function is disabled in sleep mode

1 – Freefall/motion function is enabled in sleep mode and can generate an interrupt to wake the system

Data sheet: Technical data Rev. 8.0 — 25 April 2017 47 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] The FIFO contents are flushed whenever the system ODR changes in order to prevent the mixing of FIFO

data from different ODR periods.

The wake enable bits for the magnetic threshold and magnetic vector-magnitude

functions are located in registers 0x52 (MAG_THS_CFG) and 0x69 (M_VECM_CFG),

respectively.

14.1.11 CTRL_REG4 - interrupt enable register (address 0x2D)

wake_a_vecm 0 – Acceleration vector-magnitude function is disabled in sleep mode

1 – Acceleration vector-magnitude function is enabled in sleep mode and can generate an interrupt to

wake the system

ipol The ipol The bit selects the logic polarity of the interrupt signals output on the INT1 and INT2 pins.

INT1/INT2 interrupt logic polarity:

0 – Active low (default)

1 – Active high

pp_od INT1/INT2 push-pull or open-drain output mode selection. The open-drain configuration can be used for

connecting multiple interrupt signals on the same interrupt line but will require an external pullup resistor

to function correctly.

0 – Push-pull (default)

1 – Open drain

Table 41. CTRL_REG3 - interrupt control register (address 0x2C) bit descriptions - ¶continued

Field Description

Table 42. CTRL_REG4 - interrupt enable register (address 0x2D) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol int_en_aslp int_en_fifo int_en_trans int_en_lndprt int_en_pulse int_en_ffmt int_en_a_vecm int_en_drdy

Reset 00 0 0 0 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 43. CTRL_REG4 - interrupt enable register (address 0x2D) bit descriptions

Field Description

int_en_aslp Sleep interrupt enable

0 – Auto-sleep/wake interrupt disabled

1‘b1 – Auto-sleep/wake interrupt enabled

int_en_fifo FIFO interrupt enable

0 – FIFO interrupt disabled

1 – FIFO interrupt enabled

int_en_trans Transient interrupt enable

0 – Transient interrupt disabled

1 – Transient interrupt enabled

int_en_lndprt Orientation interrupt enable

0 – Orientation (landscape/portrait) interrupt disabled

1 – Orientation (landscape/portrait) interrupt enabled

int_en_pulse Pulse interrupt enable

0 – Pulse detection interrupt disabled

1 – Pulse detection interrupt enabled

Data sheet: Technical data Rev. 8.0 — 25 April 2017 48 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The corresponding functional block interrupt enable bit allows the functional block to route

its event detection flag to the system’s interrupt controller. The interrupt controller routes

the enabled interrupt signals to either the INT1 or INT2 pins depending on the settings

made in CTRL_REG5. Please note that the interrupt enable bits for the magnetic

threshold and vector-magnitude interrupts are located in registers 0x52

(MAG_THS_CFG), and 0x69 (M_VECM_CFG), respectively.

14.1.12 CTRL_REG5 - interrupt routing configuration register (address 0x2E)

int_en_ffmt Freefall/motion interrupt enable

0 – Freefall/motion interrupt disabled

1 – Freefall/motion interrupt enabled

int_en_a_vecm Acceleration vector-magnitude interrupt enable

0 – Acceleration vector-magnitude interrupt disabled

1 – Acceleration vector-magnitude interrupt enabled

int_en_drdy Data-ready interrupt enable

0 – Data-ready interrupt disabled

1 – Data-ready interrupt enabled

Table 43. CTRL_REG4 - interrupt enable register (address 0x2D) bit descriptions - ¶continued

Field Description

Table 44. CTRL_REG5 - interrupt routing configuration register (address 0x2E) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol int_cfg_aslp int_cfg_fifo int_cfg_trans int_cfg_lndprt int_cfg_pulse int_cfg_ffmt int_cfg_a_vecm int_cfg_drdy

Reset 00 0 0 0 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 45. CTRL_REG5 - interrupt routing configuration register (address 0x2E) bit descriptions

Field Description

int_cfg_aslp Sleep interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

int_cfg_fifo FIFO interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

int_cfg_trans Transient detection interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

int_cfg_lndprt Orientation detection interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

int_cfg_pulse Pulse detection interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

Data sheet: Technical data Rev. 8.0 — 25 April 2017 49 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Please note that the routing configuration for the magnetic-threshold interrupt is controlled

by m_ths_int_cfg bit located in register 0x52 (MAG_THS_CFG), and the magnetic

vector-magnitude function routing is controlled by m_vecm_int_cfg bit in register 0x69

(M_VECM_CFG).

The system’s interrupt controller uses the corresponding bit field in the CTRL_REG5

int_cfg_drdy bit value is logic ‘0’ the functional block’s interrupt is routed to INT2, and if the

bit value is logic ‘1’ then the interrupt is routed to INT1. All interrupt signals routed to either

INT1 or INT2 are logically OR’d together as illustrated in Figure 11, thus one or more

functional blocks can assert an interrupt pin simultaneously; therefore a host application

responding to an interrupt should read the INT_SOURCE register to determine the

source(s) of the interrupt(s).

int_cfg_ffmt Freefall/motion detection interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

int_cfg_a_vecm Acceleration vector-magnitude interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin.

int_cfg_drdy Data-ready interrupt routing

0 – Interrupt is routed to INT2 pin

1 – Interrupt is routed to INT1 pin

Table 45. CTRL_REG5 - interrupt routing configuration register (address 0x2E) bit descriptions - ¶continued

Field Description

Fig 10. Interrupt controller block diagram

INTERRUPT

CONTROLLER

Data Ready

Freefall/Motion Detection

Pulse Detection

Orientation Detection

Transient Acceleration Detection

Auto-Sleep

INT ENABLE INT CFG

INT1

INT2

Acceleration Vector-magnitude

Magnetic Vector-magnitude

Magnetic Threshold Detection

FIFO Interrupt

Data sheet: Technical data Rev. 8.0 — 25 April 2017 50 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.2 Auto-sleep trigger register

14.2.1 ASLP_COUNT register (address 0x29)

The ASLP_COUNT register sets the minimum time period of event flag inactivity required

to initiate a change from the current active mode ODR value specified in CTRL_REG1[dr]

to the sleep mode ODR value specified in CTRL_REG1[aslp_rate], provided that

CTRL_REG2[slpe] = 1.

See Table 49 for functional blocks that may be monitored for inactivity in order to trigger

the return-to-sleep event.

Fig 11. INT1/INT2 pin control logic

INT1

INT2

SRC_RTS

SRC_FIFO

SRC_PULSE

SRC_FF_MT OR

SRC_DRDY

Table 46. ASLP_COUNT register (address 0x29) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol aslp_cnt[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 47. ASLP_COUNT register (address 0x29) bit description

Field Description

aslp_cnt[7:0] See Table 48 for details

Table 48. ASLP_COUNT relationship with ODR

Output data rate

(ODR)

Maximum inactivity time

(s)

ODR time step

(ms)

ASLP_COUNT step

(ms)

800 81 1.25 320

400 81 2.5 320

200 81 5 320

100 81 10 320

50 81 20 320

12.5 81 80 320

6.25 81 160 320

1.56 63 640 640

Data sheet: Technical data Rev. 8.0 — 25 April 2017 51 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Please note that when the device is operated in hybrid mode, the effective ODR is half of

what is selected in CTRL_REG1[dr]. For example, with ODR = 800 Hz and the device set

to hybrid mode, the ASLP_COUNT time step becomes 640 ms.

[1] If the fifo_gate bit is set to logic ‘1’, the assertion of the SRC_ASLP interrupt does not prevent the system

from transitioning to sleep or from wake mode; instead it prevents the FIFO buffer from accepting new

sample data until the host application flushes the FIFO buffer.

The interrupt sources listed in Table 49 affect the auto-sleep, return to sleep and wake

from sleep mechanism only if they have been previously enabled. The functional block

event flags that are bypassed while the system is in auto-sleep mode are temporary

disabled (Section 14.1.10) and are automatically re-enabled when the device returns from

auto-sleep mode (that is, wakes up), except for the data ready function.

If any of the interrupt sources listed under the return-to-sleep column is asserted before

the sleep counter reaches the value specified in ASLP_COUNT, then all sleep mode

transitions are terminated and the internal sleep counter is reset. If none of the interrupts

listed under the return-to-sleep column are asserted within the time limit specified by the

ASLP_COUNT register, the system will transition to the auto-sleep mode and use the

ODR value specified in CTRL_REG1[aslp_rate].

If any of the interrupt sources listed under the “wake-from-sleep” column is asserted, then

the system will transition out of the low sample rate auto-sleep mode to the user-specified

wake mode sample rate provided that the specific wake event function is enabled in

If the auto-sleep interrupt is enabled, a transition from active mode to sleep mode and

(vice-versa) will generate an interrupt.This interrupt is cleared by reading the SYSMOD

(0x0B) register.

If CTRL_REG3[fifo_gate] = 1, a transition into auto-sleep mode will preserve the FIFO

contents and set SYSMOD[fgerr] (FIFO gate error), and prevent the further collection of

accelerometer data into the FIFO. The system will wait for the FIFO buffer to be emptied

by the host application before new samples can be acquired.

Table 49. Sleep/wake mode gates and triggers

Interrupt source Event restarts time and

delays return-to-sleep

Event will wake-from-sleep

SRC_FIFO Yes No

SRC_TRANS Yes Yes

SRC_LNDPRT Yes Yes

SRC_PULSE Yes Yes

SRC_FFMT Yes Yes

SRC_ASLP No[1] No[1]

SRC_Mag Yes Yes

SRC_DRDY No No

SRC_AVECM Yes Yes

SRC_MVECM Yes Yes

SRC_MTHS Yes Yes

SRC_FIFO Yes No

Data sheet: Technical data Rev. 8.0 — 25 April 2017 52 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.3 Temperature register

14.3.1 TEMP register (address 0x51)

Eight-bit 2’s complement sensor temperature value with 0.96 °C/LSB sensitivity.

Temperature data is only valid between –40 °C and 125 °C. The temperature sensor

output is only valid when M_CTRL_REG1[m_hms] > 0b00. Please note that the

temperature sensor is uncalibrated and its output for a given temperature will vary from

one device to the next.

14.4 Accelerometer output data registers

14.4.1 OUT_X_MSB, OUT_X_LSB, OUT_Y_MSB, OUT_Y_LSB, OUT_Z_MSB,

OUT_Z_LSB (addresses 0x01 to 0x06) registers

These registers contain the X-axis, Y-axis, and Z-axis 14-bit left-justified sample data

expressed as 2's complement numbers.

The sample data output registers store the current sample data if the FIFO buffer function

is disabled, but if the FIFO buffer function is enabled the sample data output registers then

point to the head of the FIFO buffer which contains up to the previous 32 X, Y, and Z data

samples.

Fig 12. Auto-sleep state transition diagram

Acquire

Standby

No Sleep

Standby

Sleep

Active Mode Auto-Sleep Mode

SLP_COUNTER < SLP_COUNTER >

ASLP COUNT

Table 50. TEMP register (address 0x51) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol die_temperature[7:0]

Reset 00000000

Access RRRRRRRR

Data sheet: Technical data Rev. 8.0 — 25 April 2017 53 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The data is read out in the following order: Xmsb, Xlsb, Ymsb, Ylsb, Zmsb, Zlsb for

CTRL_REG1[f_read] = 0, and Xmsb, Ymsb, Zmsb for CTRL_REG1[f_read] = 1. If the

device is operating in hybrid mode and M_CTRL_REG2[hyb_autoinc_mode] = 1, The

data read out order is acceleration Xmsb, Xlsb, Ymsb, Ylsb, Zmsb, and Zlsb followed by

magnetic data Xmsb, Xlsb, Ymsb, Ylsb, Zmsb, Zlsb. Similarly, for CTRL_REG1[f_read] =

1, only the MSB's of the acceleration and magnetic data are read out in the same axis

order.

If the CTRL_REG1[f_read] bit is set, auto-increment will skip over the LSB registers. This

will shorten the data acquisition from six bytes to three bytes. If the LSB registers are

directly addressed, the LSB information can still be read regardless of the

CTRL_REG1[f_read] register setting.

If the FIFO data output register driver is enabled (F_SETUP[f_mode] > 0b00), register

0x01 points to the head of the FIFO buffer, while registers 0x02, 0x03, 0x04, 0x05, 0x06

return a value of zero when read directly.

The DR_STATUS registers, OUT_X_MSB, OUT_X_LSB, OUT_Y_MSB, OUT_Y_LSB,

OUT_Z_MSB, and OUT_Z_LSB are located in the auto-incrementing address range of

0x00 to 0x06, allowing all of the acceleration data to be read in a single-burst read of six

bytes starting at the OUT_X_MSB register. If the device is operating in hybrid mode and

M_CTRL_REG2[hyb_autoinc_mode] = 1, the magnetometer data can also be read out in

the same axis and endian order by executing a burst read of 12 bytes starting at register

OUT_X_MSB.

Table 51. OUT_X_MSB register (address 0x01) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol xd[13:6]

Reset 00000000

Access RRRRRRRR

Table 52. OUT_X_LSB register (address 0x02) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol xd[5:0] - -

Reset 00000000

Access RRRRRRRR

Table 53. OUT_Y_MSB register (address 0x03) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol yd[13:6]

Reset 00000000

Access RRRRRRRR

Table 54. OUT_Y_LSB register (address 0x04) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol yd[5:0] - -

Reset 00000000

Access RRRRRRRR

Data sheet: Technical data Rev. 8.0 — 25 April 2017 54 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.5 Accelerometer FIFO register

14.5.1 F_SETUP register (address 0x09)

[1] This bit field can be written in active mode.

[2] This bit field can be written in standby mode.

[3] The FIFO mode (f_mode) cannot be switched between operational modes (0b01, 0b10 and 0b11).

A FIFO sample count exceeding the watermark event does not stop the FIFO from

accepting new data.

Table 55. OUT_Z_MSB register (address 0x05) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol zd[13:6]

Reset 00000000

Access RRRRRRRR

Table 56. OUT_Z_LSB register (address 0x06) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol zd[5:0] - -

Reset 00000000

Access RRRRRRRR

Table 57. F_SETUP register (address 0x09) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol f_mode[1:0] f_wmrk[5:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 58. F_SETUP register (address 0x09) bit descriptions

Field Description

f_mode[1:0]

[1][2][3]

FIFO buffer operating mode.

0b00 – FIFO is disabled.

0b01 – FIFO contains the most recent samples when overflowed (circular buffer). Oldest sample is

discarded to be replaced by new sample.

0b10 – FIFO stops accepting new samples when overflowed.

0b11 – FIFO trigger mode.

The FIFO is flushed whenever the FIFO is disabled, during an automatic ODR change

(auto-sleep/wake), or on a transition from standby mode to active mode.

Disabling the FIFO (f_mode = 0b00) resets the F_STATUS[f_ovf], F_STATUS[f_wmrk_flag],

F_STATUS[f_cnt] status flags to zero.

A FIFO overflow event (that is, F_STATUS[f_cnt] = 32) will assert the F_STATUS[f_ovf] flag.

f_wmrk[5:0][2] FIFO sample count watermark.

These bits set the number of FIFO samples required to trigger a watermark interrupt. A FIFO watermark

event flag F_STATUS[f_wmk_flag] is raised when FIFO sample count F_STATUS[f_cnt] value is equal to

or greater than the f_ wmrk watermark.

Setting the f_wmrk to 0b00_0000 will disable the FIFO watermark event flag generation.

This field is also used to set the number of pre-trigger samples in trigger mode (f_mode = 0b11).

Data sheet: Technical data Rev. 8.0 — 25 April 2017 55 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The FIFO update rate is dictated by the selected system ODR. In active mode the ODR is

set by CTRL_REG1[dr] and when auto-sleep is active, the ODR is set by

CTRL_REG1[aslp_rate] bit fields.

