CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper I.C. Handling Procedures.
Copyright © Harris Corporation 1992 7-897
SEMICONDUCTOR
CD4047BMS
CMOS Low-Power
Monostable/Astable Multivibrator
Description
CD4047BMS consists of a gatable astable multivibrator with logic tech-
niques incorporated to permit positive or negative edge triggered
monostable multivibrator action with retriggering and external counting
options.
Inputs include +TRIGGER, -TRIGGER, ASTABLE, ASTABLE,
RETRIGGER, and EXTERNAL RESET . Buf fered outputs are Q,Q, and
OSCILLAT OR. In all modes of operation, an external capacitor must be
connected between C-Timing and RC-Common terminals, and an
external resistor must be connected between the R-Timing and RC-
Common terminals.
Astable operation is enabled by a high level on the AST ABLE input or a
low level on theASTABLE input, or both. The period of the square wave
at the Q and Q Outputs in this mode of operation is a function of the
external components employed. “True” input pulses on the ASTABLE
input or “Complement” pulses on theASTABLE input allow the circuit to
be used as a gatable multivibrator . The OSCILLAT OR output period will
be half of the Q terminal output in the astable mode. However, a 50%
duty cycle is not guaranteed at this output.
The CD4047BMS triggers in the monostable mode when a positive
going edge occurs on the +TRIGGER input while the -TRIGGER is held
low . Input pulses may be of any duration relative to the output pulse.
If retrigger capability is desired, the RETRIGGER input is pulsed. The
retriggerable mode of operation is limited to positive going edge. The
CD4047BMS will retrigger as long as the RETRIGGER input is high,
with or without transitions (See Figure 31)
An external countdown option can be implemented by coupling “Q” to
an external “N” counter and resetting the counter with trigger pulse. The
counter output pulse is fed back to the ASTABLE input and has a dura-
tion equal to N times the period of the multivibrator.
A high level on the EXTERNAL RESET input assures no output pulse
during an “ON” power condition. This input can also be activated to ter-
minate the output pulse at any time. For monostable operation, when-
ever VDD is applied, an internal power on reset circuit will clock the Q
output low within one output period (tM).
The CD4047BMS is supplied in these 14-lead outline packages:
Pinout
CD4047BMS
TOP VIEW
Braze Seal DIP H4Q
Frit Seal DIP H1B
Ceramic Flatpack H3W
C
R
R-C COMMON
ASTABLE
ASTABLE
-TRIGGER
VSS
VDD
OSC OUT
RETRIGGER
Q
Q
EXT. RESET
+TRIGGER
1
2
3
4
5
6
7
14
13
12
11
10
9
8
Features
High Voltage Type (20V Rating)
Low Power Consumption: Special CMOS Oscillator
Configuration
Monostable (One-Shot) or Astable (Free-Running)
Operation
True and Complemented Buffered Outputs
Only One External R and C Required
Buffered Inputs
100% Tested for Quiescent Current at 20V
Standardized, Symmetrical Output Characteristics
5V, 10V and 15V Parametric Ratings
Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Monostable Multivibrator Features
Positive or Negative Edge Trigger
Output Pulse Width Independent of Trigger Pulse
Duration
Retriggerable Option for Pulse Width Expansion
Internal Power-On Reset Circuit
Long Pulse Widths Possible Using Small RC Compo-
nents by Means of External Counter Provision
Fast Recovery Time Essentially Independent of Pulse
Width
Pulse-Width Accuracy Maintained at Duty Cycles
Approaching 100%
Astable Multivibrator Features
Free-Running or Gatable Operating Modes
50% Duty Cycle
Oscillator Output Available
Good Astable Frequency Stability: Frequency Deviation:
-=±2% + 0.03%/oC at 100kHz
-=±0.5% + 0.015%/oC at 10kHz (Circuits “Trimmed”
