1. Product profile
1.1 General description
Low capacitance bidirectional ElectroStatic Discharge (ESD) protection diode designed
to protect one sig nal line fr om the dam a ge cau se d by ESD and ot he r tr an sie nts.
The device is housed in a SOD882D leadless ultra small Surface-Mounted Device (SMD)
plastic packa ge with visible and solderable side pads.
1.2 Features and benefits
1.3 Applications
1.4 Quick reference data
PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
Rev. 1 — 12 October 2010 Product data sheet
Bidirectional ESD protection of one line ESD protection up to 30 kV
Ultra small SMD plastic package IEC 61000-4-2; level 4 (ESD)
Solderable side pads IEC 61000-4-5 (sur ge); IPP =12A
Package height typ. 0.37 mm Max. peak pulse power: PPP =130W
Low clamping voltage: VCL =14V Ultra low leakage current: IRM =5nA
AEC-Q101 qualified
Computers and peripherals Communication systems
Audio and video equipment Portable electronics
Cellular handsets and accessories
Table 1. Quick reference data
Tamb =25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
Per diode
VRWM reverse standoff voltage - - 5.0 V
Cddiode capacitance f = 1 MHz; VR= 0 V - 35 45 pF
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 2 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
2. Pinning information
[1] The marking bar indicates cathode 1.
3. Ordering information
4. Marking
[1] For SOD882D binary marking code description, see Figure 1.
4.1 Binary marking code description
Table 2. Pinning
Pin Description Simplified outline Graphic symbol
1 cathode 1 [1]
2 cathode 2
Transparent
top view
21 006aab0
41
12
Table 3. Ordering i nformation
Type number Package
Name Description Version
PESD5V0S1BLD - leadless ultra small plastic package; 2 terminals;
body 1.0 ×0.6 ×0.4 mm SOD882D
Table 4. Marking codes
Type number Marking code [1]
PESD5V0S1BLD 1100
0000
Fig 1. SOD882D binary marking code description
VENDOR CODE
MARKING CODE
(EXAMPLE)
CATHODE BAR READING DIRECTION
READING DIRECTION
READING EXAMPLE:
0111
1011
006aac47
7
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 3 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
5. Limiting values
[1] Non-repetitive current pulse 8/20 μs exponential decay waveform according to IEC 61000-4-5.
[1] Device stressed with ten non-repetitive ESD pulses.
[2] Measured from pin 1 to pin 2.
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
Per diode
PPP peak pulse power tp=8/20μs[1] -130W
IPP peak pulse current tp=8/20μs[1] -12A
Tjjunction temperature - 150 °C
Tamb ambient temperature 55 +150 °C
Tstg storage temperature 65 +150 °C
Table 6. ESD maximum ratings
Tamb =25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Max Unit
VESD electrostatic discharge voltage IEC 61000-4-2
(contact discharge) [1][2] -30kV
MIL-STD-883 (human
body model) -10kV
Table 7. ESD standards complianc e
Standard Conditions
IEC 61000-4-2; level 4 (ESD) > 15 kV (air); > 8 kV (contact)
MIL-STD-883; class 3 (human body model) > 4 kV
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 4 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
6. Characteristics
[1] Non-repetitive current pulse 8/20 μs exponential decay waveform according to IEC 61000-4-5.
[2] Measured from pin 1 to pin 2.
[3] Non-repetitive current pulse; Transmission Line Pulse (TLP) tp= 100 ns; square pulse;
ANSI/ESD STM5.1-2008.
Fig 2. 8 /2 0 μs pulse wa ve fo r m ac c or ding to
IEC 61000-4-5 Fig 3. ESD pulse waveform according to
IEC 61000-4-2
t (μs)
0403010 20
001aaa630
40
80
120
IPP
(%)
0
et
100 % IPP; 8 μs
50 % IPP; 20 μs
001aaa63
1
I
PP
100 %
90 %
t
30 ns
60 ns
10 %
t
r
= 0.7 ns to 1 ns
Table 8. Characteristics
Tamb =25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
Per diode
VRWM reverse standoff voltage - - 5.0 V
IRM reverse leakage current VRWM = 5.0 V - 5 100 nA
VBR breakdown voltage IR=1mA 5.5- 9.5V
Cddiode capacitance f = 1 MHz;
VR=0V -3545pF
VCL clamping voltage [1][2]
IPP =1A - - 10 V
IPP =12A - - 14 V
rdyn dynamic resistance [2][3]
IR=10A - 0.1 - Ω
IR=10 A - 0.15 - Ω
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 5 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
Tamb =25°C
Fig 4. Peak pulse power as a function of exponential
pulse duration; typical values Fig 5. Rel ati v e va ria t io n of pe ak pulse power as a
function of junction temperature; typical
values
f=1MHz; T
amb =25°C
Fig 6. Diode capacitance as a function of reverse
voltage; typical values Fig 7. Relative variation of reverse leakage current
as a function of junction temperature; typical
values
001aaa202
t
p
(μs)
110
4
10
3
10 10
2
10
2
10
3
P
PP
(W)
10
T
j
(°C)
0 20015050 100
001aaa633
0.4
0.8
1.2
P
PP
0
P
PP(25°C)
001aaa203
VR (V)
054231
30
26
34
38
Cd
(pF)
22
001aaa204
T
j
(°C)
75 150125100
10
1
10
2
10
1
I
RM(Tj)
I
RM(Tj=85°C)
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 6 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
Fig 8. V-I characteristics for a bidirectional ESD protection diode
006aaa67
6
VCL VBR VRWM
VCL
VBR
VRWM
IRM
IRM
IR
IR
IPP
IPP
+
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 7 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
Fig 9. ESD clamping test setup and waveforms
50 Ω
RZ
CZ
DUT
(DEVICE
UNDER
TEST)
GND
GND
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
CZ = 150 pF; RZ = 330 Ω
4 GHz DIGITAL
OSCILLOSCOPE
10×
ATTENUATOR
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
unclamped 8 kV ESD pulse waveform
(IEC 61000-4-2 network)
vertical scale = 2 kV/div
horizontal scale = 15 ns/div
vertical scale = 2 kV/div
horizontal scale = 15 ns/div
GND
clamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network) pin 1 to 2
vertical scale = 10 V/div
horizontal scale = 10 ns/div
006aac49
3
GND
clamped 8 kV ESD pulse waveform
(IEC 61000-4-2 network) pin 1 to 2
vertical scale = 10 V/div
horizontal scale = 10 ns/div
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 8 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
7. Application information
The PESD5V0S1BLD is design ed for the protection of one bidirectional dat a or signal line
from the damage caused by ESD and surge pulses. The device may be used on lines
where the signal polarities are both, positive and negative with respect to ground. The
PESD5V0S1BLD provides a surge capability of 130 W per line for an 8/20 μs waveform.