When data is read from the FIFO buffer, the oldest sample data in the buffer is returned

and also deleted from the front of the FIFO, while the FIFO sample count is decremented

by one. It is assumed that the host application will use the I2C or SPI burst-read

transactions to dump the FIFO contents. If the FIFO X, Y, and Z data is not completely

read in one burst-read transaction, the next read will start at the next FIFO location X-axis

data. If the Y or Z data is not read out in the same burst transaction as the X-axis data, it

will be lost.

In trigger mode, the FIFO is operated as a circular buffer and will contain up to the 32

most recent acceleration data samples. The oldest sample is discarded and replaced by

the current sample, until a FIFO trigger event occurs. After a trigger event occurs, the

FIFO will continue to accept samples only until overflowed, after which point the newest

sample data is discarded. For more information on using the FIFO buffer and the various

FIFO operating modes, please refer to NXP application note AN4073.

14.6 Accelerometer sensor data configuration register

14.6.1 XYZ_DATA_CFG register (address 0x0E)

The XYZ_DATA_CFG register is used to configure the desired acceleration full-scale

range, and also to select whether the output data is passed through the high-pass filter.

Table 59. XYZ_DATA_CFG register (address 0x0E) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - - hpf_out - - fs[1:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 60. XYZ_DATA_CFG register (address 0x0E) bit descriptions

Field Description

hpf_out Enable high-pass filter on acceleration output data

1 – Output data is high-pass filtered

0 – High-pass filter is disabled.

fs[1:0] Accelerometer full-scale range selection. See Table 61.

Table 61. Full-scale range selection

fs[1] fs[0] Sensitivity Full-scale range

0 0 ±0.244 mg/LSB ±2 g

0 1 ±0.488 mg/LSB ±4 g

1 0 ±0.976 mg/LSB ±8 g

1 1 Reserved -

Data sheet: Technical data Rev. 8.0 — 25 April 2017 56 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.7 Accelerometer high-pass filter register

14.7.1 HP_FILTER_CUTOFF register (address 0x0F)

High-pass filter cutoff frequency setting register.

Table 62. HP_FILTER_CUTOFF register (address 0x0F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - pulse_hpf_byp pulse_lpf_en - - sel[1:0]

Reset 00 0 0 0000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 63. HP_FILTER_CUTOFF register (address 0x0F) bit descriptions

Field Description

pulse_hpf_byp Bypass high-pass filter for pulse processing function

0 – HPF enabled for pulse processing

1 – HPF bypassed for pulse processing

pulse_lpf_en Enable low-pass filter for pulse processing function

0 – LPF disabled for pulse processing

1 – LPF enabled for pulse processing

sel[1:0] HPF cutoff frequency selection

See Table 64.

Table 64. HP_FILTER_CUTOFF

High-Pass cutoff frequency (Hz)

ODR (Hz) sel = 0b00 sel = 0b01

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

Low power

800161616168 8 8 8

4001616168 8 8 8 4

200881644482

100441622281

50221611180.5

12.5 2 0.5 16 0.25 1 0.25 8 0.125

6.25 2 0.25 16 0.125 1 0.125 8 0.063

1.56 2 0.063 16 0.031 1 0.031 8 0.016

80044442222

40044422221

20022411120.5

100 1 1 4 0.5 0.5 0.5 2 0.25

50 0.5 0.5 4 0.25 0.25 0.25 2 0.125

12.5 0.5 0.125 4 0.063 0.25 0.063 2 0.031

6.25 0.5 0.063 4 0.031 0.25 0.031 2 0.016

1.56 0.5 0.016 4 0.008 0.25 0.008 2 0.004

Data sheet: Technical data Rev. 8.0 — 25 April 2017 57 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Please note that when the part is operated in hybrid mode, the ODR is reduced by a factor

of two, which also affects the filter cutoff frequency. For example, an ODR setting of

400 Hz in accelerometer only mode with HP_FILTER_CUTOFF[sel] = 0b10 sets the cutoff

frequency at 4 Hz. If the part is operated in Hybrid mode, the effective ODR becomes

200 Hz and the cutoff frequency is now 2 Hz for the same ODR and

HP_FILTER_CUTOFF[sel] settings.

14.8 Portrait/landscape detection registers

The FXOS8700CQ is capable of detecting six orientations: landscape left, landscape

right, portrait up, and portrait down with Z-lockout feature as well as face up and face

down orientation as shown in Figure 13, 14, and 15. For more details on the meaning of

the different user-configurable settings and for example code, please refer to NXP

application note AN4068.

Fig 13. Z-tilt angle lockout transition

Fig 14. Landscape to portrait transition

NORMAL

90°

Z-LOCK = 32.142°

0°

DETECTION

LOCKOUT

REGION

Portrait

Landscape to Portrait

90°

Trip Angle = 60°

0° Landscape

Data sheet: Technical data Rev. 8.0 — 25 April 2017 58 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.8.1 PL_STATUS register (address 0x10)

This status register can be read to get updated information on any change in orientation

by reading bit 7, or the specifics of the orientation by reading the other bits. For further

understanding of portrait up, portrait down, landscape left, landscape right, back and front

orientations refer to Figure 4. The interrupt is cleared when reading the PL_STATUS

[1] The default powerup state is bafro(Undefined), lapo(Undefined), and no lockout for orientation function.

Fig 15. Portrait to landscape transition

Portrait

Portrait to Landscape

90°

Trip Angle = 30°

0° Landscape

Table 65. PL_STATUS register (address 0x10) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol newlp lo - - - lapo[1:0] bafro

Reset 00000000

Access RRRRRRRR

Table 66. PL_STATUS register (address 0x10) bit descriptions

Field Description

newlp Landscape/portrait status change flag.

0 – No change

1 – BAFRO and/or LAPO and/or Z-tilt lockout value has changed

lo Z-tilt angle lockout.

0 – Lockout condition has not been detected

1 – Z-tilt lockout trip angle has been exceeded. Lockout condition has been detected

lapo[1:0][1] Landscape/portrait orientation

0b00 – Portrait up: equipment standing vertically in the normal orientation

0b01 – Portrait down: equipment standing vertically in the inverted orientation

0b10 – Landscape right: equipment is in landscape mode to the right

0b11 – Landscape left: equipment is in landscape mode to the left

bafro Back or front orientation.

0 – Front: equipment is in the front facing orientation

1 – Back: equipment is in the back facing orientation

Data sheet: Technical data Rev. 8.0 — 25 April 2017 59 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The newlp bit is set to 1 after the first orientation detection after a standby to active

transition, and whenever a change in lo, bafro, or lapo occurs. The newlp bit is cleared

anytime the PL_STATUS register is read. lapo, bafro and lo continue to change when

newlp is set. The current orientation is locked if the absolute value of the acceleration

experienced on any of the three axes is greater than 1.25 g.

14.8.2 PL_CFG register (address 0x11)

This register enables the portrait/landscape function and sets the behavior of the

debounce counter.

14.8.3 PL_COUNT register (address 0x12)

This register sets the debounce count for the orientation state transition. The minimum

debounce latency is determined by the system ODR value and the value of the

PL_COUNT register. Any change to the system ODR or a transition from

active-to-standby (or vice-versa) resets the internal landscape/portrait internal debounce

counters. When the device is operated in hybrid mode, the effective ODR will be half of

what is selected by the user, which will also affect the debounce time. For example, if an

ODR of 400 Hz is selected and the part is also in hybrid mode, the effective ODR is

200 Hz, and the effective debounce time step is 5 ms instead of 2.5 ms.

Table 67. PL_CFG register (address 0x11) bit allocation

Bit 76543210

Symbol dbcntmpl_en------

Reset 10000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 68. PL_CFG register (address 0x11) bit descriptions

Field Description

dbcntm Debounce counter mode selection.

0 – Decrements debounce whenever condition of interest is no longer valid.

1 – Clears counter whenever condition of interest is no longer valid

pl_en Portrait/landscape detection enable.

0 – Portrait/landscape detection is disabled.

1 – Portrait/landscape detection is enabled

Table 69. PL_COUNT register (address 0x12) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol dbnce[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 60 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.8.4 PL_BF_ZCOMP register (address 0x13)

Back/front and Z-tilt angle compensation register.

Table 70. PL_Count Relationship with the ODR

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

Low power

800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25

400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5

200 1.28 1.28 0.638 1.28 5 5 2.5 5

100 2.55 2.55 0.638 2.55 10 10 2.5 10

50 5.1 5.1 0.638 5.1 20 20 2.5 20

12.5 5.1 20.4 0.638 20.4 20 80 2.5 80

6.25 5.1 20.4 0.638 40.8 20 80 2.5 160

1.56 5.1 20.4 0.638 40.8 20 80 2.5 160

Table 71. PL_BF_ZCOMP register (address 0x13) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol bkfr[1:0] - - - zlock[2:0]

Reset 10000100

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 72. PL_BF_ZCOMP register (address 0x13) bit descriptions

Field Description

zlock[2:0] Z-lock angle threshold. range is from approximately 13° to 44°. Step size is approximately 4°. See Table 73 for

more information.

Default value: 0x04 → ∼28°

Maximum value: 0x07 → ~44°

bkfr[1:0] Back/front trip angle threshold. See Table 74 for more information.

Default: 0b10 → ±70°. Step size is 5°.

Range: ±(65° to 80°)

Table 73. Z-lockout angle definitions

zlock Resultant angle (min) for positions

between landscape and portrait

Resultant angle (max) for

ideal landscape or portrait

0b000 13.6° 14.5°

0b001 17.1° 18.2°

0b010 20.7° 22.0°

0b011 24.4° 25.9°

0b100 28.1° 30.0°

0b101 32.0° 34.2°

0b110 36.1° 38.7°

0b111 40.4° 43.4°

Data sheet: Technical data Rev. 8.0 — 25 April 2017 61 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.8.5 PL_THS_REG register (address 0x14)

Portrait to landscape trip threshold registers.

Table 74. Back/front orientation definitions

bkfr Back → front transition Front → back transition

0b00 Z < 80° or Z > 280° Z > 100° and Z < 260°

0b01 Z < 75° or Z > 285° Z > 105° and Z < 255°

0b10 Z < 70° or Z > 290° Z > 110° and Z < 250°

0b11 Z < 65° or Z > 295° Z > 115° and Z < 245°

Table 75. PL_THS_REG register (address 0x14) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol pl_ths[4:0] hys[2:0]

Reset 01000100

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 76. Threshold angle lookup table

pl_ths[4:0] value Threshold angle (approx.)

0x07 15°

0x09 20°

0x0C 30°

0x0D 35°

0x0F 40°

0x10 45°

0x13 55°

0x14 60°

0x17 70°

0x19 75°

Table 77. Trip angles versus hysteresis settings

hys[2:0] value Landscape to portrait trip angle Portrait to landscape trip angle

0b000 45° 45°

0b001 49° 41°

0b010 52° 38°

0b011 56° 34°

0b100 59° 31°

0b101 62° 28°

0b110 66° 24°

0b111 69° 21°

Data sheet: Technical data Rev. 8.0 — 25 April 2017 62 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.9 Freefall and motion detection registers

The freefall/motion detection block can be configured to detect low-g (freefall) or high-g

(motion) events utilizing the A_FFMT_CFG[a_ffmt_oae] bit.

In low-g detect mode (A_FFMT_CFG[a_ffmt_oae] = 0) a low-g condition will need to occur

on all enabled axes (ex. X, Y and Z) for the A_FFMT_SRC[a_ffmt_ea] bit to be affected.

And, in high-g detect mode (A_FFMT_CFG[a_ffmt_oae] = 1) a high-g condition occurring

in any of the enabled axes (ex. X, Y or Z) will suffice to affect the

A_FFMT_SRC[a_ffmt_ea] bit.

The detection threshold(s) are programed in register 0x17 (A_FFMT_THS) for common

threshold operation, and 0x73-0x78 (A_FFMT_THS_X/Y/Z) for individual axis threshold

operation.

A_FFMT_CFG[a_ffmt_ele] bit determines the behavior of A_FFMT_SRC[a_ffmt_ea] bit in

response to the desired acceleration event (low-g/high-g). When

A_FFMT_CFG[a_ffmt_ele] = 1, the freefall or motion event is latched and the

A_FFMT_SRC[a_ffmt_ea] flag can only be cleared by reading the A_FFMT_SRC register.

When A_FFMT_CFG[a_ffmt_ele] = 0, freefall or motion events are not latched, and the

A_FFMT_SRC[a_ffmt_ea] bit reflects the real-time status of the event detection.

A_FFMT_THS[a_ffmt_dbcntm] bit determines the debounce filtering behavior of the logic

which sets the A_FFMT_SRC[a_ffmt_ea] bit. See Table 17 for details.

It is possible to enable/disable each axis used in the freefall/motion detection function by

configuring bits A_FFMT_CFG[a_ffmt_xefe], A_FFMT_CFG[a_ffmt_yefe], and

A_FFMT_CFG[a_ffmt_zefe].

The freefall/motion detection function has the option to use a common 7-bit unsigned

threshold for each of the X, Y, and Z axes, or individual unsigned 13-bit thresholds for

each axis. When A_FFMT_THS_X_MSB[a_ffmt_ths_xyz_en] = 0, the 7-bit threshold

value stored in register 0x17 is used as a common 7-bit threshold for the X, Y, and Z axes.

When a_ffmt_ths_xyz_en = 1, each axis may be programmed with an individual 13-bit

threshold (stored in the A_FFMT_X/Y/Z MSB and LSB registers).

14.9.1 A_FFMT_CFG register (address 0x15)

Freefall/motion configuration register.

Table 78. Portrait/landscape ideal orientation definitions

Position Description

PU y ~ –1 g, x ~ 0

PD y ~ +1 g, x ~ 0

LR y ~ 0, x ~ +1 g

LL y ~ 0, x ~ –1 g

Table 79. A_FFMT_CFG register (address 0x15) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_ffmt_ele a_ffmt_oae a_ffmt_zefe a_ffmt_yefe a_ffmt_xefe - - -

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 63 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.9.2 A_FFMT_SRC register (address 0x16)

Freefall/motion source register. Read-only register.

This register keeps track of the acceleration event which is triggering (or has triggered, in

case of A_FFMT_CFG[a_ffmt_ele] = 1) the event flag. In particular

A_FFMT_SRC[a_ffmt_ea] is set to a logic ‘1’ when the logical combination of acceleration

event flags specified in A_FFMT_CFG register is true. This bit is used in combination with

the values in CTRL_REG4[int_en_ffmt] and CTRL_REG5[int_cfg_ffmt] register bits to

generate the freefall/motion interrupts.

Table 80. A_FFMT_CFG register (address 0x15) bit descriptions

Field Description

a_ffmt_ele a_ffmt_ele denotes whether the enabled event flag will be latched in the A_FFMT_SRC register or the

event flag status in the A_FFMT_SRC will indicate the real-time status of the event. If a_ffmt_ele bit is set to

a logic ‘1’, then the event flags are frozen when the a_ffmt_ea bit gets set, and are cleared by reading the

A_FFMT_SRC source register.

0 – Event flag latch disabled

1 – Event flag latch enabled

a_ffmt_oae a_ffmt_oae bit allows the selection between motion (logical OR combination of high-g X, Y, and Z-axis event

flags) and freefall (logical AND combination of low-g X, Y, and Z-axis event flags) detection.

Motion detect/freefall detect logic selection.

0 – Freefall flag (logical AND combination of low-g X, Y, and Z-axis event flags)

1 – Motion flag (logical OR combination of high-g X, Y, and Z-axis event flags)

a_ffmt_zefe a_ffmt_zefe enables the detection of a high- or low-g event when the measured acceleration data on Z-axis

is above/below the threshold set in the A_FFMT_THS register. If the a_ffmt_ele bit is set to logic ‘1’ in the

A_FFMT_CFG register, new event flags are blocked from updating the A_FFMT_SRC register.

0 – Event detection disabled

1 – Raise event flag on measured Z-axis acceleration above/below threshold.

a_ffmt_yefe a_ffmt_yefe enables the detection of a high- or low-g event when the measured acceleration data on Y-axis

is above/below the threshold set in the A_FFMT_THS register. If the a_ffmt_ele bit is set to logic ‘1’ in the

A_FFMT_CFG register, new event flags are blocked from updating the A_FFMT_SRC register.