to Frequency VDD = 10V ± 10%
Applications
Digital equipment where low power dissipation and/or high noise
immunity are primary design requirements
Envelope Detection
Frequency Multiplication
Frequency Division
Frequency Discriminators
Timing Circuits
Time Delay Applications
December 1992
File Number 3313
7-898
Specifications CD4047BMS
Absolute Maximum Ratings Reliability Information
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
Operating Temperature Range. . . . . . . . . . . . . . . . -55oC to +125oC
Package Types D, F, K, H
Storage Temperature Range (TSTG). . . . . . . . . . . -65oC to +150oC
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265oC
At Distance 1/16 ± 1/32 Inch (1.59mm ± 0.79mm) from case for
10s Maximum
Thermal Resistance . . . . . . . . . . . . . . . . θja θjc
Ceramic DIP and FRIT Package. . . . . 80oC/W 20oC/W
Flatpack Package . . . . . . . . . . . . . . . . 70oC/W 20oC/W
Maximum Package Power Dissipation (PD) at +125oC
For TA = -55oC to +100oC (Package Type D, F, K). . . . . . 500mW
For TA = +100oC to +125oC (Package Type D, F, K) . . . . .Derate
Linearity at 12mW/oC to 200mW
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS (NOTE 1) GROUP A
SUBGROUPS TEMPERATURE
LIMITS
UNITSMIN MAX
Supply Current IDD VDD = 20V, VIN = VDD or GND 1 +25oC-2µA
2 +125oC - 200 µA
VDD = 18V, VIN = VDD or GND 3 -55oC-2µA
Input Leakage Current IIL VIN = VDD or GND VDD = 20 1 +25oC -100 - nA
2 +125oC -1000 - nA
VDD = 18V 3 -55oC -100 - nA
Input Leakage Current IIH VIN = VDD or GND VDD = 20 1 +25oC - 100 nA
2 +125oC - 1000 nA
VDD = 18V 3 -55oC - 100 nA
Input Leakage Curent
(Pin 3) IIL VDD = 24V, VIN = 11V or GND 1 +25oC -300 - nA
2 +125oC -10 - µA
Input Leakage Current
(Pin 3) IIH VDD = 26V, VIN = 13V or GND 1 +25oC - 300 nA
2 +125oC-10µA
Output Voltage VOL15 VDD = 15V, No Load 1, 2, 3 +25oC, +125oC, -55oC - 50 mV
Output Voltage VOH15 VDD = 15V, No Load (Note 3) 1, 2, 3 +25oC, +125oC, -55oC 14.95 - V
Output Current (Sink)
Q, Q, OSC Out IOL5 VDD = 5V, VOUT = 0.4V 1 +25oC 0.53 - mA
Output Current (Sink)
Q, Q, OSC Out IOL10 VDD = 10V, VOUT = 0.5V 1 +25oC 1.4 - mA
Output Current (Sink)
Q, Q, OSC Out IOL15 VDD = 15V, VOUT = 1.5V 1 +25oC 3.5 - mA
Output Current (Source)
Q, Q, OSC Out IOH5A VDD = 5V, VOUT = 4.6V 1 +25oC - -0.53 mA
Output Current (Source)
Q, Q, OSC Out IOH5B VDD = 5V, VOUT = 2.5V 1 +25oC - -1.8 mA
Output Current (Source)
Q, Q, OSC Out IOH10 VDD = 10V, VOUT = 9.5V 1 +25oC - -1.4 mA
Output Current (Source)
Q, Q, OSC Out IOH15 VDD = 15V, VOUT = 13.5V 1 +25oC - -3.5 mA
Output Current (Sink) IOL5RC VDD = 5V, VOUT = 0.4V 1 +25oC 0.78 - mA
Output Current (Sink) IOL10RC VDD = 10V, VOUT = 0.5V 1 +25oC 2.0 - mA
Output Current (Sink) IOL15RC VDD = 15V, VOUT = 1.5V 1 +25oC 5.2 - mA
Output Current (Source) IOH5RC VDD = 5V, VOUT = 4.6V 1 +25oC - -0.78 mA
Output Current (Source) IOH10RC VDD = 10V, VOUT = 9.5V 1 +25oC - -2 mA
Output Current (Source) IOH15RC VDD = 15V, VOUT = 13.5V 1 +25oC - -5.2 mA
N Threshold Voltage VNTH VDD = 10V, ISS = -10µA 1 +25oC -2.8 -0.7 V
7-899
Specifications CD4047BMS
P Threshold Voltage VPTH VSS = 0V, IDD = 10µA 1 +25oC 0.7 2.8 V
Functional F VDD = 2.8V, VIN = VDD or GND 7 +25oC VOH >
VDD/2 VOL <
VDD/2 V
VDD = 20V, VIN = VDD or GND 7 +25oC
VDD = 18V, VIN = VDD or GND 8A +125oC
VDD = 3V, VIN = VDD or GND 8B -55oC
Input Voltage Low
(Note 2) VIL VDD = 5V, VOH > 4.5V, VOL < 0.5V 1, 2, 3 +25oC, +125oC, -55oC - 1.5 V
Input Voltage High
(Note 2) VIH VDD = 5V, VOH > 4.5V, VOL < 0.5V 1, 2, 3 +25oC, +125oC, -55oC 3.5 - V
Input Voltage Low
(Note 2) VIL VDD = 15V, VOH > 13.5V,
VOL < 1.5V 1, 2, 3 +25oC, +125oC, -55oC- 4 V
Input Voltage High
(Note 2) VIH VDD = 15V, VOH > 13.5V,
VOL < 1.5V 1, 2, 3 +25oC, +125oC, -55oC11 - V
NOTES:
1. All voltages referenced to device GND, 100% testing being implemented
2. Go/No Go test with limits applied to inputs.
3. For accuracy, voltage is measured differentially to VDD. Limit is 0.050V max..
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER SYMBOL (NOTES 1, 2)
CONDITIONS GROUP A
SUBGROUPS TEMPERATURE
LIMITS
UNITSMIN MAX
Propagation Delay
Astable, Astable to OSC TPLH1 VDD = 5V, VIN = VDD or GND 9 +25oC - 400 ns
10, 11 +125oC, -55oC - 540 ns
Propagation Delay
Trigger to Q, Q TPHL3
TPLH3 VDD = 5V, VIN = VDD or GND 9 +25oC - 1000 ns
10, 11 +125oC, -55oC - 1350 ns
Propagation Delay
(Note 2)
Astable orAstable to Q , Q
TPLH2
TPLH2 VDD = 5V, VIN = VDD or GND 9 +25oC - 700 ns
10, 11 +125oC, -55oC - 945 ns
Propagation Delay
(Note 2)
Retrigger to Q, Q
TPHL4
TPLH4 VDD = 5V, VIN = VDD or GND 9 +25oC - 600 ns
10, 11 +125oC, -55oC - 810 ns
Propagation Delay
(Note 2)
Reset to Q, Q
TPLH5
TPLH5 VDD = 5V, VIN = VDD or GND 9 +25oC - 500 ns
10, 11 +125oC, -55oC - 675 ns
Transition Time TTHL
TTLH VDD = 5V, VIN = VDD or GND 9 +25oC - 200 ns
10, 11 +125oC, -55oC - 270 ns
NOTES:
1. VDD = 5V, CL = 50pF, RL = 200K; input TR, TF < 20ns.
2. -55oC and +125oC limits guaranteed, 100% testing being implemented.
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER SYMBOL CONDITIONS (NOTE 1) GROUP A
SUBGROUPS TEMPERATURE
LIMITS
UNITSMIN MAX
7-900
Specifications CD4047BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS NOTES TEMPERATURE
LIMITS
UNITSMIN MAX
Supply Current IDD VDD = 5V, VIN = VDD or GND 1, 2 -55oC, +25oC- 1 µA
+125oC-30µA
VDD = 10V, VIN = VDD or GND 1, 2 -55oC, +25oC- 2 µA
+125oC-60µA
VDD = 15V, VIN = VDD or GND 1, 2 -55oC, +25oC- 2 µA
+125oC - 120 µA
Output Voltage VOL VDD = 5V, No Load 1, 2 +25oC, +125oC,
-55oC-50mV
Output Voltage VOL VDD = 10V, No Load 1, 2 +25oC, +125oC,
-55oC-50mV
Output Voltage VOH VDD = 5V, No Load 1, 2 +25oC, +125oC,
-55oC4.95 - V
Output Voltage VOH VDD = 10V, No Load 1, 2 +25oC, +125oC,
-55oC9.95 - V
Output Current (Sink) IOL5 VDD = 5V, VOUT = 0.4V 1, 2 +125oC 0.36 - mA
-55oC 0.64 - mA
Output Current (Sink) IOL10 VDD = 10V, VOUT = 0.5V 1, 2 +125oC 0.9 - mA
-55oC 1.6 - mA
Output Current (Sink) IOL15 VDD = 15V, VOUT = 1.5V 1, 2 +125oC 2.4 - mA
-55oC 4.2 - mA
Output Current (Source) IOH5A VDD = 5V, VOUT = 4.6V 1, 2 +125oC - -0.36 mA
-55oC - -0.64 mA
Output Current (Source) IOH5B VDD = 5V, VOUT = 2.5V 1, 2 +125oC - -1.15 mA
-55oC - -2.0 mA
Output Current (Source) IOH10 VDD = 10V, VOUT = 9.5V 1, 2 +125oC - -0.9 mA
-55oC - -1.6 mA
Output Current (Source) IOH15 VDD =15V, VOUT = 13.5V 1, 2 +125oC - -2.4 mA
-55oC - -4.2 mA
Input Voltage Low VIL VDD = 10V, VOH > 9V, VOL < 1V 1, 2 +25oC, +125oC,
-55oC-3V
Input Voltage High VIH VDD = 10V, VOH > 9V, VOL < 1V 1, 2 +25oC, +125oC,
-55oC+7 - V
Propagation Delay
Astable, Astable to OSC TPLH1 VDD = 10V 1, 2, 3 +25oC - 200 ns
VDD = 15V 1, 2, 3 +25oC - 160 ns
Propagation Delay
Astable orAstable to Q , Q TPLH2
TPHL2 VDD = 10V 1, 2, 3 +25oC - 350 ns
VDD = 15V 1, 2, 3 +25oC - 250 ns
Propagation Delay
Trigger to Q, Q TPHL3
TPLH3 VDD = 10V 1, 2, 3 +25oC - 450 ns
VDD = 15V 1, 2, 3 +25oC - 300 ns
Propagation Delay
Retrigger to Q, Q TPHL4
TPLH4 VDD = 10V 1, 2, 3 +25oC - 300 ns
VDD = 15V 1, 2, 3 +25oC - 200 ns
Propagation Delay
Reset to Q, Q TPLH5
TPLH5 VDD = 10V 1, 2, 3 +25oC - 200 ns
VDD = 15V 1, 2, 3 +25oC - 140 ns
Transition Time TTHL
TTLH VDD = 10V 1, 2, 3 +25oC - 100 ns
VDD = 15V 1, 2, 3 +25oC - 80 ns
7-901
Specifications CD4047BMS
Q or Q Deviation from
50% Duty Factor QD VDD = 5V 1, 2, 3 +25oC-±1%
VDD = 10V 1, 2, 3 +25oC-±1%
VDD = 15V 1, 2, 3 +25oC-±0.5 %
Minimum Pulse Width
