PESD5V0S1BLD Low capacitance bidirectional ESD protection diode Rev. 1 -- 12 October 2010 Product data sheet 1. Product profile 1.1 General description Low capacitance bidirectional ElectroStatic Discharge (ESD) protection diode designed to protect one signal line from the damage caused by ESD and other transients. The device is housed in a SOD882D leadless ultra small Surface-Mounted Device (SMD) plastic package with visible and solderable side pads. 1.2 Features and benefits Bidirectional ESD protection of one line Ultra small SMD plastic package Solderable side pads Package height typ. 0.37 mm Low clamping voltage: VCL = 14 V AEC-Q101 qualified ESD protection up to 30 kV IEC 61000-4-2; level 4 (ESD) IEC 61000-4-5 (surge); IPP = 12 A Max. peak pulse power: PPP = 130 W Ultra low leakage current: IRM = 5 nA 1.3 Applications Computers and peripherals Audio and video equipment Cellular handsets and accessories Communication systems Portable electronics 1.4 Quick reference data Table 1. Quick reference data Tamb = 25 C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit - - 5.0 V - 35 45 pF Per diode VRWM reverse standoff voltage Cd diode capacitance f = 1 MHz; VR = 0 V PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 2. Pinning information Table 2. Pinning Pin Description 1 cathode 1 2 cathode 2 Simplified outline Graphic symbol [1] 1 1 2 2 006aab041 Transparent top view [1] The marking bar indicates cathode 1. 3. Ordering information Table 3. Ordering information Type number Package PESD5V0S1BLD Name Description Version - leadless ultra small plastic package; 2 terminals; body 1.0 x 0.6 x 0.4 mm SOD882D 4. Marking Table 4. Marking codes Type number Marking code[1] PESD5V0S1BLD 1100 0000 [1] For SOD882D binary marking code description, see Figure 1. 4.1 Binary marking code description CATHODE BAR READING DIRECTION VENDOR CODE READING EXAMPLE: 0111 1011 MARKING CODE (EXAMPLE) READING DIRECTION 006aac477 Fig 1. PESD5V0S1BLD Product data sheet SOD882D binary marking code description All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 2 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 5. Limiting values Table 5. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit PPP peak pulse power tp = 8/20 s [1] IPP peak pulse current tp = 8/20 s - 130 W [1] - 12 A Tj junction temperature - 150 C Tamb ambient temperature -55 +150 C Tstg storage temperature -65 +150 C Per diode [1] Non-repetitive current pulse 8/20 s exponential decay waveform according to IEC 61000-4-5. Table 6. ESD maximum ratings Tamb = 25 C unless otherwise specified. Symbol VESD Parameter Conditions electrostatic discharge voltage IEC 61000-4-2 (contact discharge) MIL-STD-883 (human body model) [1] Device stressed with ten non-repetitive ESD pulses. [2] Measured from pin 1 to pin 2. Table 7. Product data sheet Min Max Unit - 30 kV - 10 kV ESD standards compliance Standard PESD5V0S1BLD [1][2] Conditions IEC 61000-4-2; level 4 (ESD) > 15 kV (air); > 8 kV (contact) MIL-STD-883; class 3 (human body model) > 4 kV All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 3 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 001aaa631 IPP 001aaa630 120 100 % 90 % 100 % IPP; 8 s IPP (%) 80 e-t 50 % IPP; 20 s 40 10 % 0 10 20 30 30 ns 40 t (s) Fig 2. t tr = 0.7 ns to 1 ns 0 60 ns 8/20 s pulse waveform according to IEC 61000-4-5 Fig 3. ESD pulse waveform according to IEC 61000-4-2 6. Characteristics Table 8. Characteristics Tamb = 25 C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit - - 5.0 V Per diode VRWM reverse standoff voltage IRM reverse leakage current VRWM = 5.0 V - 5 100 nA VBR breakdown voltage IR = 1 mA 5.5 - 9.5 V Cd diode capacitance f = 1 MHz; VR = 0 V - 35 45 pF VCL clamping voltage - - 10 V - - 14 V IR = 10 A - 0.1 - IR = -10 A - 0.15 - [1][2] IPP = 1 A IPP = 12 A rdyn [1] PESD5V0S1BLD Product data sheet [2][3] dynamic resistance Non-repetitive current pulse 8/20 s exponential decay waveform according to IEC 61000-4-5. [2] Measured from pin 1 to pin 2. [3] Non-repetitive current pulse; Transmission Line Pulse (TLP) tp = 100 ns; square pulse; ANSI/ESD STM5.1-2008. All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 4 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 001aaa202 103 001aaa633 1.2 PPP PPP(25C) PPP (W) 0.8 102 0.4 10 1 102 10 103 0 104 0 50 100 150 tp (s) 200 Tj (C) Tamb = 25 C Fig 4. Peak pulse power as a function of exponential pulse duration; typical values 001aaa203 38 Cd (pF) Fig 5. Relative variation of peak pulse power as a function of junction temperature; typical values 001aaa204 102 IRM(Tj) IRM(Tj=85C) 34 10 30 1 26 10-1 22 0 1 2 3 4 75 5 100 125 150 Tj (C) VR (V) f = 1 MHz; Tamb = 25 C Fig 6. Diode capacitance as a function of reverse voltage; typical values PESD5V0S1BLD Product data sheet Fig 7. Relative variation of reverse leakage current as a function of junction temperature; typical values All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 5 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode IPP -VCL -VBR -VRWM IR IRM -IRM -IR VRWM VBR VCL - + -IPP 006aaa676 Fig 8. PESD5V0S1BLD Product data sheet V-I characteristics for a bidirectional ESD protection diode All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 6 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode ESD TESTER RZ 450 RG 223/U 50 coax 4 GHz DIGITAL OSCILLOSCOPE 10x ATTENUATOR 50 CZ DUT (DEVICE UNDER TEST) IEC 61000-4-2 network CZ = 150 pF; RZ = 330 vertical scale = 2 kV/div horizontal scale = 15 ns/div vertical scale = 10 V/div horizontal scale = 10 ns/div GND GND unclamped +8 kV ESD pulse waveform (IEC 61000-4-2 network) clamped +8 kV ESD pulse waveform (IEC 61000-4-2 network) pin 1 to 2 vertical scale = 2 kV/div horizontal scale = 15 ns/div GND GND vertical scale = 10 V/div horizontal scale = 10 ns/div unclamped -8 kV ESD pulse waveform (IEC 61000-4-2 network) Fig 9. clamped -8 kV ESD pulse waveform (IEC 61000-4-2 network) pin 1 to 2 006aac493 ESD clamping test setup and waveforms PESD5V0S1BLD Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 7 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 7. Application information The PESD5V0S1BLD is designed for the protection of one bidirectional data or signal line from the damage caused by ESD and surge pulses. The device may be used on lines where the signal polarities are both, positive and negative with respect to ground. The PESD5V0S1BLD provides a surge capability of 130 W per line for an 8/20 s waveform. signal line PESD5V0S1Bx GND 006aaa057 Fig 10. Application diagram Circuit board layout and protection device placement Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT) and surge transients. The following guidelines are recommended: 1. Place the device as close to the input terminal or connector as possible. 