0 – Event detection disabled

1 – Raise event flag on measured Y-axis acceleration above/below threshold.

a_ffmt_xefe a_ffmt_xefe enables the detection of a high- or low-g event when the measured acceleration data on X-axis

is above/below the threshold set in the A_FFMT_THS register. If the a_ffmt_ele bit is set to logic ‘1’ in the

A_FFMT_CFG register, new event flags are blocked from updating the A_FFMT_SRC register.

0 – Event detection disabled

1 – Raise event flag on measured X-axis acceleration above/below threshold.

Table 81. A_FFMT_SRC register (address 0x16) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_ffmt_ea - a_ffmt_zhe a_ffmt_zhp a_ffmt_yhe a_ffmt_yhp a_ffmt_xhe a_ffmt_xhp

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 64 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.9.3 A_FFMT_THS register (address 0x17)

Freefall/motion detection threshold registers.

Table 82. A_FFMT_SRC register (address 0x16) bit descriptions

Field Description

a_ffmt_ea Event active flag.

0 – No event flag has been asserted

1 – One or more event flag has been asserted. See Table 80 for the description of the

A_FFMT_CFG[a_ffmt_oae] bit to determine the effect of the 3-axis event flags on the a_ffmt_ea bit.

a_ffmt_zhe Z-high event flag.

0 – Event detected

1 – Z-high event has been detected

This bit always reads zero if the a_ffmt_zefe control bit is set to zero

a_ffmt_zhp Z-high event polarity flag.

0 – Z event was positive g

1 – Z event was negative g

This bit read always zero if the a_ffmt_zefe control bit is set to zero

a_ffmt_yhe Y-high event flag.

0 – No event detected

1 – Y-high event has been detected

This bit read always zero if the a_ffmt_yefe control bit is set to zero

a_ffmt_yhp Y-high event polarity flag.

0 – Y event detected was positive g

1 – Y event was negative g

This bit always reads zero if the a_ffmt_yefe control bit is set to zero

a_ffmt_xhe X-high event flag.

0 – No event detected

1 – X-high event has been detected

This bit always reads zero if the a_ffmt_xefe control bit is set to zero

a_ffmt_xhp X-high event polarity flag.

0 – X event was positive g

1 – X event was negative g

This bit always reads zero if the a_ffmt_xefe control bit is set to zero

Table 83. A_FFMT_THS register (address 0x17) bit allocation

Bit 7 6543210

Symbol a_ffmt_dbcntm ths[6:0]

Reset 0 0000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 65 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.9.4 A_FFMT_ THS_X_MSB, A_FFMT_THS_X_LSB, A_FFMT_THS_Y_MSB,

A_FFMT_THS_Y_LSB, A_FFMT_THS_Z_MSB, A_FFMT_THS_Z_LSB

registers (addresses 0x73 to 0x78)

Table 84. A_FFMT_THS register (address 0x17) bit descriptions

Field Description

a_ffmt_dbcntm The ASIC uses a_ffmt_dbcntm to set the acceleration FFMT debounce counter clear mode independent

of the value of the a_ffmt_ths_xyz_en.

a_ffmt_dbcntm bit configures the way in which the debounce counter is reset when the inertial event of

interest is momentarily not true.

When a_ffmt_dbcntm bit is a logic ‘1’, the debounce counter is cleared to 0 whenever the inertial event of

interest is no longer true (part b, Table 17) while if the a_ffmt_dbcntm bit is set to logic ‘0’ the debounce

counter is decremented by 1 whenever the inertial event of interest in longer true (part c, Table 17) until

the debounce counter reaches 0 or the inertial event of interest become active.

The decrementing of the debounce counter acts to filter out irregular spurious events which might

impede the correct detection of inertial events.

ths[6:0] Freefall/motion detection threshold: default value: 0b000_0000. Resolution is fixed at 63 mg/LSB.

Table 85. A_FFMT_THS_X_MSB register (address 0x73) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_ffmt_ths_xyz_en a_ffmt_ths_x[12:6]

Reset 0 0000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 86. A_FFMT_THS_X_MSB register (address 0x73) bit descriptions

Field Description

a_ffmt_ths_xyz_en For a_ffmt_ths_xyz_en = 0 the ASIC uses the ffmt_ths[6:0] value located in register 0x17[6:0] as a

common threshold for the X, Y, and Z-axis acceleration detection. The common unsigned 7-bit

acceleration threshold has a fixed resolution of 63 mg/LSB, with a range of 0 to 127 counts.

For a_ffmt_ths_xyz_en = 1 the ASIC ignores the common 7-bit G_FFMT_THS value located in

used for each axis:

A_FFMT_THS_X_MSB and A_FFMT_THS_X_LSB are used for the X-axis acceleration threshold,

A_FFMT_THS_Y_MSB and A_FFMT_THS_Y_LSB for the Y-axis acceleration threshold, and

A_FFMT_THS_Z_MSB and A_FFMT_THS_Z_LSB for the Z-axis acceleration threshold.

The A_FFMT_THS_X/Y/Z thresholds are 13-bit unsigned values that has a fixed resolution of about

63 mg/LSB. The a_ffmt_ths_xyz_en and a_ffmt_trans_ths_en bits must not be enabled

simultaneously.

a_ffmt_ths_x[12:6] 7-bit MSB of X-axis acceleration threshold.

Table 87. A_FFMT_THS_X_LSB register (address 0x74) bit allocation

Bit 7 6543210

Symbol a_ffmt_ths_x[5:0] - -

Reset 0 0000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 66 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

A_FFMT_THS contains the unsigned 7-bit threshold value used by the freefall/motion

detection functional block and is used to detect either low-g (freefall) or high-g (motion)

events depending on the setting of G_FFMT_CFG[f_ffmt_oae]. If g_ffmt_oae = 0, the

event is detected when the absolute value of all the enabled axes are below the threshold

value. When g_ffmt_oae = 1, the event is detected when the absolute value of any of the

enabled axes is above the threshold value (see Figure 16 for an illustration of the

freefall/motion event detection thresholds). If A_FFMT_THS_X_MSB[a_ffmt_ths_xyz_en]

= 1, the behavior is identical, except that each axis may be programmed with an individual

13-bit threshold (stored in the A_FFMT_X/Y/Z MSB and LSB registers).

Table 88. A_FFMT_THS_Y_MSB register (address 0x75) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_ffmt_trans

_ths_en

a_ffmt_ths_y[12:6]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 89. A_FFMT_THS_Y_LSB register (address 0x76) bit allocation

Bit 76543210

Symbol a_ffmt_ths_y[5:0] - -

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 90. A_FFMT_THS_Y_MSB register (address 0x77) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - a_ffmt_ths_z[12:6]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 91. A_FFMT_THS_Z_LSB register (address 0x78) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_ffmt_ths_yz[5:0] - -

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Fig 16. A_FFMT_THS high and low-g level

+Full Scale

High-g Positive Threshold

Low-g Threshold

High-g Negative Threshold

-Full Scale

X, Y, Z High-g Region

X, Y, Z Low-g Region

Negative

Positive

Acceleration

(Motion OR of enabled axes)

(Freefall - AND of enabled axes)

(Motion - OR of enabled axes)

Data sheet: Technical data Rev. 8.0 — 25 April 2017 67 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.9.5 A_FFMT_COUNT register (address 0x18)

Debounce count register for freefall/motion detection events

This register sets the number of debounce counts for acceleration sample data matching

the user-programmed conditions for either a freefall or motion detection event required

before the interrupt is triggered.

When the internal debounce counter reaches the A_FFMT_COUNT value a

freefall/motion event flag is set. The debounce counter will never increase beyond the

A_FFMT_COUNT value. The time step used for the debounce sample count depends on

the ODR chosen (see Table 94). When the device is operated in hybrid mode, the

effective ODR is half of what is selected in CTRL_REG1. This has the effect of doubling

the time-step values shown in Table 94.

For example, an ODR of 100 Hz and a A_ FFMT_COUNT value of 15 would result in

minimum debounce response time of 150 ms. If the device is operated in hybrid mode, the

effective debounce response time will be 300 ms for the same settings.

Table 92. A_FFMT_COUNT register (address 0x18) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_ffmt_count[7:0]

Reset 0 0000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 93. A_FFMT_COUNT register (address 0x18) bit description

Field Description

a_ffmt_count[7:0] a_ffmt_count defines the minimum number of debounce sample counts required for the detection of a

freefall or motion event. A_FFMT_THS[ffmt_dbcntm] determines the behavior of the counter when the

condition of interest is momentarily not true.

Table 94. A_FFMT_COUNT relationship with the ODR

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25

400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5

200 1.28 1.28 0.638 1.28 5 5 2.5 5

100 2.55 2.55 0.638 2.55 10 10 2.5 10

50 5.1 5.1 0.638 5.1 20 20 2.5 20

12.5 5.1 20.4 0.638 20.4 20 80 2.5 80

6.25 5.1 20.4 0.638 40.8 20 80 2.5 160

1.56 5.1 20.4 0.638 40.8 20 80 2.5 160

Data sheet: Technical data Rev. 8.0 — 25 April 2017 68 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.10 Accelerometer vector-magnitude function register

The accelerometer vector-magnitude function is an inertial event detection function

available to assist host software algorithms in detecting motion events.

If > A_VECM_THS for a

time period greater than the value stored in A_VECM_CNT, the vector-magnitude change

event flag is triggered.

a_x_out, a_y_out, and a_z_out are the current accelerometer output values, and a_x_ref,

a_y_ref, and a_z_ref are the reference values stored internally in the ASIC for each axis

or in A_VECM_INIT_X/Y/Z registers if A_VECM_CFG[a_vecm_initm] is set.

Please note that the x_ref, y_ref, and z_ref values are not directly visible to the host

application through the register interface. Please refer to NXP application note AN4458.

Fig 17. Behavior of the A_FFMT debounce counter in relation to the a_ffmt_dbcntm setting

Low-g Event on

Count Threshold

all 3-axis

FF Counter

Low-g Event on

Count Threshold

(a)

all 3-axis

Debounce Counter

Low-g Event on

Count Threshold

all 3-axis

a_ffmt_dbcntm = 1

(b)

a_ffmt_dbcntm = 0

(c)

Debounce Counter

a_x_out a_x_ref–()

2a_y_out a_y_ref–()

2a_z_out a_z_ref–()

Data sheet: Technical data Rev. 8.0 — 25 April 2017 69 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.10.1 A_VECM_CFG register (address 0x5F)

14.10.2 A_VECM_THS_MSB (address 0x60) register

Table 95. A_VECM _CFG register (address 0x5F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - a_vecm_ele a_vecm_initm a_vecm_updm a_vecm_en - - -

Reset 00 0 0 0000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 96. A_VECM_CFG register (address 0x5F) bit descriptions

Field Description

a_vecm_ele Control bit a_vecm_ele defines the event latch enable mode. Event latching is disabled for

a_vecm_ele = 0. In this case, the vector-magnitude interrupt flag is in updated real-time and is cleared

when the condition for triggering the interrupt is no longer true. The setting and clearing of the event

flag is controlled by the A_VECM_CNT register’s programmed debounce time.

For a_vecm_ele = 1, the interrupt flag is latched in and held until the host application reads the

INT_SOURCE register (0x0C).

a_vecm_initm Control bit a_vecm_initm defines how the initial reference values (x_ref, y_ref, and z_ref) are chosen.

For a_vecm_initm = 0 the function uses the current X, Y, and Z accelerometer output data at the time

when the vector-magnitude function is enabled.

For a_vecm_initm = 1 the function uses the data from A_VECM_INIT_X/Y/Z registers as the initial

reference values.

a_vecm_updm Control bit a_vecm_updm defines how the reference values are updated once the vector-magnitude

function has been triggered.

For a_vecm_updm = 0, the function updates the reference value with the current X, Y, and Z

accelerometer output data values.

For a_vecm_updm = 1, the function does not update the reference values when the interrupt is

triggered. Instead the function continues to use the reference values that were loaded when the

function was enabled. If both a_vecm_initm and a_vecm_updm are set to logic ‘1’, the host software

can manually update the reference values in real time by writing to the A_VECM_INIT_X/Y/Z

registers.

a_vecm_en The accelerometer vector-magnitude function is enabled by setting a_vecm_en = 1, and disabled by

clearing this bit (default). The reference values are loaded with either the current X, Y, and Z

acceleration values or the values stored in the A_VECM_INIT_X/Y/Z registers, depending on the state

of the a_vecm_initm bit.

Note: The vector-magnitude function will only perform correctly up to a maximum ODR of 400 Hz.

Table 97. A_VECM_THS_MSB register (address 0x60) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_vecm_

dbcntm

- - a_vecm_ths[12:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 70 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.10.3 A_VECM_THS_LSB register (address 0x61)

14.10.4 A_VECM_CNT register (address 0x62)

The debounce timer period is determined by the ODR selected in CTRL_REG1; it is equal

to the number indicated in A_VECM_CNT register times 1/ODR. For example, a value of

16 in A_VECM_CNT with an ODR setting of 400 Hz will result in a debounce period of

40 ms. Note that ODR is halved when in hybrid mode.

14.10.5 A_VECM_INITX_MSB register (address 0x63)

Table 98. A_VECM_THS_MSB register (address 0x60) bit descriptions

Field Description

a_vecm_dbcntm Control bit a_vecm_dbcntm defines how the debounce timer is reset when the condition for triggering

the interrupt is no longer true.

When a_vecm_dbcntm = 0 the debounce counter is decremented by 1 when the vector-magnitude

result is below the programmed threshold value.

When a_vecm_dbcntm = 1 the debounce counter is cleared when the vector-magnitude result is

below the programmed threshold value.

a_vecm_ths[12:8] Five MSBs of the 13-bit unsigned A_VECM_THS value. The resolution is equal to the selected

accelerometer resolution set in XYZ_DATA_CFG[fs]

Table 99. A_VECM_THS_LSB register (address 0x61) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_vecm_ths[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 100. A_VECM_CNT register (address 0x62) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_vecm_cnt[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 101. A_VECM_CNT register (address 0x62) bit description

Field Description

a_vecm_cnt[7:0] Vector-magnitude function debounce count value.

Table 102. A_VECM_INITX_MSB register (address 0x63) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - a_vecm_initx [13:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 103. A_VECM_INITX_MSB register (address 0x63) bit description

Field Description

a_vecm_initx[13:8] Most significant 6 bits of the signed 14-bit initial X-axis value to be used as ref_x when

A_VECM_CFG[a_vecm_initm] = 1. The resolution is determined by the settings made in

XYZ_DATA_CFG[fs], and is equal to the accelerometer resolution.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 71 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.10.6 A_VECM_INITX_LSB register (address 0x64)

14.10.7 A_VECM_INITY_MSB register (address 0x65)

14.10.8 A_VECM_INITY_LSB register (address 0x66)

14.10.9 A_VECM_INITZ_MSB register (address 0x67)

Table 104. A_VECM_INITX_LSB register (address 0x64)

Bit 7 6 5 4 3 2 1 0

Symbol a_vecm_initx[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 105. A_VECM_INITX_LSB register (address 0x64) bit description

Field Description

a_vecm_initx[7:0] LSB of the signed 14-bit initial X-axis value to be used as ref_x when A_VECM_CFG[a_vecm_initm]

= 1. The resolution is determined by the settings made in XYZ_DATA_CFG[fs], and is equal to the

accelerometer resolution.

Table 106. A_VECM_INITY_MSB register (address 0x65) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - a_vecm_inity[13:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 107. A_VECM_INITY_MSB register (address 0x65) bit description

Field Description

a_vecm_inity[13:8] Most significant 6 bits of the signed 14-bit initial Y-axis value to be used as ref_y when

A_VECM_CFG[a_vecm_initm] = 1. The resolution is determined by the settings made in

XYZ_DATA_CFG[fs], and is equal to the accelerometer resolution.