+ Trigger
- Trigger
TW VDD = 5V 1, 2, 3 +25oC - 400 ns
VDD = 10V 1, 2, 3 +25oC - 160 ns
VDD = 15V 1, 2, 3 +25oC - 100 ns
Minimum Pulse Width
Reset TW VDD = 5V 1, 2, 3 +25oC - 200 ns
VDD = 10V 1, 2, 3 +25oC - 100 ns
VDD = 15V 1, 2, 3 +25oC - 60 ns
Minimum Retrigger Pulse
Width TW VDD = 5V 1, 2, 3 +25oC - 600 ns
VDD = 10V 1, 2, 3 +25oC - 230 ns
VDD = 15V 1, 2, 3 +25oC - 150 ns
Input Capacitance CIN Any Input 1, 2 +25oC - 7.7 pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS NOTES TEMPERATURE
LIMITS
UNITSMIN MAX
Supply Current IDD VDD = 20V, VIN = VDD or GND 1, 4 +25oC - 7.5 µA
N Threshold Voltage VNTH VDD = 10V, ISS = -10µA 1, 4 +25oC -2.8 -0.2 V
N Threshold Voltage
Delta VTN VDD = 10V, ISS = -10µA 1, 4 +25oC-±1V
P Threshold Voltage VTP VSS = 0V, IDD = 10µA 1, 4 +25oC 0.2 2.8 V
P Threshold Voltage
Delta VTP VSS = 0V, IDD = 10µA 1, 4 +25oC-±1V
Functional F VDD = 18V, VIN = VDD or GND 1 +25oC VOH >
VDD/2 VOL <
VDD/2 V
VDD = 3V, VIN = VDD or GND
Propagation Delay Time TPHL
TPLH VDD = 5V 1, 2, 3, 4 +25oC - 1.35 x
+25oC
Limit
ns
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns. 3. See Table 2 for +25oC limit.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25OC
PARAMETER SYMBOL DELTA LIMIT
Supply Current - MSI-1 IDD ± 0.2µA
Output Current (Sink) IOL5 ± 20% x Pre-Test Reading
Output Current (Source) IOH5A ± 20% x Pre-Test Reading
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER SYMBOL CONDITIONS NOTES TEMPERATURE
LIMITS
UNITSMIN MAX
7-902
Specifications CD4047BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP MIL-STD-883
METHOD GROUP A SUBGROUPS READ AND RECORD
Initial Test (Pre Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A
Interim Test 1 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A
Interim Test 2 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A
PDA (Note 1) 100% 5004 1, 7, 9, Deltas
Interim Test 3 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A
PDA (Note 1) 100% 5004 1, 7, 9, Deltas
Final Test 100% 5004 2, 3, 8A, 8B, 10, 11
Group A Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B Subgroup B-5 Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6 Sample 5005 1, 7, 9
Group D Sample 5005 1, 2, 3, 8A, 8B, 9 Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS MIL-STD-883
METHOD
TEST READ AND RECORD
PRE-IRRAD POST-IRRAD PRE-IRRAD POST-IRRAD
Group E Subgroup 2 5005 1, 7, 9 Table 4 1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION OPEN GROUND VDD 9V ± -0.5V OSCILLATOR
50kHz 25kHz
Static Burn-In 1
Note 1 1, 2, 10, 11, 13 3-9, 12 14
Static Burn-In 2
Note 1 1, 2, 10, 11, 13 7 3-6, 8, 9, 12, 14
Dynamic Burn-
In Note 1 - 7, 9, 12 4, 5, 14 1, 2, 10, 11, 13 6, 8 3
Irradiation
Note 2 1, 2, 10, 11, 13 7 3-6, 8, 9, 12, 14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K±5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
7-903
CD4047BMS
TABLE 9. FUNCTIONAL TERMINAL CONNECTIONS
In all cases External resistor between terminals 2 and 3 (Note 1)
External capacitor between terminals 1 and 3 (Note 1)
FUNCTION
TERMINAL CONNECTIONS OUTPUT PULSE
FROM OUTPUT PERIOD OR PULSE
WIDTHTO VDD TO VSS INPUT TO
ASTABLE MULTIVIBRATOR
Free Running 4, 5, 6, 14 7, 8, 9, 12 - 10, 11, 13 TA (10, 11) = 4.40 RC
True Gating 4, 6, 14 7, 8, 9, 12 5 10, 11, 13 TA (13) = 2.20 RC (Note 2)
Complement Gating 6, 14 5, 7, 8, 9, 12 4 10, 11, 13
MONOSTABLE MULTIVIBRATOR
Positive Edge Trigger 4, 14 5, 6, 7, 9, 12 8 10, 11 tM (10, 11) = 2.48 RC
Negative Edge Trigger 4, 8, 14 5, 7, 9, 12 6 10, 11
Retriggerable 4, 14 5, 6, 7, 9 8, 12 10, 11
External Countdown (Note 3) 14 5, 6, 7, 8, 9, 12 - 10, 11
NOTES:
1. See text.
2. First positive1/2 cycle pulse width = 2.48 RC. See note follow Monostable Mode Design Information.
3. Input Pulse to Reset of External Counting Chip External Counting Chip Output to Terminal 4.
Logic Diagrams
FIGURE 1. CD4047BMS LOGIC BLOCK DIAGRAM
Q
Q
10
11
OSCILLATOR OUT
LOW POWER
ASTABLE
MULTIVIBRATOR
FREQUENCY
DIVIDER (÷2)
ASTABLE
GATE
CONTROL
MONOSTABLE
CONTROL
RETRIGGER
CONTROL
13
213 R-TIMINGC-TIMING
RC
COMMON
R
C
-TRIGGER
ASTABLE
+TRIGGER
RETRIGGER
EXTERNAL
RESET
ASTABLE
12
9
8
6
4
5
7-904
CD4047BMS
FIGURE 2. CD4047BMS LOGIC DIAGRAM
(a)
(b)
FIGURE 3. DETAIL LOGIC DIAGRAM FOR FLIP-FLOPS FF1 AND FF3 (a) AND FOR FLIP-FLOPS FF2 AND FF4 (b)
Logic Diagrams
(Continued)
FF1
DQ
CL
CL
R1 R2
VDD
S
DQ
CL
CL
R
FF3
DQ
CL
CL
R1 R2
Q
FF2
S
DQ
CL
CL
R
FF4
VSS
10
11
13
OSC
OUT
Q
Q
2RTC
1
CTC
3RC
COMMON
**
12
RETRIGGER *VDD
14
VDD
7
VSS
9
*
EXTERNAL
RESET
6
*
-TRIGGER
8
*
+TRIGGER
4
*
ASTABLE
5
*
ASTABLE
VDD
VSS
VDD
VSS
INPUTS PROTECTED
BY CMOS
PROTECTION
NETWORK
*SPECIAL
RC COMMON
PROTECTION
NETWORK
**
CAUTION: Terminal 3 is more sensitive
to static electrical discharge. Extra
handling precautions are recommended.
p
n
CL
CL
p
n
CL
CL
p
n
CL
CL p
n
CL
CL
DQ
R2 R1
R2R1
CL DQ
CL
FF1, FF3
R2R1
S
DQ
Q
R
FF2, FF4
p
n
CL
CL
R
p
n
CL
CL
p
n
CL
CL
D
S
R
S
Q
p
n
CL
CL
Q
CL
CL
7-905
CD4047BMS
Typical Performance Characteristics
FIGURE 4. TYPICAL OUTPUT LOW (SINK) CURRENT
CHARACTERISTICS FIGURE 5. MINIMUM OUTPUT LOW (SINK) CURRENT
CHARACTERISTICS
FIGURE 6. TYP. OUTPUT HIGH (SOURCE) CURRENT
CHARACTERISTICS FIGURE 7. MINIMUM OUTPUT HIGH (SOURCE) CURRENT
CHARACTERISTICS
FIGURE8. TYP. PROPAGATION DELA Y TIME AS A FUNCTION OF
LOAD CAPACIT ANCE (ASTABLE,ASTABLE TO Q, Q) FIGURE 9. TYP. PROPAGATION DELAY TIME AS A FUNCTION
OF LOAD CAP ACIT ANCE (+ OR - TRIGGER TO Q,Q)
10V
5V
AMBIENT TEMPERATURE (TA) = +25oC
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
0 5 10 15
15
10
5
20
25
30
DRAIN-TO-SOURCE VOLT AGE (VDS) (V)
OUTPUT LOW (SINK) CURRENT (IOL) (mA)
10V
5V
AMBIENT TEMPERATURE (TA) = +25oC
GATE-TO-SOURCE VOL TAGE (VGS) = 15V
0 5 10 15
7.5
5.0
2.5
10.0
12.5
15.0
DRAIN-TO-SOURCE VOLT AGE (VDS) (V)
OUTPUT LOW (SINK) CURRENT (IOL) (mA)
-10V
-15V
AMBIENT TEMPERATURE (TA) = +25oC
GATE-TO-SOURCE VOL TAGE (VGS) = -5V
0
-2.5
-5
-7.5
DRAIN-TO-SOURCE VOLT AGE (VDS) (V)
-10
-12.5
-15
0-5-10-15
OUTPUT HIGH (SOURCE) CURRENT (IOH) (mA)
-10V
-15V
AMBIENT TEMPERATURE (TA) = +25oC0
-2.5
-5
-7.5
DRAIN-TO-SOURCE VOLT AGE (VDS) (V) 0-5-10-15
OUTPUT HIGH (SOURCE) CURRENT (IOH) (mA)
GATE-TO-SOURCE VOL TAGE (VGS) = -5V
SUPPLY VOLTAGE (VDD) = 5V
PROPAGATION DELAY TIME (tPHL, tPLH) (ns)
100
0LOAD CAPACITANCE (CL) (pF)
15V
10V
AMBIENT TEMPERATURE (TA) = +25oC
200
300
400
20 40 60 80 100
SUPPLY VOLTAGE (VDD) = 5V
PROPAGATION DELAY TIME (tPHL, tPLH) (ns)
200
0LOAD CAPACITANCE (CL) (pF)
15V
10V
AMBIENT TEMPERATURE (TA) = +25oC
20 40 60 80 100
400
600
7-906
CD4047BMS
FIGURE 10. TYP. TRANSITION TIME AS A FUNCTION OF LOAD
CAPACITANCE FIGURE 11. TYP. ASTABLE OSCILLATOR OR Q, Q PERIOD
ACCURACY vs SUPPLY VOLTAGE
FIGURE 12. TYP. ASTABLE OSCILLATOR OR Q, Q PERIOD
ACCURACY vs SUPPLY VOLTAGE FIGURE 13. TYP. ASTABLE OSCILLATOR OR Q, Q PERIOD
ACCURACY vs SUPPLY VOLTAGE
FIGURE 14. TYP. ASTABLE OSCILLATOR OR Q, Q PERIOD
ACCURACY vs AMBIENT TEMPERATURE (ULTRA
LOW FREQ.)