Circuit board layout and protection device placement
Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT)
and surge transients. The following guidelines are recommended:
1. Place the device as clos e to the input terminal or connector as possible.
2. The path length between the device and the protected line should be minimized.
3. Keep parallel signal paths to a minimum.
4. Avoid running protected conductors in parallel with unprotected conductors.
5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and
ground loops.
6. Minimize the length of the transient return path to ground.
7. Avoid using shared transient return paths to a common ground point.
8. Ground planes should b e used whenever possible. For multilayer PCBs, use ground
vias.
8. Test information
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in auto motive applications.
Fig 10. Applicati on di agram
006aaa05
7
PESD5V0S1Bx
GND
signal line
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 9 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
9. Package outline
10. Packing information
[1] For further information and the availability of packing methods, see Section 14.
11. Soldering
Fig 11. Package outline PESD5V0S1BLD (SOD882D)
10-08-06Dimensions in mm
0.65
0.30
0.22
0.30
0.22
0.55
0.45
0.65
0.55
0.4
max
1.05
0.95
2
cathode marking on top side
1
Table 9. Packing methods
The indicated -xxx are the last thre e digits of the 12NC ordering code.[1]
Type number Package Description Packing quantity
10000
PESD5V0S1BLD SOD882D 2 mm pitch, 8 mm tape and reel -315
Reflow soldering is the only recommended soldering method.
Fig 12. Reflow soldering footprint PESD5V0S1BLD ( SOD882D)
solder lands
solder resist
solder paste
sod882d_
fr
Dimensions in mm
1.4
0.2
0.3
0.4
1
1.3
0.8
(2×)
0.6
(2×)
0.7
(2×)
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 10 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
12. Revision history
Table 10. Revision history
Document ID Release date Data sheet status Change notice Supersedes
PESD5V0S1BLD v.1 20101012 Prod uct data sheet - -
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 11 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
13. Legal information
13.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product st atus of de vice(s) d escribed in th is docume nt may have cha nged since thi s docume nt was publish ed and may di ffe r in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
13.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not b e relied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semicond uctors sales
office. In case of any inconsistency or conflict with the shor t data sheet, the
full data sheet shall pre va il.
Product specificat ionThe information and data provided in a Product
data sheet shall define the specification of the product as agreed be tween
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
13.3 Disclaimers
Limited warr a nty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warrant ies, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequ ential damages (including - wit hout limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whethe r or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability t owards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suit able for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reaso nably be expected
to result in perso nal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liab ility for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for the custome r’s applications and
products planned, as well as fo r the planned application and use of
customer’s third party customer(s). Custo mers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the applicatio n or use by customer’s
third party custo m er(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individua l agreement. In case an individual
agreement is concluded only the ter m s and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing i n this document may be interpreted or
construed as an of fer t o sell product s that is open for accept ance or the gr ant,
conveyance or implication of any license under any copyrights, patents or
other industrial or inte llectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulatio ns. Export might require a prior
authorization from national authorities.
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contains data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
PESD5V0S1BLD All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 1 — 12 October 2010 12 of 13
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics se ctions of this
document, and as such is not complete, exhaustive or legally binding.
13.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respective ow ners.
14. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
NXP Semiconductors PESD5V0S1BLD
Low capacitance bidirectional ESD protection diode
© NXP B.V. 2010. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 12 October 2010
Document identifier: PESD5V0S1BLD
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
15. Contents
1 Product profile. . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 General description . . . . . . . . . . . . . . . . . . . . . 1
1.2 Features and benefits. . . . . . . . . . . . . . . . . . . . 1
1.3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.4 Quick reference data . . . . . . . . . . . . . . . . . . . . 1
2 Pinning information. . . . . . . . . . . . . . . . . . . . . . 2
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 2
4 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
4.1 Binary marking code description. . . . . . . . . . . . 2
5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3
6 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 4
7 Application information. . . . . . . . . . . . . . . . . . . 8
8 Test information. . . . . . . . . . . . . . . . . . . . . . . . . 8
8.1 Quality information . . . . . . . . . . . . . . . . . . . . . . 8
9 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
10 Packing information . . . . . . . . . . . . . . . . . . . . . 9
11 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
12 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 10
13 Legal information. . . . . . . . . . . . . . . . . . . . . . . 11
13.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11
13.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
13.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 11
13.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 12
14 Contact information. . . . . . . . . . . . . . . . . . . . . 12
15 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13