Table 108. A_VECM_INITY_LSB register (address 0x66) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_vecm_inity[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 109. A_VECM_INITY_LSB register (address 0x66) bit description

Field Description

a_vecm_inity[7:0] LSB of the signed 14-bit initial Y-axis value to be used as ref_y when A_VECM_CFG[a_vecm_initm] = 1.

The resolution is determined by the settings made in XYZ_DATA_CFG[fs], and is equal to the

accelerometer resolution.

Table 110. A_VECM_INITZ_MSB register (address 0x67) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - a_vecm_initz[13:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 72 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.10.10 A_VECM_INITZ_LSB register (address 0x68)

14.11 Transient (AC) acceleration detection registers

The transient detection function is similar to the freefall/motion detection function with the

exception that a high-pass filter can be used to eliminate the DC offset from the

acceleration data. There is an option to disable the high-pass filter, which causes the

transient detection function to work in a similar manner to the motion detection function.

The transient detection function can be configured to signal an interrupt when the

high-pass filtered acceleration delta values for any of the enabled axes exceeds the

threshold programmed in TRANSIENT_THS for the debounce time programmed in

TRANSIENT_COUNT. For more information on how to use and configure the transient

detection function, refer to NXP application note AN4461.

Table 111. A_VECM_INITZ_MSB register (address 0x67) bit description

Field Description

a_vecm_initz[13:8] Most significant 6 bits of the signed 14-bit initial Z-axis value to be used as ref_z when

A_VECM_CFG[a_vecm_initm] = 1. The resolution is determined by the settings made in

XYZ_DATA_CFG[fs], and is equal to the accelerometer resolution.

Table 112. A_VECM_INITZ_LSB register (address 0x68) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol a_vecm_initz[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 113. A_VECM_INITZ_LSB register (address 0x68) bit description

Field Description

a_vecm_initz[7:0] LSB of the signed 14-bit initial Z-axis value to be used as ref_z when A_VECM_CFG[a_vecm_initm]

= 1. The resolution is determined by the settings made in XYZ_DATA_CFG[fs], and is equal to the

accelerometer resolution.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 73 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.11.1 TRANSIENT_CFG register (address 0x1D)

14.11.2 TRANSIENT_SRC register (address 0x1E)

Transient event flag source register. This register provides the event status of the enabled

axes and polarity (directional) information.

Table 114. TRANSIENT_ CFG register (address 0x1D) bit allocation

Bit 7654321 0

Symbol - - - tran_ele tran_zefe tran_yefe tran_xefe tran_hpf_byp

Reset 0000000 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 115. TRANSIENT_ CFG register (address 0x1D) bit descriptions

Field Description

tran_ele Transient event flag latch enable.

0 – Event flag latch disabled: the transient interrupt flag reflects the real-time status of the function.

1 – Event flag latch enabled: the transient interrupt event flag is latched and a read of the

TRANSIENT_SRC register is required to clear the event flag.

tran_zefe Z-axis transient event flag enable.

0 – Z-axis event detection disabled

1 – Z-axis event detection enabled. Raise event flag on Z-axis acceleration value greater than threshold.

tran_yefe Y-axis transient event flag enable.

0 – Y-axis event detection disabled

1 – Y-axis event detection enabled. Raise event flag on Y-axis acceleration value greater than threshold.

tran_xefe X-axis transient event flag enable.

0 – X-axis event detection disabled

1 – X-axis event detection enabled. Raise event flag on X-axis acceleration value greater than threshold.

tran_hpf_byp Transient function high-pass filter bypass.

0 – High-pass filter is applied to accelerometer data input to the transient function.

1 – High-pass filter is not applied to accelerometer data input to the transient function.

Table 116. TRANSIENT_SRC register (address 0x1E) bit allocation

Bit 7654321 0

Symbol - tran_ea tran_zef tran_zpol tran_yef tran_ypol tran_xef trans_xpol

Reset 0000000 0

Access RRRRRRR R

Data sheet: Technical data Rev. 8.0 — 25 April 2017 74 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

When TRANSIENT_CFG[tran_ele] = 1, the TRANSIENT_SRC event flag(s) and polarity

bits are latched when the interrupt event is triggered, allowing the host application to

determine which event flag(s) originally triggered the interrupt. When

TRANSIENT_CFG[tran_ele] = 0, events which occur after the event that originally

triggered the interrupt will update the flag and polarity bits, but once set, the flags can only

be cleared by reading the TRANSIENT_SRC register.

14.11.3 TRANSIENT_THS register (address 0x1F)

The TRANSIENT_THS register determines the debounce counter behavior and also sets

the transient event detection threshold.It is possible to use A_FFMT_THS_X/Y/Z MSB

and LSB registers to set transient acceleration thresholds for individual axes using the

a_ffmt_trans_ths_en bit in A_FFMT_THS_Y_MSB register. For a_ffmt_trans_ths_en = 1,

0x76[7:2] as the 7-bit, Y-axis threshold and registers 0x77[0] and 0x78[7:2] as the 7-bit,

Z-axis threshold.

Table 117. TRANSIENT_SRC register (address 0x1E) bit descriptions

Field Description

tran_ea Transient event active flag.

0 – No transient event active flag has been asserted.

1 – One or more transient event active flags has been asserted.

tran_zef Z-axis transient event active flag.

0 – Z-axis event flag is not active.

1 – Z-axis event flag is active; Z-axis acceleration has exceeded the programmed threshold for the

debounce time specified in TRANS_COUNT.

tran_zpol Z-axis event flag polarity.

0 – Z-axis event was above positive threshold value.

1 – Z-axis event was below negative threshold value.

tran_yef Y-axis transient event active flag.

0 – Y-axis event flag is not active.

1 – Y-axis event flag is active; Y-axis acceleration has exceeded the programmed threshold for the

debounce time specified in TRANS_COUNT.

tran_ypol Y-axis event flag polarity.

0 – Y-axis event was above positive threshold value.

1 – Y-axis event was below negative threshold value.

tran_xef X-axis transient event active flag.

0 – X-axis event flag is not active.

1 – X-axis event flag is active; X-axis acceleration has exceeded the programmed threshold for the

debounce time specified in TRANS_COUNT.

tran_xpol X-axis event flag polarity.

0 – X-axis event was above positive threshold value.

1 – X-axis event was below negative threshold value.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 75 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The tr_ths[6:0] value is a 7-bit unsigned number, with a fixed resolution of 63 mg/LSB

corresponding to a ±8 g measurement range. The resolution does not change with the

full-scale range setting made in XYZ_DATA_CFG[fs]. If CTRL_REG1[lnoise] = 1, the

measurement range is fixed at ±4 g, regardless of the settings made in XYZ_DATA_CFG.

14.11.4 TRANSIENT_COUNT register (address 0x20)

The TRANSIENT_COUNT register sets the minimum number of debounce counts needed

to trigger the transient event interrupt flag when the measured acceleration value exceeds

the threshold set in TRANSIENT_THS for any of the enabled axes.

The time step for the transient detection debounce counter is set by the value of the

system ODR and power mode as shown in Table 122. When the device is operated in

hybrid mode, the effective ODR is half of what is selected in CTRL_REG1, which also

doubles the time-step values shown in Table 122.

Table 118. TRANSIENT_THS register (address 0x1F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol tr_dbcntm tr_ths[6:0]

Reset 0000000 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 119. TRANSIENT_THS register (address 0x1F) descriptions

Field Description

tr_dbcntm Debounce counter mode selection.

0 – Decrements debounce counter when the transient event condition is not true during the current ODR

period.

1 – Clears debounce counter when the transient event condition is not true during the current ODR period.

tr_ths[6:0] Transient event threshold. This register has a resolution of 63 mg/LSB regardless of the full-scale range

setting made in XYZ_DATA_CFG[fs]. If CTRL_REG1[lnoise] = 1, the maximum acceleration measurement

range is ±4 g.

Table 120. TRANSIENT_COUNT register (address 0x20) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol tr_count[7:0]

Reset 0000000 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 121. TRANSIENT_COUNT register (address 0x20) bit description

Field Description

tr_count[7:0) Transient function debounce count value.

Table 122. TRANSIENT_COUNT relationship with the ODR

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25

400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5

200 1.28 1.28 0.638 1.28 5 5 2.5 5

Data sheet: Technical data Rev. 8.0 — 25 April 2017 76 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

An ODR of 100 Hz and a TRANSIENT_COUNT value of 15, when accelerometer OSR is

set to normal using CTRL_REG2, would result in minimum debounce response time of

150 ms. When the device is operated in hybrid mode, these settings would result in an

effective debounce time of 300 ms.

14.12 Pulse detection registers

14.12.1 PULSE_CFG register (address 0x21)

This register configures the pulse event detection function.

100 2.55 2.55 0.638 2.55 10 10 2.5 10

50 5.1 5.1 0.638 5.1 20 20 2.5 20

12.5 5.1 20.4 0.638 20.4 20 80 2.5 80

6.25 5.1 20.4 0.638 40.8 20 80 2.5 160

1.56 5.1 20.4 0.638 40.8 20 80 2.5 160

Table 122. TRANSIENT_COUNT relationship with the ODR - ¶continued

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

Table 123. PULSE_CFG register (address 0x21) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol pls_dpa pls_ele pls_zdpefe pls_zspefe pls_ydpefe pls_yspefe pls_xdpefe pls_xspefe

Reset 0000000 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 124. PULSE_CFG register (address 0x21) bit descriptions

Field Description

pls_dpa Double-pulse abort.

0 – Double-pulse detection is not aborted if the start of a pulse is detected during the time period

specified by the PULSE_LTCY register.

1 – Setting the pls_dpa bit momentarily suspends the double-tap detection if the start of a pulse is

detected during the time period specified by the PULSE_LTCY register and the pulse ends before the

end of the time period specified by the PULSE_LTCY register.

pls_ele Pulse event flag latch enable. When enabled, a read of the PULSE_SRC register is needed to clear the

event flag.

0 – Event flag latch disabled

1 – Event flag latch enabled

pls_zdpefe Event flag enable on double-pulse event on Z-axis.

0 – Event detection disabled

1 – Raise event flag on detection of double-pulse event on Z-axis

pls_zspefe Event flag enable on single-pulse event on Z-axis.

0 – Event detection disabled

1 – Raise event flag on detection of single-pulse event on Z-axis

pls_ydpefe Event flag enable on double-pulse event on Y-axis.

0 – Event detection disabled

1 – Raise event flag on detection of double-pulse event on Y-axis

Data sheet: Technical data Rev. 8.0 — 25 April 2017 77 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.12.2 PULSE_SRC register (address 0x22)

This register indicates the status bits for the pulse detection function.

pls_yspefe Event flag enable on single-pulse event on Y-axis.

0 – Event detection disabled

1 – Raise event flag on detection of single-pulse event on Z-axis.

pls_xdpefe Event flag enable on double-pulse event on X-axis.

0 – Event detection disabled

1 – Raise event flag on detection of double-pulse event on X-axis.

pls_xspefe Event flag enable on single-pulse event on X-axis.

0 – Event detection disabled

1 – Raise event flag on detection of single-pulse event on X-axis.

Table 124. PULSE_CFG register (address 0x21) bit descriptions - ¶continued

Field Description

Table 125. PULSE_SRC register (address 0x22) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol pls_src_ea pls_src_axz pls_src_axy pls_src_axx pls_src_dpe pls_src_polz pls_src_poly pls_src_polx

Reset 00000 0 0 0

Access RRRRR R R R

Table 126. PULSE_SRC register (address 0x22) bit descriptions

Field Description

pls_src_ea Event active flag.

0 – No interrupt has been generated

1 – One or more interrupt events have been generated

pls_src_axz Z-axis event flag.

0 – No interrupt

1 – Z-axis event has occurred

pls_src_axy Y-axis event flag.

0 – No interrupt

1 – Y-axis event has occurred

pls_src_axx X-axis event flag.

0 – No interrupt

1 – X-axis event has occurred.

pls_src_dpe Double pulse on first event.

0 – Single-pulse event triggered interrupt

1 – Double-pulse event triggered interrupt

Data sheet: Technical data Rev. 8.0 — 25 April 2017 78 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.12.3 PULSE_THSX register (address 0x23)

The PULSE_THSX, PULSE_THSY and PULSE_THSZ registers define the thresholds

used by the system to start the pulse-event detection procedure. Threshold values for

each axis are unsigned 7-bit numbers with a fixed resolution of 0.063 g/LSB,

corresponding to an 8 g acceleration full-scale range. The full-scale range is fixed at 8 g

for the pulse detection function, regardless of the settings made in XYZ_DATA_CFG[fs].

14.12.4 PULSE_THSY register (address 0x24)

pls_src_polz Pulse polarity of Z-axis event.

0 – Pulse event that triggered interrupt was positive.

1 – Pulse event that triggered interrupt was negative.

pls_src_poly Pulse polarity of Y-axis event.

0 – Pulse event that triggered interrupt was positive.

1 – Pulse event that triggered interrupt was negative.

pls_src_polx Pulse polarity of X-axis event.

0 – Pulse event that triggered interrupt was positive.

1 – Pulse event that triggered interrupt was negative.

Table 126. PULSE_SRC register (address 0x22) bit descriptions - ¶continued

Field Description

Table 127. PULSE_THSX register (address 0x23) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - pls_thsx[6:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 128. PULSE_THSX register (address 0x23) bit description

Field Description

pls_thsx[6:0] Pulse threshold for X-axis.

Table 129. PULSE_THSY register (address 0x24) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - pls_thsy[6:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 130. PULSE_THSY register (address 0x24) bit description

Field Description

pls_thsy[6:0] Pulse threshold for Y-axis.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 79 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.12.5 PULSE_THSZ register (address 0x25)

14.12.6 PULSE_TMLT register (address 0x26)

Minimum time step for the pulse-time limit is defined in Table 135 and Table 136.

Maximum time for a given ODR is “Minimum time step x 255”.

Table 131. PULSE_THSZ register (address 0x25) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - pls_thsz[6:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 132. PULSE_THSZ register (address 0x24) bit description

Field Description

pls_thsz[6:0] Pulse threshold for Z-axis.

Table 133. PULSE_TMLT register (address 0x26) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol pls_tmlt[7:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 134. PULSE_TMLT register (address 0x26) bit description

Field Description

pls_tmlt[7:0] pls_tmlt[7:0] defines the maximum time interval that can elapse between the start of the acceleration on

the selected channel exceeding the specified threshold and the end when the channel acceleration goes

back below the specified threshold.

Table 135. Time step for PULSE_TMLT with HP_FILTER_CUTOFF[pls_hpf_en] = 1

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25

400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5

200 1.28 1.28 0.638 1.28 5 5 2.5 5

100 2.55 2.55 0.638 2.55 10 10 2.5 10

50 5.1 5.1 0.638 5.1 20 20 2.5 20

12.5 5.1 20.4 0.638 20.4 20 80 2.5 80

6.25 5.1 20.4 0.638 40.8 20 80 2.5 160

1.56 5.1 20.4 0.638 40.8 20 80 2.5 160

Data sheet: Technical data Rev. 8.0 — 25 April 2017 80 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Therefore an ODR setting of 400 Hz, when accelerometer OSR is set to normal using

CTRL_REG2, would result in a maximum pulse-time limit of (0.625 ms * 255) = 159 ms.

14.12.7 PULSE_LTCY register (address 0x27)

Minimum time step for the pulse latency is defined in Table 139 and Table 140. Maximum

time is (time step @ ODR and power mode) x 255.

Table 136. Time step for PULSE_TMLT with HP_FILTER_CUTOFF[pls_hpf_en] = 0

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.159 0.159 0.159 0.159 0.625 0.625 0.625 0.625

400 0.159 0.159 0.159 0.319 0.625 0.625 0.625 1.25

200 0.319 0.319 0.159 0.638 1.25 1.25 0.625 2.5

100 0.638 0.638 0.159 1.28 2.5 2.5 0.625 5

50 1.28 1.28 0.159 2.55 5 5 0.625 10

12.5 1.28 5.1 0.159 10.2 5 20 0.625 40

6.25 1.28 5.1 0.159 10.2 5 20 0.625 40

1.56 1.28 5.1 0.159 10.2 5 20 0.625 40

Table 137. PULSE_LTCY register (address 0x27) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol pls_ltcy[7:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 138. PULSE_LTCY register (address 0x27) bit description

Field Description

pls_ltcy[7:0] pls_ltcy[7:0] defines the time interval that starts after the first pulse detection where the pulse-detection

function ignores the start of a new pulse.