FIGURE 15. TYP. ASTABLE OSCILLATOR OR Q, Q PERIOD
ACCURACY vs AMBIENT TEMPERATURE (LOW
FREQ.)
Typical Performance Characteristics
(Continued)
AMBIENT TEMPERATURE (TA) = +25oC
LOAD CAPACITANCE (CL) (pF)
0 40 60 80 10020
0
50
100
150
200
SUPPLY VOL TAGE (VDD) = 5V
10V
15V
TRANSITION TIME (fTHL, fTLH) (ns)
4
3
2
1
0
-1
-2
-3
-4
PERIOD ACCURACY (%)
0 2 4 6 810 1214161820
SUPPLY VOLTAGE (VDD) (V)
AMBIENT TEMPERATURE (TA) = +25oC
CX = 1µF
10k
10M
1M AND 100k
10k
10M
RX = 1M AND
100k
4
3
2
1
0
-1
-2
-3
-4
PERIOD ACCURACY (%)
0 2 4 6 810 1214161820
SUPPLY VOLTAGE (VDD) (V)
AMBIENT TEMPERATURE (TA) = +25oC
CX = 0.01µF
10k
1M
10k
100k
RX = 1M
10M
10M
100k
4
3
2
1
0
-1
-2
-3
-4
PERIOD ACCURACY (%)
0 2 4 6 810 1214161820
SUPPLY VOLTAGE (VDD) (V)
AMBIENT TEMPERATURE (TA) = +25oC
CX = 1000pF
10k
1M AND
10k
100k
RX = 1M AND
10k10k10M
PERIOD ACCURACY (%)
-55 -15 25 65 105 145
AMBIENT TEMPERATURE (TA) (oC)
-3
-2
-1
0
1CX = 1µF
RX = 1M
SUPPLY VOLTAGE (VDD) = 5V 5V
10V, 15V
10V, 15V
PERIOD ACCURACY (%)
-55
AMBIENT TEMPERATURE (TA) (oC)
2CX = 0.1µF
RX = 1M
SUPPLY VOLTAGE (VDD) = 5V
5V
10V
15V
1
0
-1
-2 -15 25 65 105 145
15V
10V
7-907
CD4047BMS
FIGURE 16. TY P. A S TABLE OSCILLATOR OR Q, Q PERIOD
ACCURACY vs AMBIENT TEMPERATURE (MEDIUM
FREQ.)
FIGURE 17. TY P. A S TABLE OSCILLATOR OR Q,Q PERIOD
ACCURACY vs AMBIENT TEMPERATURE (HIGH
FREQ.)
FIGURE18. TYPICAL ASTABLE OSCILLATOR OR Q,Q PERIOD
ACCURACY vs AMBIENT TEMPERATURE FIGURE 19. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
SUPPLY VOLTAGE
FIGURE 20. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
SUPPLY VOLTAGE FIGURE 21. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
SUPPLY VOLTAGE
Typical Performance Characteristics
(Continued)
PERIOD ACCURACY (%)
-55 -15 25 65 105 145
AMBIENT TEMPERATURE (TA) (oC)
2CX = 0.01µF
RX = 100kSUPPLY VOLTAGE (VDD) = 5V, 10V
5V AND 10V
1
0
-1
-2
15V
15V
PERIOD ACCURACY (%)
-55 -15 25 65 105 145
AMBIENT TEMPERATURE (TA) (oC)
12 CX = 1000pF
RX = 10k
10V AND 15V
5V
10V, 15V
10
8
6
4
2
0
-2
-4
SUPPLY VOLTAGE (VDD) = 5V
-35 -5 45 85 125
PERIOD ACCURACY (%)
-55 -15 25 65 105 145
AMBIENT TEMPERATURE (TA) (oC)
-10
RX = 10k
SUPPLY VOLTAGE (VDD) = 5V
0
10
20
100pF
0.001µF
0.01µF, 0.1µF, 1µF
0.001µF
CX = 100pF
0.01µF, 0.1µF, 1µF
AMBIENT TEMPERATURE (TA) = +25oC
CX = 1µF
OUTPUT PULSE-WIDTH VARIATION (%)
-8
-6
-4
-2
0
2
4
6
8
0 5 10 15 20 25
SUPPLY VOLTAGE (VDD) (V)
1k
10k
RX = 100k, 1M, 10M
100k
1k
10k, 1M AND 10M
AMBIENT TEMPERATURE (TA) = +25oC
CX = 0.1µF
OUTPUT PULSE-WIDTH VARIATION (%)
-8
-6
-4
-2
0
2
4
6
8
0 5 10 15 20 25
SUPPLY VOLTAGE (VDD) (V)
10M10k, 100k, 1M AND 10M
RX = 10k, 100k, 1M
AMBIENT TEMPERATURE (TA) = +25oC
CX = 1000pF
OUTPUT PULSE-WIDTH VARIATION (%)
-8
-6
-4
-2
0
2
4
6
8
0 5 10 15 20 25
SUPPLY VOLTAGE (VDD) (V)
RX = 1M AND 10
100k
10k
7-908
CD4047BMS
FIGURE 22. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
AMBIENT TEMPERATURE FIGURE 23. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
AMBIENT TEMPERATURE
FIGURE 24. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