2. The path length between the device and the protected line should be minimized. 3. Keep parallel signal paths to a minimum. 4. Avoid running protected conductors in parallel with unprotected conductors. 5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and ground loops. 6. Minimize the length of the transient return path to ground. 7. Avoid using shared transient return paths to a common ground point. 8. Ground planes should be used whenever possible. For multilayer PCBs, use ground vias. 8. Test information 8.1 Quality information This product has been qualified in accordance with the Automotive Electronics Council (AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in automotive applications. PESD5V0S1BLD Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 8 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 9. Package outline 0.65 0.55 0.4 max 2 0.30 0.22 0.65 1.05 0.95 1 0.30 0.22 0.55 0.45 cathode marking on top side Dimensions in mm 10-08-06 Fig 11. Package outline PESD5V0S1BLD (SOD882D) 10. Packing information Table 9. Packing methods The indicated -xxx are the last three digits of the 12NC ordering code.[1] Type number Package Description Packing quantity 10000 PESD5V0S1BLD [1] SOD882D 2 mm pitch, 8 mm tape and reel -315 For further information and the availability of packing methods, see Section 14. 11. Soldering 1.4 0.2 solder lands 0.8 (2x) 0.6 (2x) solder resist 0.7 (2x) solder paste Dimensions in mm 0.3 0.4 1 1.3 sod882d_fr Reflow soldering is the only recommended soldering method. Fig 12. Reflow soldering footprint PESD5V0S1BLD (SOD882D) PESD5V0S1BLD Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 9 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 12. Revision history Table 10. Revision history Document ID Release date Data sheet status Change notice Supersedes PESD5V0S1BLD v.1 20101012 Product data sheet - - PESD5V0S1BLD Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 10 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 13. Legal information 13.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term `short data sheet' is explained in section "Definitions". [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 13.2 Definitions Draft -- The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet -- A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification -- The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 13.3 Disclaimers Limited warranty and liability -- Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors' aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications -- Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer's sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer's applications and products planned, as well as for the planned application and use of customer's third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer's applications or products, or the application or use by customer's third party customer(s). Customer is responsible for doing all necessary testing for the customer's applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer's third party customer(s). NXP does not accept any liability in this respect. Limiting values -- Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. 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No offer to sell or license -- Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Suitability for use -- NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or Export control -- This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. PESD5V0S1BLD Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 11 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode Quick reference data -- The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. 13.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 14. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com PESD5V0S1BLD Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1 -- 12 October 2010 (c) NXP B.V. 2010. All rights reserved. 12 of 13 PESD5V0S1BLD NXP Semiconductors Low capacitance bidirectional ESD protection diode 15. Contents 1 1.1 1.2 1.3 1.4 2 3 4 4.1 5 6 7 8 8.1 9 10 11 12 13 13.1 13.2 13.3 13.4 14 15 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1 General description . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Quick reference data . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Binary marking code description. . . . . . . . . . . . 2 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Application information. . . . . . . . . . . . . . . . . . . 8 Test information . . . . . . . . . . . . . . . . . . . . . . . . . 8 Quality information . . . . . . . . . . . . . . . . . . . . . . 8 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9 Packing information . . . . . . . . . . . . . . . . . . . . . 9 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 10 Legal information. . . . . . . . . . . . . . . . . . . . . . . 11 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Contact information. . . . . . . . . . . . . . . . . . . . . 12 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section `Legal information'. (c) NXP B.V. 2010. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 12 October 2010 Document identifier: PESD5V0S1BLD