Table 139. Time step for PULSE_LTCY with HP_FILTER_CUTOFF[pls_hpf_en] = 1

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5

400 1.276 1.276 1.276 1.276 5 5 5 5

200 2.56 2.56 1.276 2.56 10 10 5 10

100 5.1 5.1 1.276 5.1 20 20 5 20

50 10.2 10.2 1.276 10.2 40 40 5 40

12.5 10.2 40.8 1.276 40.8 40 160 5 160

6.25 10.2 40.8 1.276 81.6 40 160 5 320

1.56 10.2 40.8 1.276 81.6 40 160 5 320

Data sheet: Technical data Rev. 8.0 — 25 April 2017 81 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.12.8 PULSE_WIND register (address 0x28)

The time step for the pulse-window counter varies with the selected ODR and power

modes as defined in Table 143 and Table 144. The maximum time value is equal to (time

step @ ODR and power mode) * 255. Please note that when the device is operated in

hybrid mode, the effective ODR is half of what is selected in CTRL_REG1, which will

double the time-step value from what is shown in Table 143 and Table 144.

Table 140. Time step for PULSE_LTCY with HP_FILTER_CUTOFF[pls_hpf_en] = 0

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.318 0.318 0.318 0.318 1.25 1.25 1.25 1.25

400 0.318 0.318 0.318 0.638 1.25 1.25 1.25 2.5

200 0.638 0.638 0.318 1.276 2.5 2.5 1.25 5

100 1.276 1.276 0.318 2.56 5 5 1.25 10

50 2.56 2.56 0.318 5.1 10 10 1.25 20

12.5 2.56 10.2 0.318 20.4 10 40 1.25 80

6.25 2.56 10.2 0.318 20.4 10 40 1.25 80

1.56 2.56 10.2 0.318 20.4 10 40 1.25 80

Table 141. PULSE_WIND register (address 0x28) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol pls_wind[7:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 142. PULSE_WIND register (address 0x28) bit description

Field Description

pls_wind[7:0] pls_wind[7:0] defines the maximum interval of time that can elapse after the end of the latency interval in

which the start of the second pulse event must be detected provided the device has been configured for

double pulse detection. The detected second pulse width must be shorter than the time limit constraint

specified by the PULSE_TMLT register, but the end of the double pulse need not finish within the time

specified by the PULSE_WIND register.

Table 143. Time step for PULSE_WIND with HP_FILTER_CUTOFF[pls_hpf_en] = 1

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5

400 1.276 1.276 1.276 1.276 5 5 5 5

200 2.56 2.56 1.276 2.56 10 10 5 10

100 5.1 5.1 1.276 5.1 20 20 5 20

50 10.2 10.2 1.276 10.2 40 40 5 40

12.5 10.2 40.8 1.276 40.8 40 160 5 160

6.25 10.2 40.8 1.276 81.6 40 160 5 320

1.56 10.2 40.8 1.276 81.6 40 160 5 320

Data sheet: Technical data Rev. 8.0 — 25 April 2017 82 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.13 Accelerometer offset correction registers

The 8-bit 2’s complement offset correction registers are used to remove the sensor zero-g

offset on the X, Y, and Z axes after device board mount. The resolution of the offset

registers is 2 mg per LSB, with an effective offset adjustment range of –256 mg to

+254 mg for each axis. The acceleration vectors represented in these registers will be

added to the acceleration vectors acquired by the ASIC from the transducer prior to being

written to the output data registers (registers 0x01 through 0x06). For example, to correct

for an offset of 60 mg, a value representing –60 mg (= –60 mg/2 mg/LSB = –30 LSB),

which is 0xE2 in 8-bit 2's complement representation, should be written to the offset

For more information on how to calibrate the zero-g offset, please refer to NXP application

note AN4069.

NOTE

Accelerometer offset registers can only be modified when the device

is in standby mode (See “M_CTRL_REG1 register (address 0x5B)” on

page 96.)

14.13.1 OFF_X register (address 0x2F)

Table 144. Time step for PULSE_WIND with HP_FILTER_CUTOFF[pls_hpf_en] = 0

ODR (Hz) Max time range (s) Time step (ms)

Normal LPLN High

resolution

Low power Normal LPLN High

resolution

800 0.318 0.318 0.318 0.318 1.25 1.25 1.25 1.25

400 0.318 0.318 0.318 0.638 1.25 1.25 1.25 2.5

200 0.638 0.638 0.318 1.276 2.5 2.5 1.25 5

100 1.276 1.276 0.318 2.56 5 5 1.25 10

50 2.56 2.56 0.318 5.1 10 10 1.25 20

12.5 2.56 10.2 0.318 20.4 10 40 1.25 80

6.25 2.56 10.2 0.318 20.4 10 40 1.25 80

1.56 2.56 10.2 0.318 20.4 10 40 1.25 80

Table 145. OFF_X register (address 0x2F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol off_x[7:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 146. OFF_X register (address 0x2F) bit description

Field Description

off_x[7:0] X-axis offset correction value expressed as an 8-bit 2's complement number.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 83 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.13.2 OFF_Y register (address 0x30)

14.13.3 OFF_Z register (address 0x31)

14.14 Magnetometer data registers

14.14.1 M_DR_STATUS register (address 0x32)

Magnetic data-ready status register.

This register indicates the real-time status information of the X, Y, and Z magnetic sample

data.

Table 147. OFF_Y register (address 0x30) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol off_y[7:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 148. OFF_Y register (address 0x30) bit description

Field Description

off_y[7:0] Y-axis offset correction value expressed as an 8-bit 2's complement number.

Table 149. OFF_Z register (address 0x31) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol off_z[7:0]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 150. OFF_Z register (address 0x31) bit description

Field Description

off_z[7:0] Z-axis offset correction value expressed as an 8-bit 2's complement number.

Table 151. M_DR_STATUS register (address 0x32) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol xyzow zow yow xow xyzdr zdr ydr xdr

Reset 00000 0 0 0

Access RRRRR R R R

Data sheet: Technical data Rev. 8.0 — 25 April 2017 84 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Table 152. M_DR_STATUS register (address 0x32) bit descriptions

Field Description

zyxow zyxow is set to one whenever new magnetic data is acquired before completing the retrieval of the previous

data set. This event occurs when the content of at least one magnetometer output data register (that is,

M_OUT_X/Y/Z) has been overwritten. zyxow is cleared when the most significant bytes of the

magnetometer data (M_OUT_X_MSB, M_OUT_Y_MSB, and M_OUT_Z_MSB) are read.

X, Y, and Z-axis data overwrite:

0 – No data overwrite has occurred

1 – Previous X, Y, and Z-magnetic data was overwritten by new X, Y, and Z data before it was completely

read

zow zow is set to 1 whenever a new Z-axis acquisition is completed before the retrieval of the previous data.

When this occurs the previous data is overwritten. zow is cleared anytime the M_OUT_Z_MSB register is

read.

Z-axis data overwrite:

0 – No data overwrite has occurred

1 – Previous Z-axis magnetic data was overwritten by new Z-axis data before it was read

yow yow is set to 1 whenever a new Y-axis acquisition is completed before the retrieval of the previous data.

When this occurs the previous data is overwritten. yow is cleared anytime M_OUT_Y_MSB register is read.

Y-axis data overwrite:

0 – No data overwrite has occurred

1 – Previous Y-axis magnetic data was overwritten by new Y-axis data before it was read

xow xow is set to 1 whenever a new X-axis acquisition is completed before the retrieval of the previous data.

When this occurs the previous data is overwritten. xow is cleared anytime the M_OUT_X_MSB register is

read.

X-axis data overwrite:

0 – No data overwrite has occurred

1 – Previous X-axis magnetic data was overwritten by new X-axis data before it was read

zyxdr zyxdr signals that a new acquisition for the X, Y, and Z axes magnetic data is available. zyxdr is cleared

when the most significant bytes of the magnetometer data (M_OUT_X_MSB, M_OUT_Y_MSB, and

M_OUT_Z_MSB) are read.

X, Y, and Z new data available:

0 – No new set of X, Y, and Z magnetic data is available

1 – A new set of X, Y, an Z magnetic data is available

zdr zdr is set to 1 whenever a new Z-axis data acquisition is completed. zdr is cleared anytime the

M_OUT_Z_MSB register is read. Z-axis new data available:

0 – No new Z-axis magnetic data is available

1 – New Z-axis magnetic data is available

ydr ydr is set to 1 whenever a new Y-axis data acquisition is completed. ydr is cleared anytime the

M_OUT_Y_MSB register is read. Y-axis new data available:

0 – No new Y-axis magnetic data is available

1 – New Y-axis magnetic data is available

xdr xdr is set to 1 whenever a new X-axis data acquisition is completed. xdr is cleared anytime the

M_OUT_X_MSB register is read. X-axis new data available:

0 – No new X-axis magnetic data is available.

1 – New X-axis magnetic data is available

Data sheet: Technical data Rev. 8.0 — 25 April 2017 85 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.14.2 M_OUT_X_MSB, M_OUT_X_LSB, M_OUT_Y_MSB, M_OUT_Y_LSB,

M_OUT_Z_MSB, M_OUT_Z_LSB registers (addresses 0x33 to 0x38)

X-axis, Y-axis, and Z-axis 16-bit magnetic output data expressed as 2's complement

numbers, with a resolution of 0.1 μT/LSB.

Table 153. M_OUT_X_MSB register (address 0x33) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_out_x[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 154. M_OUT_X_LSB register (address 0x34) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_out_x[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 155. M_OUT_Y_MSB register (address 0x35) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_out_y[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 156. M_OUT_Y_LSB register (address 0x36) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_out_y[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 157. M_OUT_Z_MSB register (address 0x37) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_out_z[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 158. M_OUT_Z_LSB register (address 0x38) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_out_z[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Data sheet: Technical data Rev. 8.0 — 25 April 2017 86 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.14.3 CMP_X_MSB, CMP_X_LSB, CMP_Y_MSB, CMP_Y_LSB, CMP_Z_MSB,

CMP_Z_LSB (addresses 0x39 to 0x3E) registers

These registers contain the 2’s complement 14-bit decimated acceleration values, and are

time aligned with the magnetometer sample data. The decimation is controlled by the

ODR (CTRL_REG1 dr[2:0]) and the magnetometer OSR (M_CTRL_REG1 m_os[2:0])

settings. These registers allow the host application to acquire a complete set of

time-aligned magnetic and acceleration data with the same oversampling ratio applied to

each axis. Note that unlike the acceleration data available in the OUT_X/Y/Z registers

located at addresses 0x1 through 0x6, the data in the CMP_X/Y/Z registers is right

justified.

Table 159. CMP_X_MSB register (address 0x39) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - cmp_x[13:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 160. CMP_X_LSB register (address 0x3A) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol cmp_x[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 161. CMP_Y_MSB register (address 0x3B) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - cmp_y[13:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 162. CMP_Y_LSB register (address 0x3C) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol cmp_y[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 163. CMP_Z_MSB register (address 0x3D) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - cmp_z[13:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 164. CMP_Z_LSB register (address 0x3E) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol cmp_z[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Data sheet: Technical data Rev. 8.0 — 25 April 2017 87 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.14.4 MAX_X_MSB, MAX_X_LSB, MAX_Y_MSB, MAX_Y_LSB, MAX_Z_MSB

(addresses 0x45 to 0x49), MAX_Z_LSB (address 0x4A) registers

The magnetometer MAX_X/Y/Z registers are 16-bit 2's complement format with a

resolution of 0.1 μT/LSB. The registers are read/write and along with the MIN_X/Y/Z

registers are used to calculate the magnetic offset for each axis using the equation

(MAX_X/Y/Z + MIN_X/Y/Z) /2 when M_CTRL_REG2[maxmin_dis] = 0 (default).

When M_CTRL_REG1[m_acal] = 1 (default 0), the MAG_OFF_X/Y/Z registers are

automatically updated with the calculated offset values at the end of every measurement

cycle (ODR period).

On a POR, or after setting M_CTRL_REG2[maxmin_rst] = 1, the MAX_X/Y/Z registers are

loaded with the hex value 0x8000 (negative full scale).

The host application may write to the MAX_X/Y/Z registers to change the currently used

maximum values for each axis, however, when M_CTRL_REG1[maxmin_dis] = 0

(default), the system will overwrite these values when it updates the MAX_X/Y/Z registers

at the end of the next measurement cycle (ODR period).

Table 165. MAX_X_MSB register (address 0x45) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol max_x[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 166. MAX_X_LSB register (address 0x46) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol max_x[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 167. MAX_Y_MSB register (address 0x47) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol max_y[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 168. MAX_Y_LSB register (address 0x48) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol max_y[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 169. MAX_Z_MSB register (address 0x49) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol max_z[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Data sheet: Technical data Rev. 8.0 — 25 April 2017 88 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.14.5 MIN_X_MSB, MIN_X_LSB, MIN_Y_MSB, MIN_Y_LSB, MIN_Z_MSB

(addresses 0x4B to 0x4F), MIN_Z_LSB (address 0x50) registers

The magnetometer MIN_X/Y/Z registers are 16-bit, 2's complement format with a

resolution of 0.1 μT/LSB. The registers are read/write and along with the MAX_X/Y/Z

registers are used to calculate the magnetic offset for each axis using the equation

(MAX_X/Y/Z + MIN_X/Y/Z) /2 when M_CTRL_REG2[maxmin_dis] = 0 (default).

When M_CTRL_REG1[m_acal] = 1 (default 0), the MAG_OFF_X/Y/Z registers are

automatically updated with the calculated offset values at the end of every measurement

cycle (ODR period).

On a POR, or after setting M_CTRL_REG2[maxmin_rst] = 1, the MIN_X/Y/Z registers are

loaded with the hex value 0x7FFF (positive full scale). The host application may write to

the MIN_X/Y/Z registers to change the currently used minimum values for each axis,

however, when M_CTRL_REG1[maxmin_dis] = 0 (default), the system will overwrite

these values when it updates the MIN_X/Y/Z registers at the end of the next measurement

cycle (ODR period).

Table 170. MAX_Z_LSB register (address 0x4A) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol max_z[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 171. MIN_X_MSB register (address 0x4B) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol min_x[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 172. MIN_X_LSB register (address 0x4C) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol min_x[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 173. MIN_Y_MSB register (address 0x4D) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol min_y[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 174. MIN_Y_LSB register (address 0x4E) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol min_y[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Data sheet: Technical data Rev. 8.0 — 25 April 2017 89 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.15 Magnetometer offset correction registers

14.15.1 M_OFF_X_MSB (address 0x3F), M_OFF_X_LSB, M_OFF_Y_MSB,

M_OFF_Y_LSB, M_OFF_Z_MSB, M_OFF_Z_LSB (addresses 0x40 to 0x44)

registers

The zero-field output for each axis can be adjusted by writing to these registers. The user

must set M_CTRL_REG3[m_raw] = 0 (default) for the values in these registers to have

any effect on the magnetic output data.

Desired offset should to be written into the 15 most-significant bits in each register pair

using 2's complement representation. The offset registers have a sensitivity of 0.1 μT/LSB

and with an effective offset adjustment range of –1638.4 μT to +1638.3 μT.

The magnetic field vectors represented in these registers will be subtracted from the

magnetic field vectors acquired by the ASIC from the transducer prior to being written to

the output data registers (registers 0x33 through 0x38). For example, to correct for an

offset of 60 μT, a value representing 60 μT (= 60 μT / 0.1 μT/LSB = 600 LSB), which is

0x0258 in 15-bit two's complement representation, should be written to the offset registers

following a left-shift for proper alignment (0x0258<<1 = 0x04b0).