AMBIENT TEMPERATURE FIGURE 25. TYPICAL OUTPUT PULSE WIDTH VARIATIONS vs
AMBIENT TEMPERATURE
FIGURE 26. TYPICAL POWER DISSIPATION vs OUTPUT
FREQUENCY (VDD = 5V) FIGURE 27. TYPICAL POWER DISSIPATION vs OUTPUT
FREQUENCY (VDD = 10V)
Typical Performance Characteristics
(Continued)
RX = 100k
SUPPLY VOLTAGE (VDD) = 5V
0.001µF
OUTPUT PULSE-WIDTH VARIATION (%)
-8
-6
-4
-2
0
2
4
6
8
-55 -15 25 65 105 145
AMBIENT TEMPERATURE (TA) (oC)
0.01µF
0.1µF
0.001µF
0.01µF
0.1µF
-35 5 45 85 125
RX = 100k
SUPPLY VOLTAGE (VDD) = 10V OR 15V
OUTPUT PULSE-WIDTH VARIATION (%)
-12-50 AMBIENT TEMPERATURE (TA) (oC)
-35 -15 5 25 45 65 85 105 125 145
-10
-8
-6
-4
-2
0
2
4
6
8
10
0.1µF AND 0.001µF
CX = 100pF
0.01µF
0.1µF, 0.01µF
0.001µF
100pF
-55 -15 25 65 105 145
AMBIENT TEMPERATURE (TA) (oC)
-35 5 45 85 125
CX = 1000pF
SUPPLY VOLTAGE (VDD) = 5V OR 10V
OUTPUT PULSE-WIDTH VARIATION (%)
-12
-10
-8
-6
-4
-2
0
2
4
100k
RX = 1M
10k
10M
10M
1M
10k
100k
CX = 1000pF
SUPPLY VOLTAGE (VDD) = 15V
OUTPUT PULSE-WIDTH VARIATION (%)
-12-50 AMBIENT TEMPERATURE (TA) (oC)
-35 -15 5 25 45 65 85 105 125 145
-10
-8
-6
-4
-2
0
2
4
10M
10k
RX = 1M100k
1M
10M
10k
100k
ASTABLE MODE
SUPPLY VOLTAGE (VDD) = 5V
POWER DISSIPATION (PD) (µW)
105
104
103
102
101
100
10-1 100101102103104105106
Q OR Q FREQUENCY (F) (Hz)
C = 0.1µFC = 0.01µFC =1000pF
C =100pF
C =10pF
ASTABLE MODE
SUPPLY VOLTAGE (VDD) = 10V
POWER DISSIPATION (PD) (µW)
105
104
103
102
101
10-1 100101102103104105106
Q OR Q FREQUENCY (F) (Hz)
C = 0.1µFC = 0.01µF
C =1000pF
C =100pF
C =10pF
106
7-909
CD4047BMS
FIGURE 28. TYPICAL POWER DISSIPATION vs OUTPUT FREQUENCY (VDD = 15V)
Typical Performance Characteristics
(Continued)
ASTABLE MODE
SUPPLY VOLTAGE (VDD) = 15V
POWER DISSIPATION (PD) (µW)
105
104
103
102
10-1 100101102103104105106
Q OR Q FREQUENCY (F) (Hz)
C = 0.1µF
C = 0.01µFC =1000pF
C =100pF
C =10pF
Astable Mode Design Information
Unit-to-Unit Transfer Voltage Variations
The following analysis presents variations from unit to unit as
a function of transfer voltage (VTR) shift (33%-67% VDD) for
free running (astable) operation.
FIGURE 29. ASTABLE MODE WAVEFORMS
thus if is used, the variation will be +5%, -0%
due to variations in transfer voltage.
Variations Due to VDD and Temperature Changes
In addition to variations from unit to unit, the astable period
varies with VDD and temperature, Typical variations are pre-
sented in graphical form in Figures 11 to 18 with 10V as ref-
erence for voltage variations curves and +25oC as reference
for temperature variations curves.
t1 = -RC In VTR ;
VDD + VTR
typically, t1 = 1.1RC
t2 = -RC In VDD - VTR ;
2VDD - VTR
typically, t2 = 1.1RC
tA = 2(t1 + t2)
= -2RC In (VTR)(VDD - VTR)
(VDD + VTR)(2VDD - VTR)
Typ:
Min:
Max:
VTR = 0.5VDD
VTR = 0.33VDD
VTR = 0.67VDD
tA = 4.40RC
tA = 4.62RC
tA = 4.62RC
t1 t2 t1 t2
tA/2 tA/2
tA
TERMINAL 13
TERMINAL 10
tA = 4.40RC
Monostable Mode Design Information
The following analysis presents variations from unit to unit as a
function of transfer voltage (VTR) shift (33% - 67% VDD) for
one shot (monostable) operation.
FIGURE 30. MONOSTABLE WAVEFORMS
thus if is used, the variation will be +9.3%,
-0% due to variations in transfer voltage.
NOTES:
1. In the astable mode, the first positive half cycle has a duration of
tM; succeeding durations are tA/s.
2. In addition to variations from unit to unit, the monostable pulse
width varies with VDD and temperature. These variations are
presented in graphical form in Figures 19 to 26 with 10V as ref-
erence for voltage variation curves and +25oC as reference for
temperature variation curves.
t1´ = -RC In VTR ;
2VDD
typically, t1´ = 1.38RC
tM = (t1´ + t2)
tM = -RC In (VTR)(VDD - VTR)
(2VDD - VTR)(2VDD)
where tM = Monostable mode pulse width.
Values for tM are as follows:
Typ:
Min:
Max:
VTR = 0.5VDD
VTR = 0.33VDD
VTR = 0.67VDD
tM = 2.48RC
tM = 2.71RC
tM = 2.48RC
t1´ t2 t1´ t2
tM tM
TERMINAL 13
TERMINAL 10
TERMINAL 8
tM = 2.48RC
7-910
CD4047BMS
Retrigger Mode Operation
The CD4047BMS can be used in the retrigger mode to extend
the output pulse duration, or to compare the frequency of an
input signal with that of the internal oscillator. In the retrigger
mode the input pulse is applied to terminal 12, and the output is
taken from terminal 10 or 11. As shown in Figure 31 normal
monostable action is obtained when one retrigger pulse is
applied. Extended pulse duration is obtained when more than
one pulse is applied.
For two input pulses, tRE = t1´ + t1 + 2t2. For more than two
pulses, the output pulse width is an integral number of time peri-
ods, with the first time period being t1´ + t2, typically , 2.48RC, and
all subsequent time periods being t1 + t2, typically, 2.2RC.
External Counter Option
T ime tM can be extended by any amount with the use of external
counting circuitry. Advantages include digitally controlled pulse
duration, small timing capacitors for long time periods, and
extremely fast recovery time. A typical implementation is shown
in Figure 32. The pulse duration at the output is
text = (N - 1) (t A) + (tM + t A/2)
where text = pulse duration of the circuitry, and N is the number
of counts used.
FIGURE 32. IMPLEMENT ATION OF EXTERNAL COUNTER OPTION
Timing Component Limitations
The capacitor used in the circuit should be non polarized and
have low leakage (i.e. the parallel resistance of the capacitor
should be at least an order of magnitude greater than the exter-
nal resistor used). There is no upper or lower limit for either R or
C value to maintain oscillation.
AST
Q
CD4047BMS CD4017BMS
R
CL OUT
11
12
INPUT
PULSE
OPTIONAL
BUFFER
TEXT
However, in consideration of accuracy, C must be much larger
than the inherent stray capacitance in the system (unless this
capacitance can be measured and taken into account). R must
be much larger than the CMOS “ON” resistance in series with
it, which typically is hundreds of . In addition, with very large
values of R, some short term instability with respect to time may
be noted.
The recommended values for these components to maintain
agreement with previously calculated formulas without trimming
should be:
C 100pF, up to any practical value, for astable modes;
C 1000pF, up to any practical value for monostable modes.
10kΩ≤ R 1M
Power Consumption
In the standby mode (Monostable or Astable), power dissipa-
tion will be a function of leakage current in the circuit, as shown
in the static electrical characteristics. For dynamic operation,
the power needed to charge the external timing capacitor C is
given by the following formula:
Astable Mode:
P = 2CV2f. (Output at terminal No. 13)
P = 4CV2f. (Output at terminal Nos. 10 and 11)
Monostable Mode:
(Output at terminal Nos. 10 to 11)
The circuit is designed so that most of the total power is con-
sumed in the external components. In practice, the lower the
values of frequency and voltage used, the closer the actual
power dissipation will be to the calculated value.
Because the power dissipation does not depend on R, a
design for minimum power dissipation would be a small value
of C. The value of R would depend on the desired period
(within the limitations discussed above). See Figures 26, 27,
and 28 for typical power consumption in astable mode.
P = (2.9CV2) (Duty Cycle)
T
FIGURE 31. RETRIGGER MODE WAVEFORMS
t1´ t2
tRE
+TRIGGER &
t1´ t2 t1´ t2
tRE
t1´ t2 t1´ t2t1´ t2 t1´ t2
tRE
t1´ t2 t1´ t2t1´ t2
tRE
RETRIGGER
TERMINALS
8 & 12
OSC OUTPUT
TERMINAL 13
Q OUTPUT
TERMINAL 10
7-911
CD4047BMS
Chip Dimensions and Pad Layout
Dimensions in parenthesis are in millimeters and are
derived from the basic inch dimensions as indicated.
Grid graduations are in mils (10-3 inch).
METALLIZATION: Thickness: 11kÅ14kÅ, AL.
PASSIVATION: 10.4kÅ - 15.6kÅ, Silane
BOND PADS: 0.004 inches X 0.004 inches MIN
DIE THICKNESS: 0.0198 inches - 0.0218 inches