Table 175. MIN_Z_MSB register (address 0x4F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol min_z[15:8]

Reset 00000 0 0 0

Access RRRRR R R R

Table 176. MIN_Z_LSB register (address 0x50) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol min_z[7:0]

Reset 00000 0 0 0

Access RRRRR R R R

Table 177. M_OFF_X_MSB register (address 0x3F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_off_x[14:7]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 178. M_OFF_X_LSB register (address 0x40) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_off_x[6:0] -

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 90 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.16 Magnetometer threshold function registers

The magnetometer threshold function works in a similar manner to the freefall/motion

detection module but uses magnetic data for the event detection instead of acceleration

data. The m_ths_oae bit setting determines the logic used to evaluate the threshold

detection function for the enabled axes. With m_ths_oae = 0, the magnetic sample data

for each enabled axis must be below the threshold values specified in the

MAG_THS_X/Y/Z registers for the time period specified in MAG_THS_COUNT before the

event flag is triggered. For m_ths_oae = 1, any of the enabled axes must be above the

threshold values specified in the MAG_THS_X/Y/Z registers for the time period specified

in MAG_THS_COUNT before the event flag is triggered.

14.16.1 M_THS_CFG register (address 0x52)

Magnetic-field threshold detection configuration register.

Table 179. M_OFF_Y_MSB register (address 0x41) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_off_y[14:7]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 180. M_OFF_Y_LSB register (address 0x42) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_off_y[6:0] -

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 181. M_OFF_Z_MSB register (address 0x43) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_off_z[14:7]

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 182. M_OFF_Z_LSB register (address 0x44) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_off_z6:0] -

Reset 00000 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 183. M_THS_CFG register (address 0x52) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_ele m_ths_oae m_ths_zefe m_ths_yefe m_ths_xefe m_ths_wake_en m_ths_int_en m_ths_int_cfg

Reset 00 0 0 0 0 0 0

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 91 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

The unsigned 15-bit M_THS_X/Y/Z registers hold the threshold used for magnetic-event

detection. With M_THS_CFG [m_ths_oae] = 0, the event is detected when all of the

enabled axes are below or equal to their respective threshold values (AND condition).

With M_THS_CFG [m_ths_oae] = 1, the event is detected when any of the enabled axes

is above or equal to their respective threshold value (OR condition).

NOTE

The thresholds for each axis are applied on the magnetic data before

it is corrected for the offset values stored in the M_OFF_X/Y/Z

registers (when M_CTRL_REG3[m_raw] = 0). To apply thresholds on

the user offset corrected data, it has to be implemented manually in

the application software running on the MCU.

Table 184. M_THS_CFG register (address 0x52) bit descriptions

Field Description

m_ths_ele Magnetic-threshold event latch enable.

0 – Event flag latch disabled. Magnetic-threshold events are not latched, and the event flag will change

state with the real-time status of the event detection logic.

1 – Event flag latch enabled. Magnetic-threshold events are latched and the event flag can only be

cleared by reading the M_THS_SRC register.

m_ths_oae Magnetic-threshold event logic selection.

0 – Logical “AND” of enabled axes X, Y, and Z below threshold flags is used to detect the event.

1 – Logical “OR” of enabled axes X, Y, and Z above threshold flags is used to detect the event.

m_ths_zefe Event-flag enable on Z-axis.

0 – Z-axis event detection disabled

1 – Raise event flag on measured magnetic field value above/below preset threshold for Z-axis

m_ths_yefe Event-flag enable on Y-axis.

0 – Y-axis event detection disabled

1 – Raise event flag on measured magnetic field value above/below preset threshold for Y-axis

m_ths_xefe Event-flag enable on X-axis.

0 – X-axis event detection disabled

1 – Raise event flag on measured magnetic field value above/below preset threshold for X-axis

m_ths_wake_en 0 – The system excludes the magnetic-threshold event flag when evaluating the auto-sleep/wake

function.

1 – The system includes the magnetic-threshold event flag when evaluating the auto-sleep/wake function.

m_ths_int_en 0 – Magnetic-threshold interrupt is disabled.

1 – Magnetic-threshold interrupt is enabled.

m_ths_int_cfg 0 – Magnetic-threshold event flag is output on INT2 pin (logically OR'd with other INT2 interrupt events)

1 – Magnetic-threshold event flag is output on INT1 pin (logically OR'd with other INT1 interrupt events)

Data sheet: Technical data Rev. 8.0 — 25 April 2017 92 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.16.2 M_THS_SRC register (address 0x53)

Magnetic-threshold interrupt source register.

This register keeps track of the magnetic threshold event which is triggering (or has

triggered, when M_THS_CFG[m_ths_ele] = 1) the event flag. In particular, if

M_THS_SRC[m_ths_ea] is set to a logic ‘1’ then the logical combination of

magnetic-event flags specified in M_THS_CFG is true.

Fig 18. Illustration of magnetic threshold detection

0 Field

-Full Scal e

+ Full Scale

Threshold +

Threshold -

X (Y , Z) High

X (Y, Z) High

Larger Field

Smaller Field

X, Y, Z above threshold (positive)

X, Y, Z below threshold (negative)

Table 185. M_THS_SRC register (address 0x53) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_ea - m_ths_zhe m_ths_zhp m_ths_yhe m_ths_yhp m_ths_xhe m_ths_xhp

Reset 00000 0 0 0

Access RRRRR R R R

Table 186. M_THS_SRC register (address 0x53) bit descriptions

Field Description

m_ths_ea Event-active flag.

0 – No event flag has been asserted

1 – One or more event flag(s) has been asserted.

m_ths_zhe Z-high event flag.

0 – No event detected

1 – Z-high event has been detected

This bit always reads zero if the m_ths_zefe control bit is set to zero

m_ths_zhp Z-high event polarity flag.

0 – Z event detected was positive polarity

1 – Z event detected was negative polarity

This bit always reads zero if the m_ths_zefe control bit is set to zero

Data sheet: Technical data Rev. 8.0 — 25 April 2017 93 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.16.3 M_THS_X_MSB, M_THS_X_LSB, M_THS_Y_MSB, M_THS_Y_LSB,

M_THS_Z_MSB, M_THS_Z_LSB (addresses 0x54 to 0x59) registers

The M_THS_X/Y/Z registers contain the unsigned 15-bit magnetic thresholds used by the

magnetic-threshold function. Each register has a resolution of 0.1 μT/LSB. The thresholds

for each axis are applied on the magnetic data before it is adjusted by the offset values

stored in the M_OFF_X/Y/Z registers (when M_CTRL_REG3[m_raw] = 0). To apply

thresholds on the user offset corrected data, it has to be implemented manually in the

application

m_ths_yhe Y-high event flag.

0 – No event detected

1 – Y-high event has been detected

This bit always reads zero if the m_ths_yefe control bit is set to zero

m_ths_yhp Y-high event polarity flag.

0 – Y event detected was positive polarity

1 – Y event detected was negative polarity

This bit always reads zero if the m_ths_yefe control bit is set to zero

m_ths_xhe X-high event flag.

0 – No event detected

1 – X-high event has been detected

This bit always reads zero if the m_ths_xefe control bit is set to zero

m_ths_xhp X-high event polarity flag.

0 – X event detected was positive polarity

1 – X event detected was negative polarity.

This bit always reads zero if the m_ths_xefe control bit is set to zero

Table 186. M_THS_SRC register (address 0x53) bit descriptions - ¶continued

Field Description

Table 187. M_THS_X_MSB register (address 0x54) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_dbcntm m_ths_x[14:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 188. M_THS_X_MSB register (address 0x54) bit descriptions

Field Description

m_ths_dbcntm The m_ths_dbcntm bit configures the way in which the debounce counter is reset when the magnetic

event of interest is momentarily not true.

When m_ths_dbcntm = 1, the debounce counter is cleared to 0 whenever the magnetic event of interest

is no longer true.

When m_ths_dbcntm = 0, the debounce counter is decremented by 1 whenever the magnetic event of

interest is no longer true.

m_ths_x[14:8] Upper 7 bits of the 15-bit unsigned X-axis magnetic threshold.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 94 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.16.4 M_THS_COUNT register (address 0x5A)

This register sets the number of debounce sample counts required before a magnetic

threshold event is triggered.The behavior of the debounce counter is controlled by

M_THS_X_MSB [m_ths_dbcntm].

Table 189. M_THS_X_LSB register (address 0x55) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_x[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 190. M_THS_Y_MSB register (address 0x56) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - m_ths_y[14:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 191. M_THS_Y_LSB register (address 0x57) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_y[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 192. M_THS_Z_MSB register (address 0x58) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - m_ths_z[14:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 193. M_THS_Z_LSB register (address 0x59) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_z[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 194. M_THS_COUNT register (address 0x5A) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_ths_cnt[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 195. M_THS_COUNT register (address 0x5A) bit description

Field Description

m_ths_cnt[7:0] Magnetic threshold debounce count value.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 95 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

When the internal debounce counter reaches the M_THS_COUNT value a magnetic

event flag is set. The debounce counter will never increase beyond the M_THS_COUNT

value. The time step used for the debounce sample count depends on the chosen ODR.

When hybrid mode is enabled, the effective ODR is reduced by a factor of two, which

increases the debounce counter time step by a factor of two from what is shown in Table

196.

For example, an ODR of 100 Hz and a M_THS_COUNT value of 15 would result in a

debounce response time of 150 ms. In hybrid mode, the same settings would result in a

debounce response time of 300 ms.

Table 196. M_THS_COUNT relationship with the ODR

ODR (Hz) Time step (ms)

M_CTRL_REG1[m_hms] = 0b01 M_CTRL_REG1[m_hms] = 0b11

800 N/A N/A

400 2.5 5

200 5 10

100 10 20

50 20 40

12.5 80 160

6.25 160 320

1.56 641 1282

Data sheet: Technical data Rev. 8.0 — 25 April 2017 96 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.17 Magnetometer control registers

14.17.1 M_CTRL_REG1 register (address 0x5B)

Fig 19. DBCNTM bit function

Magnetic Event

Count Threshold

FF Counter

Magnetic Event

Count Threshold

(a)

Debounce Counter

Magnetic Event

Count Threshold

MAG_THS_X_MSB[m_ths_dbcntm] = 1

(b)

MAG_THS_X_MSB[m_ths_dbcntm] = 0

(c)

Debounce Counter

Table 197. M_CTRL_REG1 register (address 0x5B) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_acal m_rst m_ost m_os[2:0] m_hms[1:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 97 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] When operating in hybrid mode, the effective ODR for each sensor is half of the frequency selected in the

CTRL_REG1[dr] and CTRL_REG1[aslp_rate] bit fields.

The m_os[2:0] OSR setting along with the system ODR value set in CTRL_REG1

determines the magnetic output data update rate.

When m_hms[1:0] = 2'b11, magnetic output data is available in registers M_OUT_X_MSB

(0x33), M_OUT_X_LSB (0x34), M_OUT_Y_MSB (0x35), M_OUT_Y_LSB (0x36),

M_OUT_Z_MSB (0x37), and M_OUT_Z_LSB (0x38) along with the time synchronized

accelerometer data in CMP_X_MSB (0x39), CMP_X_LSB (0x3A), CMP_Y_MSB (0x3B),

CMP_Y_LSB (0x3C), CMP_Z_MSB (0x3D), and CMP_Z_LSB (0x3E).

NOTE

Switching time from hybrid- or magnetometer-only mode (in active

mode), to standby mode (after configuring it to standby mode) varies

from 0 to 300 msec.

To eliminate a fixed amount of wait time for the device to go into

standby mode:

•Configure the device into standby mode.

•Continously poll the SYSMOD (0x0B) register to check whether the device

has gone to standby mode.

14.17.2 M_CTRL_REG2 register (address 0x5C)

Table 198. M_CTRL_REG1 register (address 0x5B) bit descriptions

Field Description

m_acal Magnetic hard-iron offset auto-calibration enable:

0 – Auto-calibration feature disabled

1 – Auto-calibration feature is enabled; the ASIC uses the maximum and minimum magnetic data

to determine the hard iron offset value. The M_OFF_X/Y/Z registers are automatically loaded with

(MAX_X/Y/Z + MIN_X/Y/Z)/2 for each axis at the end of every ODR cycle.

m_rst One-shot magnetic reset degauss control bit:

0 – No magnetic sensor reset is active

1 – One-shot magnetic reset is enabled, hardware cleared when complete.

m_ost One-shot triggered magnetic measurement mode:

0 – No action taken, or one-shot measurement complete.

1 – If device is in active mode no action is taken. If device is in standby mode, take one set of

magnetic measurements, clear this bit, and return to standby mode.

m_os[2:0] Oversample ratio (OSR) for magnetometer data (see Table 203).

m_hms[1:0] 0b00 – Only accelerometer sensor is active

0b01 – Only magnetometer sensor is active

0b11 – Hybrid mode, both accelerometer and magnetometer sensors are active[1]

Table 199. M_CTRL_REG2 register (address 0x5C) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - hyb_autoinc

_mode

m_maxmin_

dis

m_maxmin_

dis_ths

m_maxmin_

rst

m_rst_cnt[1:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 98 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.17.3 M_CTRL_REG3 register (address 0x5D)

Table 200. M_CTRL_REG2 register (address 0x5C) bit descriptions

Field Description

hyb_autoinc_mode With hyb_autoinc_mode = 1 and fast-read mode is disabled (CTRL_REG1 [f_read] = 0), the

enabled (CTRL_REG1[f_read = 1) the register address will automatically advance to register 0x33

(M_OUT_X_MSB) after reading register 0x05 (OUT_Z_MSB) during a burst-read mode. Refer to

the register map auto-increment address column for further information.

m_maxmin_dis Magnetic measurement max/min detection function disable:

0 – Magnetic min/max detection function is enabled (default).

1 – Magnetic min/max detection function is disabled.

When enabled, the magnetic min/max detection function will update the MAX_X/Y/Z and

MIN_X/Y/Z

registers at the end of each ODR cycle with the maximum and minimum magnetic measurements

from each axis. This is used along with the auto-cal feature (M_CTRL_REG1[m_acal] = 1) as a

hardware based hard-iron offset compensation function.

m_maxmin_dis_ths Magnetic measurement min/max detection function disable using the magnetic threshold event

trigger:

0 – No impact to magnetic min/max detection function on a magnetic threshold event

1 – Magnetic min/max detection function is disabled when magnetic threshold event is triggered

m_maxmin_rst Magnetic measurement min/max detection function reset:

0 – No reset sequence is active

1 – Setting this bit resets the MIN_X/Y/Z and MAX_X/Y/Z registers to 0x7FFF and 0x8000,

respectively (positive and negative full-scale values).This bit is automatically cleared after the reset

is completed.

m_rst_cnt[1:0] Magnetic sensor reset (degaussing) frequency:

0b00 – Automatic magnetic reset at the beginning of each ODR cycle (default).

0b01 – Automatic magnetic reset every 16 ODR cycles.

0b10 – Automatic magnetic reset every 512 ODR cycles.

0b11 – Automatic magnetic reset is disabled. Magnetic reset only occurs automatically on a

transition from standby to active mode, or can be triggered manually by setting

M_CTRL_REG1[m_rst] = 1

Table 201. M_CTRL_REG3 register (address 0x5D) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_raw m_aslp_os[2:0] m_ths_xyz_

update

Reserved[2:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 99 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.17.4 M_INT_SRC register (address 0x5E)

Table 202. M_CTRL_REG3 register (address 0x5D) bit descriptions

Field Description

m_raw Magnetic measurement RAW mode enable:

0 – Values stored in the M_OFF_X/Y/Z registers are applied to the magnetic sample data. This bit

must be cleared in order for the automatic hard-iron compensation function to have any effect.

1 – Values stored in M_OFF_X/Y/Z are not applied to the magnetic sample data; automatic

hard-iron compensation function does not have any effect on the output data.

m_aslp_os[2:0] Defines magnetometer OSR in auto-sleep mode. See Table 203.

m_ths_xyz_update This control bit defines which reference values are updated when the magnetic threshold event

detection function triggers.

0 – X, Y and Z reference values are all updated when the function triggers on any of the X, Y, or Z

axes.

1 – Only the reference value for the axis that triggered the detection event is updated.

Table 203. M-cell OSR versus ODR

ODR (Hz) OSR = 0 OSR = 1 OSR = 2 OSR = 3 OSR = 4 OSR = 5 OSR = 6 OSR = 7

1.56 16 16 32 64 128 256 512 1024

6.25 4 4 8 16 32 64 128 256

12.52248163264128

502222481632

100222224816

20022222248

40022222224

80022222222

Table 204. M_INT_SRC register (address 0x5E) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol - - - - - src_m_ths src_m_vecm src_m_drdy

Reset 0000000 0

Access RRRRRRR R

Table 205. M_INT_SRC register (address 0x5E) bit description

Field Description

src_m_ths Magnetic threshold interrupt flag:

0 – Magnetic threshold event has not been detected.

1 – Magnetic threshold event has been detected.

src_m_vecm Magnetic vector-magnitude interrupt flag:

0 – Magnetic vector-magnitude change event has not been detected.

1 – Magnetic vector-magnitude change event has been detected.

src_m_drdy Magnetic data-ready interrupt flag:

0 – No new magnetic data is available.

1 – New magnetic data is available.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 100 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.18 Magnetometer vector-magnitude function registers

The magnetometer vector-magnitude function will generate an interrupt when

> M_VECM_THS

value and t > M_VECM_CNT value. Where m_x_out, m_y_out, and m_z_out are the

current decimated magnetometer output values, and m_x_ref, m_y_ref, and m_z_ref are

the internally latched reference values. The user may program the M_VECM_THS and

M_VECM_CNT registers to establish the conditions needed to detect a magnetic

vector-magnitude change event. Depending on the values chosen for the reference

values, this function may be configured to detect a magnetic field magnitude that is above

a preset threshold (with reference values = 0), or a change in magnitude between two

magnetic vectors greater than the preset threshold (with reference values non-zero).

Please note x_ref, y_ref, z_ref are stored internally and are not observable by the user

through the register interface. Refer to NXP application note AN4458.

14.18.1 M_VECM_CFG register (address 0x69)

m_x_out m_x_ref–()

2m_y_out m_y_ref–()

2m_z_out m_z_ref–()

Table 206. M_VECM_CFG register (address 0x69) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol —m_vecm_

ele

m_vecm_

initm

m_vecm_

updm

m_vecm_en m_vecm_

wake_en

m_vecm_

init_en

m_vecm_

init_cfg

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 207. M_VECM_CFG register (address 0x69) bit descriptions

Field Description

m_vecm_ele Magnetic vector-magnitude event latch enable:

0 – Event latch disabled

1 – Event latch enabled

With event latching enabled, the src_m_vecm interrupt flag may only be cleared by reading the

M_INT_SRC register. With event latching disabled, the src_m_vecm interrupt flag is updated in real

time and may be cleared by the ASIC prior to the user reading the flag.

m_vecm_initm Magnetic vector-magnitude initialization mode:

0 – The ASIC uses the current magnetic output data as the initial reference values at the time the

m_vecm_en bit is set.

1 – The ASIC uses the data stored in the M_VECM_X/Y/Z_INIT registers as the initial reference values

at the time the m_vecm_en bit is set.

m_vecm_updm Magnetic vector-magnitude reference value update mode:

0 – The function updates the reference values with the current X, Y, and Z magnetic data when the

event is triggered.

1 – The function does not update the reference values when the event is triggered.

Setting m_vecm_initm = 1 and m_vecm_updm = 1 allows the user to manually update the reference

values using the M_VECM_INIT_X/Y/Z registers in real time when the function is enabled.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 101 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.18.2 M_VECM_THS_MSB register (address 0x6A)

14.18.3 M_VECM_THS_LSB register (address 0x6B)

m_vecm_en Magnetic vector-magnitude function enable:

0 – Function is disabled.

1 – Function is enabled, the ASIC will update the internal m_x/y/z_ref registers with either the current

magnetic output data or the values stored in the M_VECM_INIT_X/Y/Z registers depending on the state

of m_vecm_initm.

Note: The magnetic vector-magnitude function will only function correctly up to a maximum ODR of

400 Hz.

m_vecm_wake_en Magnetic vector-magnitude wake enable:

0 – The system excludes the src_m_vecm event flag when evaluating the auto-sleep function.

1 – The system includes the src_m_vecm event flag when evaluating the auto-sleep function.

m_vecm_int_en Magnetic vector-magnitude interrupt enable:

0 – Magnetic vector-magnitude interrupt is disabled.

1 – Magnetic vector-magnitude interrupt is enabled.

m_vecm_init_cfg Magnetic vector-magnitude interrupt configuration:

0 – Magnetic vector-magnitude interrupt is output on INT2 pin.

1 – Magnetic vector-magnitude interrupt is output on INT1 pin.

Table 207. M_VECM_CFG register (address 0x69) bit descriptions - ¶continued

Field Description

Table 208. M_VECM_THS_MSB register (address 0x6A) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_

dbcntm

m_vecm_ths[14:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 209. M_VECM_THS_MSB register (address 0x6A) bit descriptions

Field Description

m_vecm_dbcntm Magnetic vector-magnitude debounce counter mode selection:

0 – The debounce counter is decremented by 1 whenever the current vector-magnitude result is

below the threshold set in M_VECM_THS.

1 – The debounce counter is cleared whenever the current vector-magnitude result is below the

threshold set in M_VECM_THS.

m_vecm_ths[14:8] Seven most significant bits of 15-bit unsigned magnetic vector-magnitude threshold. Resolution is

0.1 μT/LSB.

Table 210. M_VECM_THS_LSB register (address 0x6B) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_ths[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 102 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.18.4 M_VECM_CNT register (address 0x6C)

The debounce timer period is determined by the ODR selected in CTRL_REG1; it is equal

to the number indicated in M_VECM_CNT register times 1/ODR. For example, a value of

16 in M_VECM_CNT with an ODR setting of 400 Hz will result in a debounce period of

40 ms. Note that ODR is halved when in hybrid mode.

14.18.5 M_VECM_INITX_MSB register (address 0x6D)

14.18.6 M_VECM_INITX_LSB register (address 0x6E)

Table 211. M_VECM_CNT register (address 0x6C) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_CNT[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 212. M_VECM_CNT register (address 0x6C) bit description

Field Description

m_vecm_cnt[7:0] Vector-magnitude debounce count value.

Table 213. M_VECM_INITX_MSB register (address 0x6D) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_initx[15:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 214. M_VECM_INITX_MSB register (address 0x6D) bit description

Field Description

m_vecm_initx[15:8] MSB of signed 16-bit initial X-axis value used by the magnetic vector-magnitude function when

M_VECM_CFG[m_vecm_initm] = 1.

Table 215. M_VECM_INITX_LSB register (address 0x6E) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_initx[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 216. M_VECM_INITX_LSB register (address 0x6E) bit description

Field Description

m_vecm_initx[7:0] LSB of signed 16-bit initial X-axis value used by the magnetic vector-magnitude function when

M_VECM_CFG[m_vecm_initm] = 1.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 103 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

14.18.7 M_VECM_INITY_MSB register (address 0x6F)

14.18.8 M_VECM_INITY_LSB register (address 0x70)

14.18.9 M_VECM_INITZ_MSB register (address 0x71)

14.18.10 M_VECM_INITZ_LSB register (address 0x72)

Table 217. M_VECM_INITY_MSB register (address 0x6F) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_inity[15:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 218. M_VECM_INITY_MSB register (address 0x6F) bit description

Field Description

m_vecm_inity[15:8] MSB of signed 16-bit initial Y-axis value used by the magnetic vector-magnitude function when

M_VECM_CFG[m_vecm_initm] = 1.

Table 219. M_VECM_INITY_LSB register (address 0x70) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_inity[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 220. M_VECM_INITY_LSB register (address 0x70) bit description

Field Description

m_vecm_inity[7:0] LSB of signed 16-bit initial Y-axis value used by the magnetic vector-magnitude function when

M_VECM_CFG[m_vecm_initm] = 1.

Table 221. M_VECM_INITZ_MSB register (address 0x71) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_initz[15:8]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Table 222. M_VECM_INITZ_MSB register (address 0x71) bit description

Field Description

m_vecm_initz[15:8] MSB of signed 16-bit initial Z-axis value used by the magnetic vector-magnitude function when

M_VECM_CFG[m_vecm_initm] = 1.

Table 223. M_VECM_INITZ_LSB register (address 0x72) bit allocation

Bit 7 6 5 4 3 2 1 0

Symbol m_vecm_initz[7:0]

Reset 00000000

Access R/W R/W R/W R/W R/W R/W R/W R/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 104 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

15. Package outline

This drawing is located at

http://cache.nxp.com/files/shared/doc/package_info/98ASA00318D.pdf.

Table 224. M_VECM_INITZ_LSB register (address 0x72) bit description

Field Description

m_vecm_initz[7:0] LSB of signed 16-bit initial Z-axis value used by the magnetic vector-magnitude function when

M_VECM_CFG[m_vecm_initm] = 1.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 105 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Fig 20. Package outline 16-lead QFN, 3 mm x 3 mm x 1.2 mm

Data sheet: Technical data Rev. 8.0 — 25 April 2017 106 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Fig 21. Package outline 16-lead QFN, 3 mm x 3 mm x 1.2 mm

Data sheet: Technical data Rev. 8.0 — 25 April 2017 107 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

Fig 22. Package outline 16-lead QFN, 3 mm x 3 mm x 1.2 mm

Data sheet: Technical data Rev. 8.0 — 25 April 2017 108 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

16. Packing information

17. Mounting guidelines for the quad flat no-lead (QFN) package

17.1 Soldering information

The QFN package is compliant with the RoHS standards. Refer to NXP application note

AN4077 for more information.

Printed circuit board (PCB) layout is a critical portion of the total design. The footprint for

the surface mount packages must be the correct size to ensure proper solder connection

interface between the PCB and the package. With the correct footprint, the packages will

self-align when subjected to a solder reflow process.

These guidelines are for soldering and mounting the quad flat no-lead (QFN) package

inertial sensors to PCBs. The purpose is to minimize the stress on the package after

board mounting. The FXOS8700CQ uses the QFN package platform. This section

describes suggested methods of soldering these devices to the PCB for consumer

applications.

Refer to NXP application note AN4247,”Layout Recommendation for PCBs Using a

Magnetometer Sensor” for a technical discussion on hard and soft-iron magnetic

interference and general guidelines on layout and component selection applicable to any

PCB using a magnetometer sensor.

NXP application note AN1902, “Quad Flat Pack No-Lead (QFN) Micro Dual Flat Pack

No-Lead (DFN)” discusses the QFN package used by the FXOS8700CQ, PCB design

guidelines for using QFN packages and temperature profiles for reflow soldering.

17.2 Overview of soldering considerations

Information provided here is based on experiments executed on QFN devices. As they

cannot represent exact conditions present at a customer site, the information provided

herein should be used for guidance only and further process and design optimizations are

Fig 23. Tape and reel

Data sheet: Technical data Rev. 8.0 — 25 April 2017 109 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

recommended to develop an application specific solution. It should be noted that with the

proper PCB footprint and solder stencil designs, the package will self-align during the

solder reflow process.

The QFN package is compliant with the RoHS standards. Please refer to NXP application

note AN4077 for more information.

17.3 Halogen content

This package is designed to be Halogen free, exceeding most industry and customer

standards. Halogen free means that no homogeneous material within the assembled

package will contain chlorine (Cl) in excess of 700 ppm or 0.07% weight/weight or

bromine (Br) in excess of 900 ppm or 0.09% weight/weight.

17.4 PCB mounting recommendations

•The PCB land should be designed with non-solder mask defined (NSMD) as shown in

Figure 24 and Figure 25.

•No additional via pattern underneath package.

•No signal trace underneath package.

•PCB land pad is 0.8 mm by 0.3 mm as shown in Figure 24 and Figure 25.

•Solder mask opening = PCB land pad edge + 0.113 mm larger all around.

•Stencil opening = PCB land pad –0.015 mm smaller all around = 0.77 mm by 0.27

mm.

•Stencil thickness is 100 or 125 μm.

•Do not place any components or vias at a distance less than 2 mm from the package

land area. This may cause additional package stress if it is too close to the package

land area.

•Signal traces connected to pads should be as symmetric as possible. Put dummy

traces on the NC pads in order to have same length of exposed trace for all pads.

•Use a standard pick and place process and equipment. Do not use a hand soldering

process.

•Do not use a screw down or stacking to fix the PCB into an enclosure as this could

bend the PCB, putting stress on the package.

•The PCB should be rated for the multiple lead-free reflow condition with max 260 °C

temperature.

•No copper traces on top layer of PCB under the package. This will cause planarity

issues with board mount. NXP QFN sensors are compliant with Restrictions on

Hazardous Substances (RoHS), having halide-free molding compound (green) and

lead-free terminations. These terminations are compatible with tin-lead (Sn-Pb) as

well as tin-silver-copper (Sn-Ag-Cu) solder paste soldering processes. Reflow profiles

applicable to those processes can be used successfully for soldering the devices.

Data sheet: Technical data Rev. 8.0 — 25 April 2017 110 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

18. Package thermal characteristics

Fig 24. Recommended PCB land pattern, solder mask, and stencil opening near package

footprint

Fig 25. Detailed dimensions

Package Footprint PCB Land Pattern & Stencil

0.467 mm x 0.25 mm

Package

footprint

Solder mask opening

= PCB land pad edge

+ 0.113 mm larger all

around

PCB land pad =

0.8 mm x 0.3 mm

No copper in this area

Stencil opening = PCB land

pad - 0.015 mm smaller all

around

= 0.77 mm x 0.27 mm

Table 225. Thermal resistance data

Rating Description Symbol Value Unit

Junction-to-ambient, natural convection[1][2] Single-layer board RθJA 163 °C/W

Junction-to-ambient, natural convection[1][3] Four-layer board (two signals, two planes) 70

Junction-to-board[4] -R

θJB 33 °C/W

Junction-to-case (top)[5] -R

θJCTop 84 °C/W

Junction-to-package (top)[6] Natural convection ΨJT 6°C/W

Data sheet: Technical data Rev. 8.0 — 25 April 2017 111 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

[1] Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance,

mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components

on the board, and board thermal resistance.

[2] Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.

[3] Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.

[4] Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature

is measured on the top surface of the board near the package.

[5] Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL

SPEC-883 Method 1012.1).

[6] Thermal characterization parameter indicating the temperature difference between package top and the

junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal

characterization parameter is written as Psi-JT.

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  112 of 113
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
19. Revision history
Table 226. Revision history
Document ID Release date Data sheet status Change notice Supersedes
FXOS8700CQ v.8 20170425 Technical data - FXOS8700CQ v.7.0
Modifications: •Corrected bit address in Section 14.1.8 title and table titles to 0x2A.
•Corrected gmax value in Tab l e  8  to 5000.
•Corrected table headings in Table 35 to dr[2], dr[1], dr[0].
•Corrected dr[2:0] = 100 row in Table 35. Corrected Period hybrid mode value to 40.
•Corrected field name in Table 106 to a_vecm_inity[13:8].
•Corrected address range in title of Section 14.14.3 to addresses 0x39 to 0x3E.
•Corrected units in Switching time note in Section 14.17.1 to msec.
•Corrected Section 14.18.1. Replaced all section content.
•Corrected field symbol in Table 223 to m_vecm_initz[7:0].
•Added item “No signal trace underneath package” to Section 17.4.
FXOS8700CQ v.7.0 20160315 Technical data - FXOS8700CQ v.6.0
FXOS8700CQ v.6.0 20150918 Technical data - FXOS8700CQ v.5.0
FXOS8700CQ v.5.0 20150527 Technical data - FXOS8700CQ v.4.1
FXOS8700CQ v.4.1 20150113 Technical data - FXOS8700CQ v.4.0
FXOS8700CQ v.4.0 20140305 Technical data - FXOS8700CQ v.3
FXOS8700CQ v.3 20130719 Technical data - FXOS8700CQ v.2
FXOS8700CQ v.2 20130511 Technical data - FXOS8700CQ v.1
FXOS8700CQ v.1 20120616 Advance information - -

Data sheet: Technical data Rev. 8.0 — 25 April 2017 113 of 113

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

20. Legal information

20.1 Data sheet status

[1] Please consult the most recently issued document before initiating or completing a design.

[2] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status

information is available on the Internet at URL http://www.nxp.com.

20.2 Definitions

Draft – The document is draft version only. The content is still under internal

review and subject to formal approval, which may result in modifications or

additions. NXP Semiconductors does not give any representations or

warranties as to the accuracy or completeness of information included herein

and shall have no liability for the consequences of use of such information.

20.3 Disclaimers

Information in this document is provided solely to enable system and software

implementers to use NXP products. There are no express or implied

circuits based on the information in this document. NXP reserves the right to

make changes without further notice to any products herein.

NXP makes no warranty, representation, or guarantee regarding the

suitability of its products for any particular purpose, nor does NXP assume

any liability arising out of the application or use of any product or circuit, and

specifically disclaims any and all liability, including without limitation

consequential or incidental damages. “Typical” parameters that may be

provided in NXP data sheets and/ or specifications can and do vary in

different applications, and actual performance may vary over time. All

operating parameters, including “typicals,“ must be validated for each

customer application by customer’s technical experts. NXP does not convey

any license under its patent rights nor the rights of others. NXP sells products

pursuant to standard terms and conditions of sale, which can be found at the

following address: nxp.com/salestermsandconditions.

20.4 Trademarks

Notice: All referenced brands, product names, service names and trademarks

are the property of their respective owners.

NXP – is a trademark of NXP B.V.

the NXP logo – is a trademark of NXP B.V.

Freescale – is a trademark of NXP B.V.

the Freescale logo – is a trademark of NXP B.V.

Document status[1] Product status[2] Definition

Product preview Development This document contains certain information on a product under development. Freescale reserves

the right to change or discontinue this product without notice.

Advance information Qualification This document contains information on a new product. Specifications and information herein are

subject to change without notice.

Technical data Production NXP Semiconductors reserves the right to change the detail specifications as may be required to

permit improvements in the design of its products.

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  114 of 116
continued >>
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
Contents
General description . . . . . . . . . . . . . . . . . . . . . .  1
Features and benefits . . . . . . . . . . . . . . . . . . . .  1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . .  2
Ordering information. . . . . . . . . . . . . . . . . . . . .  2
Block diagram  . . . . . . . . . . . . . . . . . . . . . . . . . .  3
Pinning information. . . . . . . . . . . . . . . . . . . . . .  4
1  Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  4
2  Pin description  . . . . . . . . . . . . . . . . . . . . . . . . .  5
Electrical connections. . . . . . . . . . . . . . . . . . . .  5
1  Orientation  . . . . . . . . . . . . . . . . . . . . . . . . . . . .  7
Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . .  7
1  Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  7
2  Zero-g and zero-flux offset . . . . . . . . . . . . . . . .  7
3  Self-test  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
Device characteristics. . . . . . . . . . . . . . . . . . . .  8
1  Accelerometer mechanical characteristics . . . .  8
2 Magnetometer magnetic characteristics . . . . . .  9
3  Hybrid characteristics . . . . . . . . . . . . . . . . . . .  10
4  Electrical characteristics . . . . . . . . . . . . . . . . .  10
5 Absolute maximum ratings . . . . . . . . . . . . . . .  12
Digital interfaces  . . . . . . . . . . . . . . . . . . . . . . .  13
1 I2C interface characteristics . . . . . . . . . . . . . .  13
1.1 General I2C operation. . . . . . . . . . . . . . . . . . .  14
1.2 I2C read/write operations  . . . . . . . . . . . . . . . .  15
2  SPI interface characteristics . . . . . . . . . . . . . .  16
2.1  General SPI operation  . . . . . . . . . . . . . . . . . .  17
2.2  SPI read/write operations . . . . . . . . . . . . . . . .  18
2.3 I2C/SPI auto detection  . . . . . . . . . . . . . . . . . .  18
2.4  Power supply sequencing and I2C/SPI mode 
auto-detection. . . . . . . . . . . . . . . . . . . . . . . . .  19
Modes of operation . . . . . . . . . . . . . . . . . . . . .  19
Embedded functionality  . . . . . . . . . . . . . . . . .  20
1  Factory calibration  . . . . . . . . . . . . . . . . . . . . .  20
2  8-bit or 14-bit accelerometer data. . . . . . . . . .  21
3 Accelerometer low-power modes versus 
high-resolution modes  . . . . . . . . . . . . . . . . . .  21
4  Auto-wake/sleep mode . . . . . . . . . . . . . . . . . .  21
5  Hybrid mode . . . . . . . . . . . . . . . . . . . . . . . . . .  22
6  Accelerometer freefall and motion event detection 
22
6.1  Freefall detection  . . . . . . . . . . . . . . . . . . . . . .  22
6.2  Motion detection . . . . . . . . . . . . . . . . . . . . . . .  22
7  Transient detection . . . . . . . . . . . . . . . . . . . . .  22
8  Pulse detection . . . . . . . . . . . . . . . . . . . . . . . .  23
9  Orientation detection. . . . . . . . . . . . . . . . . . . .  23
10  Acceleration vector-magnitude detection. . . .   23
11  Magnetic vector-magnitude detection  . . . . . .   24
12  Magnetic threshold detection . . . . . . . . . . . . .   24
13 Magnetic min/max detection (autonomous 
calibration)   . . . . . . . . . . . . . . . . . . . . . . . . . .   24
Example FXOS8700CQ driver code. . . . . . . .   25
1  Introduction  . . . . . . . . . . . . . . . . . . . . . . . . . .   25
2  FXOS8700CQ addresses  . . . . . . . . . . . . . . .   25
3  Sensor data structure. . . . . . . . . . . . . . . . . . .   25
4  FXOS8700CQ configuration function. . . . . . .   26
5  Data read function . . . . . . . . . . . . . . . . . . . . .   28
Register descriptions . . . . . . . . . . . . . . . . . . .   29
1  Device configuration registers . . . . . . . . . . . .   37
1.1  STATUS register (address 0x00) . . . . . . . . . .   37
1.2  DR_STATUS register (address 0x00)  . . . . . .   37
1.3  F_STATUS register (address 0x00) . . . . . . . .   39
1.4  TRIG_CFG register (address 0x0A)  . . . . . . .   39
1.5  SYSMOD register (address 0x0B) . . . . . . . . .   40
1.6  INT_SOURCE register (address 0x0C) . . . . .   40
1.7  WHO_AM_I register (address 0x0D) . . . . . . .   42
1.8  CTRL_REG1 register (address 0x2A) . . . . . .   42
1.9  CTRL_REG2 register (address 0x2B) . . . . . .   44
1.10 CTRL_REG3 - interrupt control register (address 
0x2C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   46
1.11  CTRL_REG4 - interrupt enable register (address 
0x2D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   47
1.12  CTRL_REG5 - interrupt routing configuration 
register (address 0x2E) . . . . . . . . . . . . . . . . .   48
2  Auto-sleep trigger register . . . . . . . . . . . . . . .   50
2.1  ASLP_COUNT register (address 0x29) . . . . .   50
3  Temperature register . . . . . . . . . . . . . . . . . . .   52
3.1 TEMP register (address 0x51) . . . . . . . . . . . .   52
4  Accelerometer output data registers  . . . . . . .   52
4.1 OUT_X_MSB, OUT_X_LSB, OUT_Y_MSB, 
OUT_Y_LSB, OUT_Z_MSB, OUT_Z_LSB 
(addresses 0x01 to 0x06) registers . . . . . . . .   52
5 Accelerometer FIFO register . . . . . . . . . . . . .   54
5.1  F_SETUP register (address 0x09). . . . . . . . .   54
6  Accelerometer sensor data configuration register  
55
6.1  XYZ_DATA_CFG register (address 0x0E). . .   55
7 Accelerometer high-pass filter register  . . . . .   56
7.1  HP_FILTER_CUTOFF register (address 0x0F) 56
8  Portrait/landscape detection registers . . . . . .   57
8.1  PL_STATUS register (address 0x10). . . . . . .   58
8.2  PL_CFG register (address 0x11) . . . . . . . . . .   59
8.3  PL_COUNT register (address 0x12) . . . . . . .   59

FXOS8700CQ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Data sheet: Technical data Rev. 8.0 — 25 April 2017  115 of 116
continued >>
NXP Semiconductors FXOS8700CQ
6-axis sensor with integrated linear accelerometer and magnetometer
14.8.4  PL_BF_ZCOMP register (address 0x13) . . . .  60
14.8.5  PL_THS_REG register (address 0x14)  . . . . .  61
14.9  Freefall and motion detection registers. . . . . .  62
14.9.1  A_FFMT_CFG register (address 0x15)  . . . . .  62
14.9.2  A_FFMT_SRC register (address 0x16)  . . . . .  63
14.9.3  A_FFMT_THS register (address 0x17). . . . . .  64
14.9.4 A_FFMT_ THS_X_MSB, A_FFMT_THS_X_LSB, 
A_FFMT_THS_Y_MSB, A_FFMT_THS_Y_LSB, 
A_FFMT_THS_Z_MSB, A_FFMT_THS_Z_LSB 
registers (addresses 0x73 to 0x78)  . . . . . . . .  65
14.9.5  A_FFMT_COUNT register (address 0x18) . . .  67
14.10 Accelerometer vector-magnitude function register 
68
14.10.1  A_VECM_CFG register (address 0x5F) . . . . .  69
14.10.2  A_VECM_THS_MSB (address 0x60) register   69
14.10.3  A_VECM_THS_LSB register (address 0x61).  70
14.10.4  A_VECM_CNT register (address 0x62) . . . . .  70
14.10.5  A_VECM_INITX_MSB register (address 0x63) 70
14.10.6  A_VECM_INITX_LSB register (address 0x64)  71
14.10.7  A_VECM_INITY_MSB register (address 0x65) 71
14.10.8  A_VECM_INITY_LSB register (address 0x66)  71
14.10.9  A_VECM_INITZ_MSB register (address 0x67) 71
14.10.10  A_VECM_INITZ_LSB register (address 0x68)  72
14.11  Transient (AC) acceleration detection registers . . 
72
14.11.1  TRANSIENT_CFG register (address 0x1D)   .  73
14.11.2  TRANSIENT_SRC register (address 0x1E) . .  73
14.11.3  TRANSIENT_THS register (address 0x1F)  . .  74
14.11.4  TRANSIENT_COUNT register (address 0x20) 75
14.12  Pulse detection registers  . . . . . . . . . . . . . . . .  76
14.12.1  PULSE_CFG register (address 0x21)  . . . . . .  76
14.12.2  PULSE_SRC register (address 0x22)  . . . . . .  77
14.12.3  PULSE_THSX register (address 0x23)  . . . . .  78
14.12.4  PULSE_THSY register (address 0x24)  . . . . .  78
14.12.5  PULSE_THSZ register (address 0x25). . . . . .  79
14.12.6  PULSE_TMLT register (address 0x26). . . . . .  79
14.12.7  PULSE_LTCY register (address 0x27). . . . . .  80
14.12.8  PULSE_WIND register (address 0x28)  . . . . .  81
14.13  Accelerometer offset correction registers . . . .  82
14.13.1  OFF_X register (address 0x2F)  . . . . . . . . . . .  82
14.13.2  OFF_Y register (address 0x30)  . . . . . . . . . . .  83
14.13.3  OFF_Z register (address 0x31)  . . . . . . . . . . .  83
14.14  Magnetometer data registers . . . . . . . . . . . . .  83
14.14.1  M_DR_STATUS register (address 0x32) . . . .  83
14.14.2 M_OUT_X_MSB, M_OUT_X_LSB, 
M_OUT_Y_MSB, M_OUT_Y_LSB, 
M_OUT_Z_MSB, M_OUT_Z_LSB registers 
(addresses 0x33 to 0x38) . . . . . . . . . . . . . . . .  85
14.14.3 CMP_X_MSB, CMP_X_LSB, CMP_Y_MSB, 
CMP_Y_LSB, CMP_Z_MSB, CMP_Z_LSB 
(addresses 0x39 to 0x3E) registers . . . . . . . .  86
14.14.4 MAX_X_MSB, MAX_X_LSB, MAX_Y_MSB, 
MAX_Y_LSB, MAX_Z_MSB (addresses 0x45 to 
0x49), MAX_Z_LSB (address 0x4A) registers  87
14.14.5 MIN_X_MSB, MIN_X_LSB, MIN_Y_MSB, 
MIN_Y_LSB, MIN_Z_MSB (addresses 0x4B to 
0x4F), MIN_Z_LSB (address 0x50) registers    88
14.15  Magnetometer offset correction registers. . . .   89
14.15.1 M_OFF_X_MSB (address 0x3F), 
M_OFF_X_LSB, M_OFF_Y_MSB, 
M_OFF_Y_LSB, M_OFF_Z_MSB, 
M_OFF_Z_LSB (addresses 0x40 to 0x44) 
registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . .   89
14.16 Magnetometer threshold function registers . .   90
14.16.1  M_THS_CFG register (address 0x52) . . . . . .   90
14.16.2  M_THS_SRC register (address 0x53) . . . . . .   92
14.16.3 M_THS_X_MSB, M_THS_X_LSB, 
M_THS_Y_MSB, M_THS_Y_LSB, 
M_THS_Z_MSB, M_THS_Z_LSB (addresses 
0x54 to 0x59) registers  . . . . . . . . . . . . . . . . .   93
14.16.4  M_THS_COUNT register (address 0x5A) . . .   94
14.17  Magnetometer control registers . . . . . . . . . . .   96
14.17.1  M_CTRL_REG1 register (address 0x5B)  . . .   96
14.17.2  M_CTRL_REG2 register (address 0x5C)  . . .   97
14.17.3  M_CTRL_REG3 register (address 0x5D)  . . .   98
14.17.4  M_INT_SRC register (address 0x5E)  . . . . . .   99
14.18  Magnetometer vector-magnitude function 
registers . . . . . . . . . . . . . . . . . . . . . . . . . . . .   100
14.18.1  M_VECM_CFG register (address 0x69)  . . .   100
14.18.2  M_VECM_THS_MSB register (address 0x6A)  . .  
101
14.18.3  M_VECM_THS_LSB register (address 0x6B) 101
14.18.4  M_VECM_CNT register (address 0x6C) . . .   102
14.18.5  M_VECM_INITX_MSB register (address 0x6D)  .  
102
14.18.6  M_VECM_INITX_LSB register (address 0x6E) . .  
102
14.18.7  M_VECM_INITY_MSB register (address 0x6F)  .  
103
14.18.8  M_VECM_INITY_LSB register (address 0x70) . .  
103
14.18.9  M_VECM_INITZ_MSB register (address 0x71). .  
103
14.18.10  M_VECM_INITZ_LSB register (address 0x72) . .  
103
15  Package outline. . . . . . . . . . . . . . . . . . . . . . .   104
16  Packing information . . . . . . . . . . . . . . . . . . .   108
17  Mounting guidelines for the quad flat no-lead 
(QFN) package. . . . . . . . . . . . . . . . . . . . . . . .   108
17.1  Soldering information . . . . . . . . . . . . . . . . . .   108
17.2  Overview of soldering considerations  . . . . .   108

NXP Semiconductors FXOS8700CQ

6-axis sensor with integrated linear accelerometer and magnetometer

For more information, please visit: http://www.nxp.com

For sales office addresses, please send an email to: salesaddresses@nxp.com

Date of release: 25 April 2017

Document identifier: FXOS8700CQ

Please be aware that important notices concerning this document and the product(s)

described herein, have been included in section ‘Legal information’.

17.3 Halogen content . . . . . . . . . . . . . . . . . . . . . . 109

17.4 PCB mounting recommendations . . . . . . . . . 109

18 Package thermal characteristics . . . . . . . . . 110

19 Revision history. . . . . . . . . . . . . . . . . . . . . . . 112

20 Legal information. . . . . . . . . . . . . . . . . . . . . . 113